Patents by Inventor Yuika Saito

Yuika Saito has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7241987
    Abstract: In a manufacture of a probe for a scattering type near-field microscope, there is provided a method of coating, with a high reproducibility, uniform metal particles efficiently inducing a surface enhanced Raman scattering. It has been adapted such that, in the probe for the scattering type near-field microscope, one part or all of the probe due to an interaction of at least an evanescent field is coated by metal particles which don't mutually adhere and have a particle diameter of 10 nm or larger and 50 nm or smaller in radius of curvature.
    Type: Grant
    Filed: August 3, 2005
    Date of Patent: July 10, 2007
    Assignees: Riken, SII NanoTechnology Inc.
    Inventors: Yuika Saito, Takashi Murakami, Satoshi Kawata, Yasushi Inoue, Kazuhito Tsukagoshi, Masato Iyoki
  • Publication number: 20060043276
    Abstract: In a manufacture of a probe for a scattering type near-field microscope, there is provided a method of coating, with a high reproducibility, uniform metal particles efficiently inducing a surface enhanced Raman scattering. It has been adapted such that, in the probe for the scattering type near-field microscope, one part or all of the probe due to an interaction of at least an evanescent field is coated by metal particles which don't mutually adhere and have a particle diameter of 10 nm or larger and 50 nm or smaller in radius of curvature.
    Type: Application
    Filed: August 3, 2005
    Publication date: March 2, 2006
    Inventors: Yuika Saito, Takashi Nurakami, Satoshi Kawata, Yasushi Inoue, Kazuhito Tsukagoshi, Masato Iyoki