Patents by Inventor Yukiko Hirabayashi

Yukiko Hirabayashi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20020127566
    Abstract: A genome DNA analysis method and a genome DNA analysis system of the present invention generates multiply-charged ions with 5 or more electric charges by an ionization process using air atomization. Also, a mass spectrometric spectrum thereof is detected and compared with predicted mass spectrum patterns in the presence or absence of polymorphism to determine a base at a polymorphic point.
    Type: Application
    Filed: August 30, 2001
    Publication date: September 12, 2002
    Inventors: Atsumu Hirabayashi, Min Huang, Yukiko Hirabayashi, Akihiko Okumura
  • Patent number: 6392226
    Abstract: Disclosed is a mass spectrometer having an ion trap type mass spectrometric unit, characterized in that in each of ion storage periods, ions created in an ion source (7) are allowed to enter in a space surrounded by a ring electrode (21) and end cap electrodes (22a and 22b) and are confined in the space, wherein ions are detected with high sensitivities in a wide range of values of m/z (molecular weight of ion/valence number of ion) of the ions by changing the amplitude of a high-frequency voltage applied to the ring electrode (21) in each of the ion storage periods.
    Type: Grant
    Filed: March 12, 1999
    Date of Patent: May 21, 2002
    Assignee: Hitachi, Ltd.
    Inventors: Yasuaki Takada, Takayuki Nabeshima, Minoru Sakairi, Yukiko Hirabayashi
  • Publication number: 20020014585
    Abstract: A mass spectrometer comprising an ionization means for ionizing sample compounds to be analyzed mass spectro-scopically in an atmospheric pressure, a sample solution supply means for supplying a solution containing the sample compounds to the ionization means, means for feeding the ions formed by the ionization means through an aperture disposed in an electrode into a vacuum region and a ion trap type mass spectroscopic means for mass spectroscopically analyzing ions entered through the aperture into the vacuum region, in which an ion decelerating electric field forming means is disposed between the electrode disposed with the aperture and an electrode disposed with an ion entrance opening for entering the ions into the ion trap type mass spectroscopic means for forming an electric field for decelerating the ions, and the ions injected to the ion trap mass spectroscopic means is lowered.
    Type: Application
    Filed: October 3, 2001
    Publication date: February 7, 2002
    Applicant: Hitachi, Ltd.
    Inventors: Yasuaki Takada, Minoru Sakairi, Takayuki Nabeshima, Yukiko Hirabayashi, Hideaki Koizumi
  • Patent number: 6316769
    Abstract: A mass spectrometer comprising an ionization means for ionizing sample compounds to be analyzed mass spectro-scopically in an atmospheric pressure, a sample solution supply means for supplying a solution containing the sample compounds to the ionization means, means for feeding the ions formed by the ionization means through an aperture disposed in an electrode into a vacuum region and a ion trap type mass spectroscopic means for mass spectroscopically analyzing ions entered through the aperture into the vacuum region, in which an ion decelerating electric field forming means is disposed between the electrode disposed with the aperture and an electrode disposed with an ion entrance opening for entering the ions into the ion trap type mass spectroscopic means for forming an electric field for decelerating the ions, and the ions injected to the ion trap mass spectroscopic means is lowered.
    Type: Grant
    Filed: December 19, 2000
    Date of Patent: November 13, 2001
    Assignee: Hitachi, Ltd.
    Inventors: Yasuaki Takada, Minoru Sakairi, Takayuki Nabeshima, Yukiko Hirabayashi, Hideaki Koizumi
  • Publication number: 20010000618
    Abstract: A mass spectrometer comprising an ionization means For ionizing sample compounds to be analyzed mass spectro-scopically in an atmospheric pressure, a sample solution supply means for supplying a solution containing the sample compounds to the ionization means, means for feeding the ions formed by the ionization means through an aperture disposed in an electrode into a vacuum region and a ion trap type mass spectroscopic means for mass spectroscopically analyzing ions entered through the aperture into the vacuum region, in which an ion decelerating electric field forming means is disposed between the electrode disposed with the aperture and an electrode disposed with an ion entrance opening for entering the ions into the ion trap type mass spectroscopic means for forming an electric field for decelerating the ions, and the ions injected to the ion trap mass spectroscopic means is lowered.
    Type: Application
    Filed: December 19, 2000
    Publication date: May 3, 2001
    Applicant: Hitachi, Ltd.
    Inventors: Yasuaki Takada, Minoru Sakairi, Takayuki Nabeshima, Yukiko Hirabayashi, Hideaki Koizumi
  • Patent number: 6190316
    Abstract: A living body fluid analyzing system includes a microdialysis for sending a first solution having an osmotic pressure which is substantially similar to a osmotic pressure of a body fluid into a living body and extracting a second solution from the living body. A first flow passage is provided in which the second solution from the microdialysis flows and a second flow passage is provided which mixes the second solution with an organic solution. Furthermore, there is provided a gas source and a gas flow controller which controls a flow quantity of the gas from the gas source and a third flow passage in which a gas introduced from the gas source flows. An ion source is provided having an orifice for spraying and ionizing the second solution from the second flow passage at an end of the third flow passage, and a mass spectrometer is provided for mass-analyzing the ions sprayed from the orifice.
    Type: Grant
    Filed: March 22, 1999
    Date of Patent: February 20, 2001
    Assignee: Hitachi, Ltd.
    Inventors: Yukiko Hirabayashi, Atsumu Hirabayashi, Hideaki Koizumi
  • Patent number: 6180941
    Abstract: A mass spectrometer comprising an ionization means for ionizing sample compounds to be analyzed mass spectro-scopically in an atmospheric pressure, a sample solution supply means for supplying a solution containing the sample compounds to the ionization means, means for feeding the ions formed by the ionization means through an aperture disposed in an electrode into a vacuum region, and an ion trap type mass spectroscopic means for mass spectroscopically analyzing ions entered through the aperture into the vacuum region, in which an ion decelerating electric field forming means is disposed between the electrode disposed with the aperture and an electrode disposed with an ion entrance opening for entering the ions into the ion trap type mass spectroscopic means for forming an electric field for decelerating the ions, and the ions injected to the ion trap mass spectroscopic means is lowered.
    Type: Grant
    Filed: November 23, 1999
    Date of Patent: January 30, 2001
    Assignee: Hitachi, Ltd.
    Inventors: Yasuaki Takada, Minoru Sakairi, Takayuki Nabeshima, Yukiko Hirabayashi, Hideaki Koizumi
  • Patent number: 6114693
    Abstract: A mass spectrometer comprising a passage through which a sample solution flows, the passage including a capillary having an open tip, the sample solution flowing through the capillary out of the open tip of the capillary, a gas passage which forms a gas flow around the open tip of the capillary, the gas flow spraying the sample solution flowing out of the open tip of the capillary, a first electrode which contacts the sample solution flowing in the passage and applies an electric potential to the sample solution flowing in the passage, a second electrode disposed around the capillary near the open tip of the capillary, the second electrode being downstream from the first electrode with respect to a direction in which the sample solution flows in the passage, there being no gap extending downstream from the open tip of the capillary to the second electrode in a direction in which the sample solution flows out of the open tip of the capillary, the second electrode being electrically isolated from the sample sol
    Type: Grant
    Filed: April 27, 1999
    Date of Patent: September 5, 2000
    Assignee: Hitachi, Ltd.
    Inventors: Atsumu Hirabayashi, Yukiko Hirabayashi, Minoru Sakairi, Yasuaki Takada, Takayuki Nabeshima, Hideaki Koizumi
  • Patent number: 6075243
    Abstract: A mass spectrometer in which, in order to reduce noise due to other particles (large charge droplets, neutral particles, photons, or the like), the orbit of ions and the orbit of other particles are separated from each other in the inside of a mass analysis region so as to make it possible to prevent the other particles from reaching an ion detection region without using any deflector.
    Type: Grant
    Filed: March 27, 1997
    Date of Patent: June 13, 2000
    Assignee: Hitachi, Ltd.
    Inventors: Takayuki Nabeshima, Minoru Sakairi, Yasuaki Takada, Yukiko Hirabayashi, Hideaki Koizumi
  • Patent number: 6011260
    Abstract: A mass spectrometer comprising an ionization means for ionizing sample compounds to be analyzed mass spectro-scopically in an atmospheric pressure, a sample solution supply means for supplying a solution containing the sample compounds to the ionization means, means for feeding the ions formed by the ionization means through an aperture disposed in an electrode into a vacuum region, and anion trap type mass spectroscopic means for mass spectroscopically analyzing ions entered through the aperture into the vacuum region, in which an ion decelerating electric field forming means is disposed between the electrode disposed with the aperture and an electrode disposed with an ion entrance opening for entering the ions into the ion trap type mass spectroscopic means for forming an electric field for decelerating the ions, and the ions injected to the ion trap mass spectroscopic means is lowered.
    Type: Grant
    Filed: July 14, 1998
    Date of Patent: January 4, 2000
    Assignee: Hitachi, Ltd.
    Inventors: Yasuaki Takada, Minoru Sakairi, Takayuki Nabeshima, Yukiko Hirabayashi, Hideaki Koizumi
  • Patent number: 5986259
    Abstract: In a mass spectrometer using a sonic spray ion source, a technique of controlling the density of droplets in a nebulized sample solution which is passed into a mass spectrometer at high vacuum to an appropriate value to thereby reduce analysis noises is disclosed. A sample solution in a sample solution injection unit 1 is introduced into a capillary 2 disposed in an ion source 6. A gas is introduced from a gas supply unit 4 by way of a gas pipe 5 into the ion source 6 and is caused to flow along the outer circumferential surface at the top end of the capillary 2 and is jetted out from the orifice 3 as a gas flow into atmospheric air. The sample solution jetted from the top end of the capillary 2 is ionized by the gas flow in the atmospheric air.
    Type: Grant
    Filed: April 22, 1997
    Date of Patent: November 16, 1999
    Assignee: Hitachi, Ltd.
    Inventors: Yukiko Hirabayashi, Takayuki Nabeshima, Yasuaki Takada, Minoru Sakairi, Hideaki Koizumi
  • Patent number: 5969351
    Abstract: A semi-micro liquid chromatograph/mass spectrometer apparatus has an ion source. The space from the end portion of a flow passage of a liquid chromatograph shell to a vaporization portion is closed so as to prevent the inflow of a gas from outside the ion source into the space. Further, the nebulization and vaporization portions are joined together and heated by a common heater. Dilution of a sample to be analyzed is prevented, and high sensitivity detection becomes possible in a low velocity liquid chromatograph/mass spectrometer.
    Type: Grant
    Filed: February 6, 1997
    Date of Patent: October 19, 1999
    Assignee: Hitachi, Ltd.
    Inventors: Takayuki Nabeshima, Minoru Sakairi, Yasuaki Takada, Yukiko Hirabayashi, Hideaki Koizumi
  • Patent number: 5909356
    Abstract: The invention provides a solid type electric double-layer capacitor of the organic solvent system. A solid type electric double-layer capacitor including an electrolyte containing an electrolytic solution in a matrix of a fluorinated polymer prevents liquid leakage and a self-discharge phenomenon and shows performance comparable to prior art capacitors of the organic solvent system.
    Type: Grant
    Filed: September 12, 1997
    Date of Patent: June 1, 1999
    Assignee: TDK Corporation
    Inventors: Yukiko Hirabayashi, Satoshi Maruyama, Hisashi Suzuki, Tsuneo Kuwahara, Kazuhide Ohe
  • Patent number: 5898175
    Abstract: A mass spectrometer employing an ion source includes a capillary for spraying therethrough liquid into the atmospheres and an orifice through which a portion in the vicinity of a tip of the capillary is inserted, the orifice being designed in such a way that gases are caused to flow up to the tip of the capillary along a peripheral wall face of the capillary. The flow rate of gas in the vicinity of the tip of the capillary is about the sonic velocity, and a voltage is applied across the liquid flowing through the capillary and the orifice or an electrode arranged in the vicinity of the tip of the capillary.
    Type: Grant
    Filed: September 5, 1996
    Date of Patent: April 27, 1999
    Assignee: Hitachi, Ltd.
    Inventors: Atsumu Hirabayashi, Yukiko Hirabayashi, Minoru Sakairi, Yasuaki Takada, Takayuki Nabeshima, Hideaki Koizumi
  • Patent number: 5825027
    Abstract: A mass spectrometer comprising an ionization means for ionizing sample compounds to be analyzed mass spectro-scopically in an atmospheric pressure, a sample solution supply means for supplying a solution containing the sample compounds to the ionization means, means for feeding the ions formed by the ionization means through an aperture disposed in an electrode into a vacuum region and a ion trap type mass spectroscopic means for mass spectroscopically analyzing ions entered through the aperture into the vacuum region, in which an ion decelerating electric field forming means is disposed between the electrode disposed with the aperture and an electrode disposed with an ion entrance opening for entering the ions into the ion trap type mass spectroscopic means for forming an electric field for decelerating the ions, and the ions injected to the ion trap mass spectroscopic means is lowered.
    Type: Grant
    Filed: March 31, 1997
    Date of Patent: October 20, 1998
    Assignee: Hitachi, Ltd.
    Inventors: Yasuaki Takada, Minoru Sakairi, Takayuki Nabeshima, Yukiko Hirabayashi, Hideaki Koizumi
  • Patent number: 5678556
    Abstract: An imaging method for spatial distributions of concentrations of absorbers distributed in an object including a radiation step of applying pulsating or continuous light radiated from predetermined incident positions with predetermined wavelengths to the object in the form of a scattering medium containing the absorbers, and a detection step of detecting intensities of light passing through the object at predetermined detection positions.
    Type: Grant
    Filed: July 14, 1995
    Date of Patent: October 21, 1997
    Assignee: Hitachi, Ltd.
    Inventors: Atsushi Maki, Adi Bonen, Yoshitoshi Ito, Yuichi Yamashita, Yukiko Hirabayashi, Hideaki Koizumi, Fumio Kawaguchi, Hideji Fujii