Patents by Inventor Yukio Imoto

Yukio Imoto has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10260651
    Abstract: A butterfly valve includes a valve body-side valve seat section, a valve box-side valve seat section, and a valve movement mechanism. The valve movement mechanism includes a cam groove, a cam projection, and a reverse key. The valve movement mechanism moves the valve body in an extending direction of the flow passage along with rotation of the valve shaft between a blocking position and an open position. One of the valve body-side valve seat section and the valve box-side valve seat section is formed of a laminated material composed of alternatingly stacked plates made of metal and plates made of expanded graphite.
    Type: Grant
    Filed: December 14, 2015
    Date of Patent: April 16, 2019
    Assignees: Hitachi-GE Nuclear Energy, Ltd., Okano Valve Mfg. Co. Ltd.
    Inventors: Yoshiharu Kawahara, Yoshihisa Kiyotoki, Takayoshi Nakashima, Keisuke Sakemura, Yoshitomo Kanemura, Yukio Imoto
  • Publication number: 20170370491
    Abstract: Provided is a butterfly valve configured so that the sealing performance of the butterfly valve is ensured even if the butterfly valve is exposed to high-temperature fluid and is installed in a high radiation environment. A butterfly valve has: a valve body-side valve seat section which is formed on the outer periphery of a valve body; a valve box-side valve seat section which is formed on a valve box; and a valve movement mechanism which, as a valve shaft pivots, moves the valve body in the direction of extension of a flow passage, between a blocking position at which the valve body-side valve seat section and the valve box-side valve seat section are in contact with each other to close a flow passage, and an open position at which the valve body-side valve seat section and the valve box-side valve seat section are separated from each other to open the flow passage.
    Type: Application
    Filed: December 14, 2015
    Publication date: December 28, 2017
    Inventors: Yoshiharu KAWAHARA, Yoshihisa KIYOTOKI, Takayoshi NAKASHIMA, Keisuke SAKEMURA, Yoshitomo KANEMURA, Yukio IMOTO
  • Patent number: 7708618
    Abstract: A polishing apparatus includes an arrangement of a plurality of units to deal with various operations and a robot having at least one arm. The plurality of units are disposed around the robot and include a loading unit for receiving thereon a, e.g. dry, workpiece to be polished, a polishing system including at least one polishing unit for polishing the workpiece, a washing system and a drying system at least including one washing unit for washing and drying the polished workpiece, and an unloading unit for receiving thereon a resultant clean and dry polished workpiece.
    Type: Grant
    Filed: October 31, 2007
    Date of Patent: May 4, 2010
    Assignees: Ebara Corporation, Kabushiki Kaisha Toshiba
    Inventors: Hiromi Yajima, Yukio Imoto, Shoichi Kodama, Riichiro Aoki, Takashi Omichi, Toyomi Nishi, Tetsuji Togawa
  • Publication number: 20080166949
    Abstract: A polishing apparatus includes an arrangement of a plurality of units to deal with various operations and a robot having at least one arm. The plurality of units are disposed around the robot and include a loading unit for receiving thereon a, e.g. dry, workpiece to be polished, a polishing system including at least one polishing unit for polishing the workpiece, a washing system and a drying system at least including one washing unit for washing and drying the polished workpiece, and an unloading unit for receiving thereon a resultant clean and dry polished workpiece.
    Type: Application
    Filed: October 31, 2007
    Publication date: July 10, 2008
    Inventors: Hiromi Yajima, Yukio Imoto, Shoichi Kodama, Riichiro Aoki, Takashi Omichi, Toyomi Nishi, Tetsuji Togawa
  • Patent number: 7198552
    Abstract: A polishing apparatus for polishing a surface of a workpiece includes a housing unit, a partition wall partitioning an interior of the housing unit into a first chamber and a second chamber, a polishing section disposed in the first chamber and having a turntable with an abrasive cloth mounted on an upper surface thereof and a top ring positioned above the turntable for supporting the workpiece to be polished and pressing the workpiece against the abrasive cloth, and a cleaning section disposed in the second chamber and cleaning the workpiece which has been polished. The polishing apparatus further includes a transferring device for transferring the workpiece which has been polished from the polishing section to the cleaning section through an opening and an exhaust system for exhausting ambient air from each of the polishing section and cleaning section separately and independently.
    Type: Grant
    Filed: December 6, 2005
    Date of Patent: April 3, 2007
    Assignees: Ebara Corporation, Kabushiki Kaisha Toshiba
    Inventors: Toyomi Nishi, Tetsuji Togawa, Harumitsu Saito, Manabu Tsujimura, Hiromi Yajima, Kazuaki Himukai, Shoichi Kodama, Yukio Imoto, Riichiro Aoki, Masako Watase, Atsushi Shigeta, Shiro Mishima, Gisuke Kouno
  • Publication number: 20060084369
    Abstract: A polishing apparatus for polishing a surface of a workpiece includes a housing unit, a partition wall partitioning an interior of the housing unit into a first chamber and a second chamber, a polishing section disposed in the first chamber and having a turntable with an abrasive cloth mounted on an upper surface thereof and a top ring positioned above the turntable for supporting the workpiece to be polished and pressing the workpiece against the abrasive cloth, and a cleaning section disposed in the second chamber and cleaning the workpiece which has been polished. The polishing apparatus further includes a transferring device for transferring the workpiece which has been polished from the polishing section to the cleaning section through an opening and an exhaust system for exhausting ambient air from each of the polishing section and cleaning section separately and independently.
    Type: Application
    Filed: December 6, 2005
    Publication date: April 20, 2006
    Inventors: Toyomi Nishi, Tetsuji Togawa, Harumitsu Saito, Manabu Tsujimura, Hiromi Yajima, Kazuaki Himukai, Shoichi Kodama, Yukio Imoto, Riichiro Aoki, Masako Watase, Atsushi Shigeta, Shiro Mishima, Gisuke Kouno
  • Patent number: 6997782
    Abstract: A polishing apparatus for polishing a surface of a workpiece includes a housing unit, a partition wall partitioning an interior of the housing unit into a first chamber and a second chamber, a polishing section disposed in the first chamber and having a turntable with an abrasive cloth mounted on an upper surface thereof and a top ring positioned above the turntable for supporting the workpiece to be polished and pressing the workpiece against the abrasive cloth, and a cleaning section disposed in the second chamber and cleaning the workpiece which has been polished. The polishing apparatus further includes a transferring device for transferring the workpiece which has been polished from the polishing section to the cleaning section through an opening and an exhaust system for exhausting ambient air from each of the polishing section and cleaning section separately and independently.
    Type: Grant
    Filed: September 27, 2002
    Date of Patent: February 14, 2006
    Assignees: Ebara Corporation, Kabushiki Kaisha Toshiba
    Inventors: Toyomi Nishi, Tetsuji Togawa, Harumitsu Saito, Manabu Tsujimura, Hiromi Yajima, Kazuaki Himukai, Shoichi Kodama, Yukio Imoto, Riichiro Aoki, Masako Watase, Atsushi Shigeta, Shiro Mishima, Gisuke Kouno
  • Publication number: 20030040261
    Abstract: A polishing apparatus for polishing a surface of a workpiece includes a housing unit, a partition wall partitioning an interior of the housing unit into a first chamber and a second chamber, a polishing section disposed in the first chamber and having a turntable with an abrasive cloth mounted on an upper surface thereof and a top ring positioned above the turntable for supporting the workpiece to be polished and pressing the workpiece against the abrasive cloth, and a cleaning section disposed in the second chamber and cleaning the workpiece which has been polished. The polishing apparatus further includes a transferring device for transferring the workpiece which has been polished from the polishing section to the cleaning section through an opening and an exhaust system for exhausting ambient air from each of the polishing section and cleaning section separately and independently.
    Type: Application
    Filed: September 27, 2002
    Publication date: February 27, 2003
    Inventors: Toyomi Nishi, Tetsuji Togawa, Harumitsu Saito, Manabu Tsujimura, Hiromi Yajima, Kazuaki Himukai, Shoichi Kodama, Yukio Imoto, Riichiro Aoki, Masako Watase, Atsushi Shigeta, Shiro Mishima, Gisuke Kouno
  • Patent number: 6500051
    Abstract: A polishing apparatus for polishing a surface of a workpiece includes a housing unit, a partition wall partitioning an interior of the housing unit into a first chamber and a second chamber, a polishing section disposed in the first chamber and having a turntable with an abrasive cloth mounted on an upper surface thereof and a top ring positioned above the turntable for supporting the workpiece to be polished and pressing the workpiece against the abrasive cloth, and a cleaning section disposed in the second chamber and cleaning the workpiece which has been polished. The polishing apparatus further includes a transferring device for transferring the workpiece which has been polished from the polishing section to the cleaning section through an opening and an exhaust system for exhausting ambient air from each of the polishing section and cleaning section separately and independently.
    Type: Grant
    Filed: June 27, 1997
    Date of Patent: December 31, 2002
    Assignees: Ebara Corporation, Kabushiki Kaisha Toshiba
    Inventors: Toyomi Nishi, Tetsuji Togawa, Harumitsu Saito, Manabu Tsujimura, Hiromi Yajima, Kazuaki Himukai, Shoichi Kodama, Yukio Imoto, Riichiro Aoki, Masako Watase, Atsushi Shigeta, Shiro Mishima, Gisuke Kouno
  • Patent number: 5827110
    Abstract: A polishing facility integrates separate components of polishing such as wafer transport, polishing, cleaning and drying in one standardized facility to provide efficient polishing operation at low cost. The facility is designed to deal with a variety of different types of wafers, including different types of surface film, and is designed also to enables quick and low cost upgrading of the facility to meet advancing requirements of customers. The polishing facility can be placed within a cleanroom to provide efficient handling of polished wafers for further processing and fabrication tasks. Individual work component of polishing is arranged in one block having its own power supply and signal lines, and is controlled by a central controller having a dedicated software program for each work component.
    Type: Grant
    Filed: December 28, 1995
    Date of Patent: October 27, 1998
    Assignees: Kabushiki Kaisha Toshiba, Ebara Corporation
    Inventors: Hiromi Yajima, Yukio Imoto, Shoichi Kodama, Riichiro Aoki, Takashi Omichi, Toyomi Nishi, Tetsuji Togawa
  • Patent number: 5704827
    Abstract: A polishing apparatus includes a detachable light weight cloth cartridge which shows little deformation under uneven loading during a polishing operation. Either mechanical or non-mechanical fixation of the cloth cartridge to a turntable is achieved. Mechanical fixation involves attaching the cloth cartridge to the turntable at peripheral and center sections of the cloth cartridge. Non-mechanical fixation involves attaching the cloth cartridge to the turntable by a vacuum arrangement. The assembly of the cloth cartridge and the turntable not only produces excellent flatness on polished semiconductor wafers by maintaining a level polishing surface, but also improves the production yield by preventing breakage of wafers during the polishing process.
    Type: Grant
    Filed: October 18, 1995
    Date of Patent: January 6, 1998
    Assignees: Ebara Corporation, Kabushiki Kaisha Toshiba
    Inventors: Toyomi Nishi, Manabu Tsujimura, Tamami Takahashi, Hiromi Yajima, Riichiro Aoki, Yukio Imoto, Shoichi Kodama, Kazuaki Himukai, Gisuke Kouno, Takanobu Nishimura
  • Patent number: 5679059
    Abstract: A polishing apparatus for polishing a surface of a workpiece includes a housing unit, a partition wall partitioning an interior of the housing unit into a first chamber and a second chamber, a polishing section disposed in the first chamber and having a turntable with an abrasive cloth mounted on an upper surface thereof and a top ring positioned above the turntable for supporting the workpiece to be polished and pressing the workpiece against the abrasive cloth, and a cleaning section disposed in the second chamber and cleaning the workpiece which has been polished. The polishing apparatus further includes a transferring device for transferring the workpiece which has been polished from the polishing section to the cleaning section through an opening and an exhaust system for exhausting ambient air from each of the polishing section and cleaning section separately and independently.
    Type: Grant
    Filed: November 28, 1995
    Date of Patent: October 21, 1997
    Assignees: Ebara Corporation, Kabushiki Kaisha Toshiba
    Inventors: Toyomi Nishi, Tetsuji Togawa, Harumitsu Saito, Manabu Tsujimura, Hiromi Yajima, Kazuaki Himukai, Shoichi Kodama, Yukio Imoto, Riichiro Aoki, Masako Watase, Atsushi Shigeta, Shiro Mishima, Gisuke Kouno