Abstract: An analog-to-digital converter (ADC) includes a comparator, a voltage reference circuit, a first capacitive digital-to-analog converter (CDAC), and a second CDAC. The first CDAC includes a plurality of capacitors. Each of the capacitors of the first CDAC includes a top plate coupled to a first input of the comparator, and a bottom plate switchably coupled to an output of the voltage reference circuit. The second CDAC includes a plurality of capacitors. Each of the capacitors of the second CDAC includes a top plate coupled to a second input of the comparator, and a bottom plate switchably coupled to a ground reference.

Abstract: An analog-to-digital converter (ADC) includes a comparator, a voltage reference circuit, a first capacitive digital-to-analog converter (CDAC), and a second CDAC. The first CDAC includes a plurality of capacitors. Each of the capacitors of the first CDAC includes a top plate coupled to a first input of the comparator, and a bottom plate switchably coupled to an output of the voltage reference circuit. The second CDAC includes a plurality of capacitors. Each of the capacitors of the second CDAC includes a top plate coupled to a second input of the comparator, and a bottom plate switchably coupled to a ground reference.

Abstract: An analog-to-digital converter (ADC) includes a comparator, a voltage reference circuit, a first capacitive digital-to-analog converter (CDAC), and a second CDAC. The first CDAC includes a plurality of capacitors. Each of the capacitors of the first CDAC includes a top plate coupled to a first input of the comparator, and a bottom plate switchably coupled to an output of the voltage reference circuit. The second CDAC includes a plurality of capacitors. Each of the capacitors of the second CDAC includes a top plate coupled to a second input of the comparator, and a bottom plate switchably coupled to a ground reference.

Abstract: An analog-to-digital converter (ADC) includes a comparator, a voltage reference circuit, a first capacitive digital-to-analog converter (CDAC), and a second CDAC. The first CDAC includes a plurality of capacitors. Each of the capacitors of the first CDAC includes a top plate coupled to a first input of the comparator, and a bottom plate switchably coupled to an output of the voltage reference circuit. The second CDAC includes a plurality of capacitors. Each of the capacitors of the second CDAC includes a top plate coupled to a second input of the comparator, and a bottom plate switchably coupled to a ground reference.

Abstract: An analog-to-digital converter (ADC) includes a comparator, a voltage reference circuit, a first capacitive digital-to-analog converter (CDAC), and a second CDAC. The first CDAC includes a plurality of capacitors. Each of the capacitors of the first CDAC includes a top plate coupled to a first input of the comparator, and a bottom plate switchably coupled to an output of the voltage reference circuit. The second CDAC includes a plurality of capacitors. Each of the capacitors of the second CDAC includes a top plate coupled to a second input of the comparator, and a bottom plate switchably coupled to a ground reference.

Abstract: An analog-to-digital converter (ADC) includes a comparator, a voltage reference circuit, a first capacitive digital-to-analog converter (CDAC), and a second CDAC. The first CDAC includes a plurality of capacitors. Each of the capacitors of the first CDAC includes a top plate coupled to a first input of the comparator, and a bottom plate switchably coupled to an output of the voltage reference circuit. The second CDAC includes a plurality of capacitors. Each of the capacitors of the second CDAC includes a top plate coupled to a second input of the comparator, and a bottom plate switchably coupled to a ground reference.

Abstract: Traditionally, successive approximation register (SAR) analog-to-digital converters (ADCs) using binary search algorithms have consumed power by performing unnecessary switching of a capacitive digital-to-analog converter (CDAC) when a CDAC voltage is relatively close to a sampling analog input signal. Here, a SAR ADC is provided that reduces the number of switching events. To accomplish this, a multi-stage comparator is provided that generates multiple output signals for SAR logic. Based on these outputs, the SAR logic can more efficiently switch its CDAC using a ternary search algorithm to reduce power consumption and improve efficiency.

Abstract: An analog to digital converter (ADC) containing a sub-ADC to resolve at least some of the bits using successive approximation principle (SAP), while providing various improvements. According to one aspect, another sub-ADC is used to resolve some of the bits in parallel. According to another aspect, the sub-ADC using SAP is implemented using a charge redistribution principle, while another sub-ADC does not rely on charge conservation. According to yet another aspect of the present invention, a same component operates as a comparator when the sub-ADC using SAP resolves the corresponding bits, and operates as an amplifier when the sub-ADC generates a residue signal.

Abstract: An aspect of the present invention improves accuracy of output codes generated by a lower resolution ADC. In an embodiment, a gain factor is determined by examining a strength of an input signal in analog form. The gain factor equals one if the strength is more than half of the maximum voltage resolvable by the ADC and is more than one otherwise. An analog sample obtained from the input signal is converted to a digital code using the ADC, with the digital code being scaled up by the gain factor compared to an output code representing the strength of the analog sample in relation to the maximum voltage. The digital code is divided by the gain factor to generate the output code representing the strength of the analog sample in relation to the maximum voltage. The accuracy of the output code is greater for smaller amplitudes of the analog samples.

Abstract: An analog to digital converter (ADC) containing a sub-ADC to resolve at least some of the bits using successive approximation principle (SAP), while providing various improvements. According to one aspect, another sub-ADC is used to resolve some of the bits in parallel. According to another aspect, the sub-ADC using SAP is implemented using a charge redistribution principle, while another sub-ADC does not rely on charge conservation. According to yet another aspect of the present invention, a same component operates as a comparator when the sub-ADC using SAP resolves the corresponding bits, and operates as an amplifier when the sub-ADC generates a residue signal.

Abstract: An aspect of the invention improves accuracy of digital codes generated at the output of a SAR ADC by using multiple reference voltages. A first reference voltage is used to generate an equivalent voltage corresponding to previous resolved bits and a second reference voltage is used to generate equivalent voltage corresponding to the bits being presently resolved. Another aspect of the present invention provides an ADC with high SNR as well as high throughput performance. Such a feature may be achieved by resolving some of the MSBs of the digital code using a high speed and low SNR DAC and remaining bits of the digital code using a high SNR DAC.