Abstract: A method of processing data for a target model, an electronic device, and a storage medium, which relate to a field of deep learning. The method of processing data for a target model includes: acquiring the target model, wherein the target model includes at least one network layer, and each network layer of the at least one network layer includes a plurality of model parameters; for a target network layer in the at least one network layer, dividing the plurality of model parameters of the target network layer into a plurality of groups; and adjusting a data type of the model parameters in the plurality of groups from a first data type to a second data type respectively, so as to obtain a processed target model.

Abstract: This invention provides systems for analyzing substrates. Also provided by the invention are improved optical systems for enhanced multiplex illumination, optical systems with compact multi-wavelength illumination architectures, optical systems for enhanced detection of optical signals, and optical systems for reduced autofluorescence background noise.