Patents by Inventor Yuki Matsuda
Yuki Matsuda has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20090029221Abstract: Functional linkers or anchors interconnecting graphene-like carbon, such as nanotubes or graphite sheets, with a conducting material such as a metal, are shown, together with related structures, devices, methods and systems.Type: ApplicationFiled: July 24, 2008Publication date: January 29, 2009Inventors: William A. Goddard, Weiqiao Deng, Yuki Matsuda
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Patent number: 7317640Abstract: In a nonvolatile memory in which a load on a boosting circuit changes according to the number of rewrite bytes, the boosting circuit is configured so as to perform voltage boosting at a relatively slow predetermined speed regardless of the number of rewrite bytes, whereby stress applied to each storage element is reduced and rewrite resistance is enhanced.Type: GrantFiled: August 15, 2006Date of Patent: January 8, 2008Assignees: Renesas Technology Corp., Hitachi ULSI Systems Co., Ltd.Inventors: Yuki Matsuda, Tadashi Oda
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Publication number: 20060279995Abstract: In a nonvolatile memory in which a load on a boosting circuit changes according to the number of rewrite bytes, the boosting circuit is configured so as to perform voltage boosting at a relatively slow predetermined speed regardless of the number of rewrite bytes, whereby stress applied to each storage element is reduced and rewrite resistance is enhanced.Type: ApplicationFiled: August 15, 2006Publication date: December 14, 2006Inventors: Yuki Matsuda, Tadashi Oda
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Patent number: 7130218Abstract: In a nonvolatile memory in which a load on a boosting circuit changes according to the number of rewrite bytes, the boosting circuit is configured so as to perform voltage boosting at a relatively slow predetermined speed regardless of the number of rewrite bytes, whereby stress applied to each storage element is reduced and rewrite resistance is enhanced.Type: GrantFiled: January 25, 2005Date of Patent: October 31, 2006Assignees: Renesas Technology Corp., Hitachi ULSI Systems Co., Ltd.Inventors: Yuki Matsuda, Tadashi Oda
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Publication number: 20050157556Abstract: In a nonvolatile memory in which a load on a boosting circuit changes according to the number of rewrite bytes, the boosting circuit is configured so as to perform voltage boosting at a relatively slow predetermined speed regardless of the number of rewrite bytes, whereby stress applied to each storage element is reduced and rewrite resistance is enhanced.Type: ApplicationFiled: January 25, 2005Publication date: July 21, 2005Inventors: Yuki Matsuda, Tadashi Oda
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Patent number: 6853582Abstract: In a nonvolatile memory in which a load on a boosting circuit changes according to the number of rewrite bytes, the boosting circuit is configured so as to perform voltage boosting at a relatively slow predetermined speed regardless of the number of rewrite bytes, whereby stress applied to each storage element is reduced and rewrite resistance is enhanced.Type: GrantFiled: August 30, 2000Date of Patent: February 8, 2005Assignees: Renesas Technology Corp., Hitachi ULSI Systems Co., Ltd.Inventors: Yuki Matsuda, Tadashi Oda
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Patent number: 6795353Abstract: A nonvolatile memory device and a data processing system with a reduced layout area are capable of efficiently generating a high voltage without deteriorating the charge transfer efficiency of a charge pump circuit. The charge pump circuit in a nonvolatile memory device includes a plurality of stages of charge pump unit circuits. A voltage generating unit provides, as a control signal to the gate of a first MOS transistor for transferring charges from a first capacitor of a charge pump unit circuit of one stage to a first capacitor at the next stage, a fourth signal having an amplitude of a difference voltage between the power supply voltage and the charge pump voltage of the first capacitor at the one stage. The fourth control signal is obtained from second and third signals each changing in amplitude of the power supply voltage. The second signal is supplied via a second capacitor.Type: GrantFiled: July 2, 2002Date of Patent: September 21, 2004Assignees: Renesas Technology Corp., Hitachi ULSI Systems Co., Ltd.Inventors: Yuki Matsuda, Norihisa Yamamoto, Kazuhiro Matsushita, Kazuki Watanabe
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Patent number: 6791884Abstract: In a nonvolatile memory in which a load on a boosting circuit changes according to the number of rewrite bytes, the boosting circuit is configured so as to perform voltage boosting at a relatively slow predetermined speed regardless of the number of rewrite bytes, whereby stress applied to each storage element is reduced and rewrite resistance is enhanced.Type: GrantFiled: December 23, 2002Date of Patent: September 14, 2004Assignees: Renesas Technology Corp., Hitachi ULSI Systems Co., Ltd.Inventors: Yuki Matsuda, Tadashi Oda
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Patent number: 6757201Abstract: The invention facilitates to meet both of the mode of use that finds precedence in frequent rewrite to the nonvolatile memory and data retention during the power supply being cut off, and the mode of use that finds precedence in the data retention characteristic. The controller enables an information storage operation to the nonvolatile memory cells, by means of erase and write processing through boosting of the voltage applied to the nonvolatile memory cells and clamping of the boosted voltage, and performs a selection control that selects the application interval of the boosted voltage applied during the information storage operation and so forth. This selection control enables utilizing the nonvolatile memory cells as temporary rewrite areas, and facilitates to meet both of the mode of use that finds precedence in data retention during the power supply being cut off, and the mode of use that finds precedence in the data retention characteristic.Type: GrantFiled: January 22, 2003Date of Patent: June 29, 2004Assignees: Renesas Technology Corporation, Hitachi ULSI Systems Co., Ltd.Inventors: Yuki Matsuda, Kenya Otani, Minoru Kato, Takeo Kon
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Patent number: 6687164Abstract: The invention facilitates to meet both of the mode of use that finds precedence in frequent rewrite to the nonvolatile memory and data retention during the power supply being cut off, and the mode of use that finds precedence in the data retention characteristic. The controller enables an information storage operation to the nonvolatile memory cells, by means of erase and write processing through boosting of the voltage applied to the nonvolatile memory cells and clamping of the boosted voltage, and performs a selection control that selects the application interval of the boosted voltage applied during the information storage operation and so forth. This selection control enables utilizing the nonvolatile memory cells as temporary rewrite areas, and facilitates to meet both of the mode of use that finds precedence in data retention during the power supply being cut off, and the mode of use that finds precedence in the data retention characteristic.Type: GrantFiled: April 29, 2003Date of Patent: February 3, 2004Assignees: Renesas Technology Corporation, Hitachi ULSI Systems Co., Ltd.Inventors: Yuki Matsuda, Kenya Otani, Minoru Kato, Takeo Kon
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Patent number: 6683809Abstract: The invention facilitates to meet both of the mode of use that finds precedence in frequent rewrite to the nonvolatile memory and data retention during the power supply being cut off, and the mode of use that finds precedence in the data retention characteristic. The controller enables an information storage operation to the nonvolatile memory cells, by means of erase and write processing through boosting of the voltage applied to the nonvolatile memory cells and clamping of the boosted voltage, and performs a selection control that selects the application interval of the boosted voltage applied during the information storage operation and so forth. This selection control enables utilizing the nonvolatile memory cells as temporary rewrite areas, and facilitates to meet both of the mode of use that finds precedence in data retention during the power supply being cut off, and the mode of use that finds precedence in the data retention characteristic.Type: GrantFiled: April 29, 2003Date of Patent: January 27, 2004Assignees: Renesas Technology Corporation, Hitachi ULSI Systems Co., Ltd.Inventors: Yuki Matsuda, Kenya Otani, Minoru Kato, Takeo Kon
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Publication number: 20030206444Abstract: The invention facilitates to meet both of the mode of use that finds precedence in frequent rewrite to the nonvolatile memory and data retention during the power supply being cut off, and the mode of use that finds precedence in the data retention characteristic. The controller enables an information storage operation to the nonvolatile memory cells, by means of erase and write processing through boosting of the voltage applied to the nonvolatile memory cells and clamping of the boosted voltage, and performs a selection control that selects the application interval of the boosted voltage applied during the information storage operation and so forth. This selection control enables utilizing the nonvolatile memory cells as temporary rewrite areas, and facilitates to meet both of the mode of use that finds precedence in data retention during the power supply being cut off, and the mode of use that finds precedence in the data retention characteristic.Type: ApplicationFiled: April 29, 2003Publication date: November 6, 2003Applicants: Hitachi, Ltd., Hitachi ULSI Systems Co., Ltd.Inventors: Yuki Matsuda, Kenya Otani, Minoru Kato, Takeo Kon
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Publication number: 20030202381Abstract: The invention facilitates to meet both of the mode of use that finds precedence in frequent rewrite to the nonvolatile memory and data retention during the power supply being cut off, and the mode of use that finds precedence in the data retention characteristic. The controller enables an information storage operation to the nonvolatile memory cells, by means of erase and write processing through boosting of the voltage applied to the nonvolatile memory cells and clamping of the boosted voltage, and performs a selection control that selects the application interval of the boosted voltage applied during the information storage operation and so forth. This selection control enables utilizing the nonvolatile memory cells as temporary rewrite areas, and facilitates to meet both of the mode of use that finds precedence in data retention during the power supply being cut off, and the mode of use that finds precedence in the data retention characteristic.Type: ApplicationFiled: April 29, 2003Publication date: October 30, 2003Applicants: Hitachi, Ltd., Hitachi ULSI Systems Co., Ltd.Inventors: Yuki Matsuda, Kenya Otani, Minoru Kato, Takeo Kon
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Publication number: 20030161191Abstract: The invention facilitates to meet both of the mode of use that finds precedence in frequent rewrite to the nonvolatile memory and data retention during the power supply being cut off, and the mode of use that finds precedence in the data retention characteristic. The controller enables an information storage operation to the nonvolatile memory cells, by means of erase and write processing through boosting of the voltage applied to the nonvolatile memory cells and clamping of the boosted voltage, and performs a selection control that selects the application interval of the boosted voltage applied during the information storage operation and so forth. This selection control enables utilizing the nonvolatile memory cells as temporary rewrite areas, and facilitates to meet both of the mode of use that finds precedence in data retention during the power supply being cut off, and the mode of use that finds precedence in the data retention characteristic.Type: ApplicationFiled: January 22, 2003Publication date: August 28, 2003Applicant: Hitachi, Ltd.Inventors: Yuki Matsuda, Kenya Otani, Minoru Kato, Takeo Kon
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Publication number: 20030090947Abstract: In a nonvolatile memory in which a load on a boosting circuit changes according to the number of rewrite bytes, the boosting circuit is configured so as to perform voltage boosting at a relatively slow predetermined speed regardless of the number of rewrite bytes, whereby stress applied to each storage element is reduced and rewrite resistance is enhanced.Type: ApplicationFiled: December 23, 2002Publication date: May 15, 2003Applicant: Hitachi, Ltd.Inventors: Yuki Matsuda, Tadashi Oda
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Publication number: 20030021153Abstract: Disclosed is a nonvolatile memory device and a data processing system with a reduced layout area of a semiconductor chip, capable of efficiently generating a high voltage without deteriorating charge transfer efficiency of a charge pump circuit. In charge pump unit circuits of a plurality of stages provided for a charge pump circuit such as a nonvolatile memory, as a control signal to be supplied to the gate of a first MOS transistor for transferring charges from a first capacitor for charge pump at a stage to a first capacity at the next stage, a fourth signal having an amplitude of a difference voltage between the power supply voltage and the charge pump voltage of the first capacitor at a corresponding stage, obtained from two control signals of a second signal and a third signal each changing in amplitude of the power supply voltage. The second signal is supplied via a second capacitor.Type: ApplicationFiled: July 2, 2002Publication date: January 30, 2003Applicant: Hitachi, Ltd.Inventors: Yuki Matsuda, Norihisa Yamamoto, Kazuhiro Matsushita, Kazuki Watanabe