Patents by Inventor Yukimitsu IWANAGA

Yukimitsu IWANAGA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20210364276
    Abstract: A strain distribution measurement system includes a tensile tester that deforms a test piece to measure mechanical properties of a material of the test piece, and a strain distribution measuring device that measures a strain distribution of the test piece. The strain distribution measuring device measures the strain distribution of the test piece based on a distribution of at least one of a reflectance or a polarization characteristic on the main face of the test piece.
    Type: Application
    Filed: May 20, 2021
    Publication date: November 25, 2021
    Applicant: SHIMADZU CORPORATION
    Inventors: Tomotaka NAGASHIMA, Yukimitsu IWANAGA, Norio HIRAYAMA
  • Publication number: 20210333182
    Abstract: Provided is a material testing machine that deforms a test piece and measures mechanical properties of a material of the test piece. The material testing machine includes: a first detection unit that detects a strain of the test piece by measuring a distance between reference points of the test piece; a second detection unit that detects a strain distribution of the test piece based on an image of a pattern formed on a surface of the test piece; and a display control unit that displays a detection result of the first detection unit and a detection result of the second detection unit on one screen.
    Type: Application
    Filed: April 21, 2021
    Publication date: October 28, 2021
    Applicant: SHIMADZU CORPORATION
    Inventors: Takuro SATO, Tomotaka NAGASHIMA, Yukimitsu IWANAGA