Abstract: A flow path washing method and apparatus for an auto sampler in which, when a cleaning fluid supplied to a flow path which is switched between a first flow path including a nozzle for aspirating a sample and a sample loop for holding the aspirated sample, and a second flow path including a washing tub for washing at least an outer wall of the nozzle, a control unit changes a flow velocity of the cleaning fluid supplied between measurement of a first measurement item and measurement of a second measurement item based on washing information showing washing patterns corresponding to measurement items of the sample, including at least one of first washing information showing a washing pattern corresponding to the first measurement item of the sample and second washing information showing a washing pattern corresponding to the second measurement item to be measured subsequent to the first measurement item.

Abstract: According to the present disclosure, there is provided a technique capable of suppressing a replacement of a quartz vessel due to an occurrence of a crack of the quartz vessel. There is provided a technique including: a quartz vessel provided with a process chamber; a gas supplier; a coil surrounding the quartz vessel and configured to excite a process gas by a plasma generated by supplying a high frequency power to the coil, wherein a distance between the coil and an outer peripheral surface of a first portion of the quartz vessel is set to be greater than a distance between the coil and an outer peripheral surface of a second portion of the quartz vessel, and wherein a silicon hydroxide film is formed on an inner peripheral surface of the first portion and the silicon hydroxide film is not formed on an inner peripheral surface of the second portion.

Abstract: A test apparatus is configured to test a DUT that does not support synchronous control from an external circuit. A main controller is configured based on an architecture that tests a device by synchronous control with the main controller itself as the master. A MIU is configured as an interface between the main controller and the DUT. The MIU establishes asynchronous control between it and the DUT with the DUT as the master, and establishes control between it and the main controller with the main controller as the master.

Abstract: A test apparatus is configured to test a DUT that does not support synchronous control from an external circuit. A main controller is configured based on an architecture that tests a device by synchronous control with the main controller itself as the master. A MIU is configured as an interface between the main controller and the DUT. The MIU establishes asynchronous control between it and the DUT with the DUT as the master, and establishes control between it and the main controller with the main controller as the master.

Abstract: According to the present invention, a signal display device includes: a first characteristic value measurement unit, a display unit, a second characteristic value measurement unit, and a display form changing unit. The first characteristic value measurement unit measures any one of characteristic values of a signal to be measured, and the display unit displays the characteristic value measured by the first characteristic value measurement unit while the characteristic value is associated with time. The second characteristic value measurement unit measures any one of the characteristic values of the signal to be measured, and the display form changing unit changes a display form on the display unit according to the characteristic value measured by the second characteristic value measurement unit.

Abstract: According to the present invention, a signal display device includes: a first characteristic value measurement unit, a display unit, a second characteristic value measurement unit, and a display form changing unit. The first characteristic value measurement unit measures any one of characteristic values of a signal to be measured, and the display unit displays the characteristic value measured by the first characteristic value measurement unit while the characteristic value is associated with time. The second characteristic value measurement unit measures any one of the characteristic values of the signal to be measured, and the display form changing unit changes a display form on the display unit according to the characteristic value measured by the second characteristic value measurement unit.

Abstract: A transparent heater panel having a transparent substrate, a transparent conductive layer formed on the transparent substrate, electrodes formed on the transparent conductive layer and a transparent protective layer formed on the transparent conductive layer except portions reserved for the electrodes with the end faces of the transparent conductive layer corrosion treated with a transparent protective plastic member or an anticorrosive; and a process for producing the same. The heater panel has improved durability against pollutants, environmental durability, reliability and light transmission.