Abstract: By providing a coloring agent, which is brought in contact with the liquid fuel leaked from an outer peripheral portion of the liquid fuel holding section that is configured to hold the liquid fuel and by which the contact portion is changed in color, in at least part of the outer peripheral portion, the leakage of the liquid fuel from the liquid fuel holding section can be visually detected swiftly and easily without providing any special detection device.

Abstract: It is possible to solve the problem of the conventional fluorescent X-ray analysis that a concentration calculation result can be obtained only after elapse of a time set as a measurement time. In the fluorescent X-ray analysis method and fluorescent X-ray analysis device according to the present invention, a sample measurement condition is set before starting the measurement and the measurement concentration of the element contained in the sample and the measurement accuracy are calculated. When the measurement accuracy has become a value satisfying the predetermined measurement condition, the measurement is terminated and the concentration at that moment is outputted.

Abstract: The object of the present invention is to provide a liquid fuel storage container for fuel cell capable of storing liquid fuel to be supplied to a liquid-fuel direct-supply type fuel cell and stably supplying liquid fuel for a long time, and also provide a fuel-cell system. The present invention employs a fuel-supplying pipe (120) extending within a tank member (110) for supplying liquid fuel (185) and having flexibility, and provides a weight member (122) at a portion near a suction port (121) for liquid fuel on the fuel-supplying pipe. Accordingly, the suction port can move to a portion where the liquid fuel exists, anytime, and can be kept immersed in the liquid fuel. This enables stably supplying fuel even when the fuel cell is mounted on a portable electronic apparatus.

Abstract: A method of mounting a semiconductor laser component capable of preventing deterioration of laser characteristics and destruction of the semiconductor laser component due to a rise in temperature and a residual stress of the semiconductor laser component. The semiconductor laser component is mounted on a submount by heating and pressure-bonding, and is heated again up to a temperature more than a melting point of a bonding member at the released pressure to release the residual stress.

Abstract: The concentration(s) of element(s) contained in an unknown sample is measured without necessity of judging the sample relying on a human's eye and obtaining information from a supplier of the sample previously. The concentration(s) of trace element(s) such as Cd, Pb and Hg contained in parts for electronic or electric equipment is determined by (1) irradiating the sample with an X-ray so as to identify whether the type of the sample is a nonmetal-based material or a metal-based material; (2) selecting measuring conditions for a fluorescent X-ray analysis depending on the identified type of the sample; and (3) measuring the concentration(s) of one or more element(s) contained in the sample by the fluorescent X-ray analysis according to the selected measuring conditions.

Abstract: The present invention provides a method of mounting a semiconductor laser component capable of preventing deterioration of laser characteristics and destruction of the semiconductor laser component due to a rise in temperature and a residual stress of the semiconductor laser component, wherein the semiconductor laser component is mounted on a submount by heating and pressure-bonding, and is heated again up to a temperature more than a melting point of a bonding member at the released pressure to release the residual stress.

Abstract: The concentration(s) of element(s) contained in an unknown sample is measured without necessity of judging the sample relying on a human's eye and obtaining information from a supplier of the sample previously. The concentration(s) of trace element(s) such as Cd, Pb and Hg contained in parts for electronic or electric equipment is determined by (1) irradiating the sample with an X-ray so as to identify whether the type of the sample is a nonmetal-based material or a metal-based material; (2) selecting measuring conditions for a fluorescent X-ray analysis depending on the identified type of the sample; and (3) measuring the concentration(s) of one or more element(s) contained in the sample by the fluorescent X-ray analysis according to the selected measuring conditions.

Abstract: The present invention to provide a method of mounting a semiconductor laser component capable of preventing deterioration of laser characteristics and destruction of the semiconductor laser component due to residual stresses as well as preventing decrease of a lifetime due to increase in temperature of the semiconductor laser component. The method of mounting a semiconductor laser device which comprises a step of pressure bonding a semiconductor laser component on a submount by a collet while a bonding member is heated to be fused or melt on a submount by heating a table on which the submount is placed, for example, characterized in that the table and the collet are heated to a temperature higher than a fusing point of said bonding member so as not to occur the heat transfer substantially to a collet, and then heating of the table and the collet is terminated with maintaining the pressure bonding state.

Abstract: An optical pickup includes an object lens; a lens holder for holding the object lens; a visco-elastic suspender for suspending the lens holder so as to be movable in a focusing direction and a tracking direction; a driving section for driving the lens holder in the focusing direction and the tracking direction, the driving section including a magnet, a yoke and a driving coil provided on the lens holder. The magnet and the yoke form a magnetic circuit. A heat-insulating area is located between the object lens and the driving coil, and the heat-insulating area includes a heat-insulating material which has a thermal conductivity lower than that of the lens holder.