Patents by Inventor Yuichiroh Takoh

Yuichiroh Takoh has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11055206
    Abstract: A non-transitory computer-readable storage medium storing a program that causes a computer to execute a process, the process including executing one of a plurality of programs, acquiring a status of variation in an internal state of a memory occurred in response to the executing, determining whether a specified status pattern is stored in a storage device that stores a plurality of status patterns of variation in an internal state of the memory, the specified status pattern satisfying a predetermined criterion regarding a similarity with the acquired status, when the specified status pattern is stored in the storage device, generating a test scenario that is a combination of programs including the executed program, and when the specified status pattern is not stored in the storage device, suppressing the generating the test scenario.
    Type: Grant
    Filed: October 2, 2018
    Date of Patent: July 6, 2021
    Assignee: FUJITSU LIMITED
    Inventors: Yuichiroh Takoh, Atsushi Kaneko, Seiya Shindo, Eiji Mizunuma, Hisaya Fujii, Yasuhiro Suzuki, Kazutaka Taniguchi
  • Publication number: 20190102283
    Abstract: A non-transitory computer-readable storage medium storing a program that causes a computer to execute a process, the process including executing one of a plurality of programs, acquiring a status of variation in an internal state of a memory occurred in response to the executing, determining whether a specified status pattern is stored in a storage device that stores a plurality of status patterns of variation in an internal state of the memory, the specified status pattern satisfying a predetermined criterion regarding a similarity with the acquired status, when the specified status pattern is stored in the storage device, generating a test scenario that is a combination of programs including the executed program, and when the specified status pattern is not stored in the storage device, suppressing the generating the test scenario.
    Type: Application
    Filed: October 2, 2018
    Publication date: April 4, 2019
    Applicant: FUJITSU LIMITED
    Inventors: Yuichiroh Takoh, ATSUSHI KANEKO, Seiya Shindo, Eiji Mizunuma, Hisaya Fujii, Yasuhiro Suzuki, Kazutaka Taniguchi