Patents by Inventor Yukikazu Shimato

Yukikazu Shimato has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7834948
    Abstract: In an active matrix substrate 10 of a liquid crystal display device in which a picture element electrode 18 on an interlayer insulator 17 and an electrode 16d located in a layer below the interlayer insulator 17 are connected electrically to each other through a contact hole 17a formed in the interlayer insulator 17 and another electrode 13 is arranged under the electrode 16d so as to be opposed to the electrode 16d with a control insulator 14 interposed for forming an auxiliary capacitor between the electrodes 16d and 13, an opening 20 is formed in a part of the electrode 13 which corresponds to a region of the contact hole 17a. With this arrangement, in the case where a defect is formed in the electrode 16d, even if a defect is formed in the control insulator 14 through the defect in the electrode 16d in forming the contact hole 17a, occurrence of leakage between the electrodes 16d and 13 can be suppressed with no lowering of the aperture ratio invited.
    Type: Grant
    Filed: June 13, 2004
    Date of Patent: November 16, 2010
    Assignee: Sharp Kabushiki Kaisha
    Inventors: Naoki Takeda, Yukikazu Shimato
  • Publication number: 20090256980
    Abstract: In an active matrix substrate 10 of a liquid crystal display device in which a picture element electrode 18 on an interlayer insulator 17 and an electrode 16d located in a layer below the interlayer insulator 17 are connected electrically to each other through a contact hole 17a formed in the interlayer insulator 17 and another electrode 13 is arranged under the electrode 16d so as to be opposed to the electrode 16d with a control insulator 14 interposed for forming an auxiliary capacitor between the electrodes 16d and 13, an opening 20 is formed in a part of the electrode 13 which corresponds to a region of the contact hole 17a. With this arrangement, in the case where a defect is formed in the electrode 16d, even if a defect is formed in the control insulator 14 through the defect in the electrode 16d in forming the contact hole 17a, occurrence of leakage between the electrodes 16d and 13 can be suppressed with no lowering of the aperture ratio invited.
    Type: Application
    Filed: June 13, 2005
    Publication date: October 15, 2009
    Applicant: SHARP KABUSHIKI KAISHA
    Inventors: Naoki Takeda, Yukikazu Shimato