Patents by Inventor Yuki Yanagisako

Yuki Yanagisako has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Semiconductor device and method of testing semiconductor device
    Patent number: 8648617
    Abstract: According to the following disclosure, disclosed is a semiconductor device including: an internal circuit configured to receive and output a signal current; a current mirror unit outputting a copied current corresponding to the signal current; and a test pad from which the copied current is taken out.
    Type: Grant
    Filed: February 7, 2011
    Date of Patent: February 11, 2014
    Assignee: Fujitsu Semiconductor Limited
    Inventors: Yuji Maruyama, Tatsuhiro Mizumasa, Takayuki Nakashiro, Shigeru Gotoh, Takayuki Yano, Susumu Koshinuma, Shunsuke Taniguchi, Yuki Yanagisako
  • SEMICONDUCTOR DEVICE AND METHOD OF TESTING SEMICONDUCTOR DEVICE
    Publication number: 20110221466
    Abstract: According to the following disclosure, disclosed is a semiconductor device including: an internal circuit configured to receive and output a signal current; a current mirror unit outputting a copied current corresponding to the signal current; and a test pad from which the copied current is taken out.
    Type: Application
    Filed: February 7, 2011
    Publication date: September 15, 2011
    Applicant: FUJITSU SEMICONDUCTOR LIMITED
    Inventors: Yuji MARUYAMA, Tatsuhiro Mizumasa, Takayuki Nakashiro, Shigeru Gotoh, Takayuki Yano, Susumu Koshinuma, Shunsuke Taniguchi, Yuki Yanagisako