Patents by Inventor Yuka OSHIMA

Yuka OSHIMA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12175653
    Abstract: A first imaging unit 71 generates a first image a first image by taking an object to be inspected. A guide display unit 72 determines the object to be inspected from the first image by using a model for determining an object to be inspected from an image, and displays an illustration representing the object to be inspected as a guide. A second imaging unit 73 generates a second image by superimposing on the guide, and taking the object to be inspected with a recognizable marker regardless of color of an appearance of an object to be inspected, attached in a vicinity of a defect. A defect position determination unit 74 determines a position of the defect included in the object to be inspected based on a positional relationship between the illustration and the marker included in the second image. An information collecting unit 75 collects defect information associated with a type of the object to be inspected and the position of the defect.
    Type: Grant
    Filed: October 5, 2020
    Date of Patent: December 24, 2024
    Assignee: NEC CORPORATION
    Inventors: Yuka Oshima, Takuroh Kashima, Yusuke Koitabashi, Atsushi Matsuda
  • Publication number: 20240289941
    Abstract: A conversion equation calculation unit 81 calculates, based on a defect image with marker in which a marker of a predetermined size that can be recognized regardless of color of appearance of an object to be inspected and a defect of the object to be inspected are taken, a conversion equation from size of the defect image with marker to actual size. A defect type determination unit 82 determines, by using a model for detecting the defect of the object to be inspected from an image and determining a defect type, the defect type included in the defect image with marker. A defect measuring unit 83 measures defect size included in the defect image with marker by using the conversion equation. A defect content output unit 84 outputs the determined defect type and the measured defect size.
    Type: Application
    Filed: October 5, 2020
    Publication date: August 29, 2024
    Applicant: NEC Corporation
    Inventors: Yuka OSHIMA, Takuroh KASHIMA, Yusuke KOITABASHI, Atsushi MATSUDA
  • Publication number: 20220392057
    Abstract: A first imaging unit 71 generates a first image a first image by taking an object to be inspected. A guide display unit 72 determines the object to be inspected from the first image by using a model for determining an object to be inspected from an image, and displays an illustration representing the object to be inspected as a guide. A second imaging unit 73 generates a second image by superimposing on the guide, and taking the object to be inspected with a recognizable marker regardless of color of an appearance of an object to be inspected, attached in a vicinity of a defect. A defect position determination unit 74 determines a position of the defect included in the object to be inspected based on a positional relationship between the illustration and the marker included in the second image. An information collecting unit 75 collects defect information associated with a type of the object to be inspected and the position of the defect.
    Type: Application
    Filed: October 5, 2020
    Publication date: December 8, 2022
    Applicant: NEC Corporation
    Inventors: Yuka OSHIMA, Takuroh KASHIMA, Yusuke KOITABASHI, Atsushi MATSUDA