Abstract: Some aspects are directed to an all-on-chip, optoelectronic device for sampling arbitrary, low-energy, near-infrared waveforms under ambient conditions. This solid-state integrated detector uses optical-field-driven electron emission from resonant nanoantennas to achieve petahertz-level switching speeds by generating on-chip attosecond electron burst. Also disclosed is a cross-correlation technique based on perturbation of local electron field emission rates that allows for the full characterization of arbitrary electric fields down to 1 femtojoule, and/or on the order of 500 kV/m, using plasmonic nanoantennas.

Abstract: The present application provides a loop-based thermal management method, apparatus, device, and system. A thermal management capacity deviation value in a current sampling stage is determined according to a rate of change of temperature difference and a temperature difference in a current sampling stage, and a thermal management capacity value is calculated according to a thermal management capacity value in a previous sampling stage and the deviation value. A corresponding number of chillers to be operated in the current sampling stage is determined according to the thermal management capacity value in the current sampling stage, and a target output cooling capacity of the chillers is determined according to a preset Cooling demand control strategy to control the chillers. This technical solution can reduce the energy consumption of the whole system. Furthermore, centralized control of the water loop improves the reliability and cooling efficiency of the battery cabinet.

Abstract: Some aspects are directed to an all-on-chip, optoelectronic device for sampling arbitrary, low-energy, near-infrared waveforms under ambient conditions. This solid-state integrated detector uses optical-field-driven electron emission from resonant nanoantennas to achieve petahertz-level switching speeds by generating on-chip attosecond electron burst. Also disclosed is a cross-correlation technique based on perturbation of local electron field emission rates that allows for the full characterization of arbitrary electric fields down to 1 femtojoule, and/or on the order of 500 kV/m, using plasmonic nanoantennas.

Abstract: The present invention concerns an energy dispersion calibration method for calibrating an electron spectrometer of an electron spectrometer system including at least one electron emission source, electron optics and the electron spectrometer. The method comprising: obtaining, providing or receiving at least one electron energy loss spectrum produced by electrons of the electron spectrometer system exchanging energy with at least one resonant optical mode of an optical resonator into which light at a resonant wavelength is coupled; calculating or providing a Fourier transform of the at least one electron energy loss spectrum or a part of the at least one electron energy loss spectrum; determining or providing an energy dispersion (?E) of the electron spectrometer according to the equation ? ? E = f E ? hc ? ? N ? or ? ? ? E = f E ? E p N .

Abstract: An apparatus for generating Smith-Purcell radiation having at least one spectral component at a wavelength ? includes a periodic structure including a dielectric material and an electron source, in electromagnetic communication with the periodic structure, to emit an electron beam propagating within about 5? from a surface of the periodic structure to induce emission of the Smith-Purcell radiation. The electron beam has an electron energy tunable between about 0.5 keV and about 40 keV so as to change a wavelength of the Smith-Purcell radiation.

Abstract: An apparatus for generating Smith-Purcell radiation having at least one spectral component at a wavelength A includes a periodic structure including a dielectric material and an electron source, in electromagnetic communication with the periodic structure, to emit an electron beam propagating within about 5? from a surface of the periodic structure to induce emission of the Smith-Purcell radiation. The electron beam has an electron energy tunable between about 0.5 keV and about 40 keV so as to change a wavelength of the Smith-Purcell radiation.