Abstract: A three-dimensional coordinate measurement apparatus capable of reducing shaking of a Y carriage and improving measurement accuracy. The Y carriage is supported by two strut members which are across a surface plate and movable in a Y-axis direction. The two strut members include a first strut member having a driving mechanism and a second strut member which moves following the first strut member. A guide portion parallel to the Y-axis direction is formed in the surface plate on a first strut member side. Side surface support members support the first strut member on the surface plate by holding both opposed side surfaces of the guide portion. The driving mechanism includes a roller having an axis perpendicular to a surface plate surface, and the roller is brought into contact with one side surface of the guide portion and rolled to move the Y carriage relatively to the surface plate.

Abstract: A three-dimensional coordinate measurement apparatus capable of reducing shaking of a Y carriage and improving measurement accuracy. The Y carriage is supported by two strut members which are across a surface plate and movable in a Y-axis direction. The two strut members include a first strut member having a driving mechanism and a second strut member which moves following the first strut member. A guide portion parallel to the Y-axis direction is formed in the surface plate on a first strut member side. Side surface support members support the first strut member on the surface plate by holding both opposed side surfaces of the guide portion. The driving mechanism includes a roller having an axis perpendicular to a surface plate surface, and the roller is brought into contact with one side surface of the guide portion and rolled to move the Y carriage relatively to the surface plate.

Abstract: A three-dimensional coordinate measurement apparatus capable of reducing shaking of a Y carriage and improving measurement accuracy. The Y carriage is supported by two strut members which are across a surface plate and movable in a Y-axis direction. The two strut members include a first strut member having a driving mechanism and a second strut member which moves following the first strut member. A guide portion parallel to the Y-axis direction is formed in the surface plate on a first strut member side. Side surface support members support the first strut member on the surface plate by holding both opposed side surfaces of the guide portion. The driving mechanism includes a roller having an axis perpendicular to a surface plate surface, and the roller is brought into contact with one side surface of the guide portion and rolled to move the Y carriage relatively to the surface plate.

Abstract: A three-dimensional coordinate measurement apparatus capable of reducing shaking of a Y carriage and improving measurement accuracy. The Y carriage is supported by two strut members which are across a surface plate and movable in a Y-axis direction. The two strut members include a first strut member having a driving mechanism and a second strut member which moves following the first strut member. A guide portion parallel to the Y-axis direction is formed in the surface plate on a first strut member side. Side surface support members support the first strut member on the surface plate by holding both opposed side surfaces of the guide portion. The driving mechanism includes a roller having an axis perpendicular to a surface plate surface, and the roller is brought into contact with one side surface of the guide portion and rolled to move the Y carriage relatively to the surface plate.

Abstract: There is provided a three-dimensional coordinate measurement apparatus capable of reducing shaking of a Y carriage and improving measurement accuracy. A groove is formed along a Y-axis direction in a right side part of a surface plate made of stone, and a Y guide is formed between the groove and a right side surface of the surface plate to support a Y carriage in a portal shape in a movable manner in the Y-axis direction. A support section is provided at a lower end of a right Y carriage on the right side of the Y carriage, and the support section is supported by the surface plate through air pads which are disposed by two air pads back and forth on the corresponding one of a top surface, a right side surface, and a bottom surface, of the surface plate, and a right side surface of the groove.

Abstract: There is provided a three-dimensional coordinate measurement apparatus capable of reducing shaking of a Y carriage and improving measurement accuracy. A groove is formed along a Y-axis direction in a right side part of a surface plate made of stone, and a Y guide is formed between the groove and a right side surface of the surface plate to support a Y carriage in a portal shape in a movable manner in the Y-axis direction. A support section is provided at a lower end of a right Y carriage on the right side of the Y carriage, and the support section is supported by the surface plate through air pads which are disposed by two air pads back and forth on the corresponding one of a top surface, a right side surface, and a bottom surface, of the surface plate, and a right side surface of the groove.

Abstract: An electronic component inspection apparatus includes an inspection socket which inspects a component, a tray disposition area in which a component waits before it is inspected, tray disposition areas which store a component after it has been inspected, components transfer mechanisms each of which has a vacuum or suction nozzle that can pick up and hold a component to transfer the component, a component position confirmation camera which can capture an image of the component that is being transferred, and a controller which transfers a component to the inspection socket, via a position in which the component position confirmation camera captures an image of the component being held by the suction nozzle while the component is being transferred from the tray disposition area to the inspection socket, and based on that captured image, controls the drive of the components transfer mechanisms so that the component is set in the inspection socket.

Abstract: An electronic component inspection apparatus includes an inspection socket which inspects a component, a tray disposition area in which a component waits before it is inspected, tray disposition areas which store a component after it has been inspected, components transfer mechanisms each of which has a vacuum or suction nozzle that can pick up and hold a component to transfer the component, a component position confirmation camera which can capture an image of the component that is being transferred, and a controller which transfers a component to the inspection socket, via a position in which the component position confirmation camera captures an image of the component being held by the suction nozzle while the component is being transferred from the tray disposition area to the inspection socket, and based on that captured image, controls the drive of the components transfer mechanisms so that the component is set in the inspection socket.

Abstract: An electronic component inspection apparatus includes an inspection socket which inspects a component, a tray disposition area in which a component waits before it is inspected, tray disposition areas which store a component after it has been inspected, components transfer mechanisms each of which has a vacuum or suction nozzle that can pick up and hold a component to transfer the component, a component position confirmation camera which can capture an image of the component that is being transferred, and a controller which transfers a component to the inspection socket, via a position in which the component position confirmation camera captures an image of the component being held by the suction nozzle while the component is being transferred from the tray disposition area to the inspection socket, and based on that captured image, controls the drive of the components transfer mechanisms so that the component is set in the inspection socket.

Abstract: An electronic component inspection apparatus includes an inspection socket which inspects a component, a tray disposition area in which a component waits before it is inspected, tray disposition areas which store a component after it has been inspected, components transfer mechanisms each of which has a vacuum or suction nozzle that can pick up and hold a component to transfer the component, a component position confirmation camera which can capture an image of the component that is being transferred, and a controller which transfers a component to the inspection socket, via a position in which the component position confirmation camera captures an image of the component being held by the suction nozzle while the component is being transferred from the tray disposition area to the inspection socket, and based on that captured image, controls the drive of the components transfer mechanisms so that the component is set in the inspection socket.

Abstract: An IC tester is provided which is capable of preventing the temperature of an IC heated to a predetermined temperature from falling during the test. A box-like housing 70 constructed of a thermally insulating material is mounted on a performance board PB. An IC socket SK and a socket guide 35 are accommodated in a space bounded by the box-like housing 70 and the performance board PB. A through-aperture 71 is formed in the top wall of the housing 70 for passing an IC under test carried by a movable rod 60R of a Z-axis driver into and out of the interior of the housing 70. An opening/closing plate 72 is disposed over the housing 70 for movement in a horizontal direction. This plate 72 is adapted to close the through-aperture 71 of the housing 70 when the movable rod 60R is outside of the housing to thereby maintain the interior of the box-like 70 in an almost thermally insulated condition.

Abstract: In an IC tester of the type in which ICs to be tested are heated by a planar heater plate 50 prior to being tested, a plate-like shutter 70 having windows 71 formed therethrough to expose IC receiving recesses 51 formed in the heater plate 50 is disposed movably over the top face of the heater plate. The arrangement is such that the shutter 70 is shifted by a linear drive source 74 between a position in which the shutter closes the top of the IC receiving recesses 51 and a position in which the shutter exposes the recesses. A controller is provided for actuating the drive source to move the shutter so as to open the IC receiving recesses, whenever a Z-axis drive unit 60 enters into either the operation of dropping off an IC grasped thereby into one of the IC receiving recesses or the operation of picking up an IC from one of the IC receiving recesses.

Abstract: A pick and place apparatus for picking, transferring and placing an object which is capable of performing picking and placing operations with high stability and high speed without causing a jamming. The pick and place apparatus has a negative pressure source therein and includes a first pressure detector for detecting suction condition in a process for picking up an object by applying a negative pressure from the negative pressure source, a second pressure detector for detecting suction-release condition in a process for placing the object on a predetermined position by releasing the negative pressure, and a controller for controlling an overall operation of the pick and place apparatus to proceed to the next procedure upon receiving a suction detection signal from the first pressure detector or a suction-release detection signal from the second pressure detector.

Abstract: A semiconductor device transporting and handling apparatus is provided which provides for positively grasping and transporting an IC out of a tray loaded with ICs, even if the tray is tilted due to deformations an/or distortions, by the use of a carrier head which is vertically movable through constant strokes. The tilt of the tray is measured by attitude gauging means comprising four sets of optical sensors, the altitude differences of the top surfaces of ICs accommodated in the tray with respect to a reference level are calculated by altitude difference calculating means, and the calculated altitude differences are stored in altitude difference storage means. Once an IC being picked up has been identified, the altitude difference of the identified IC with respect to the reference level is read out, and the position of the tray is moved vertically to conform with the reference level by altitude difference correcting means to insure that the carrier head can pick up the IC.

Abstract: A hamburger patty knife is provided which comprises a handle and a transition piece at one end of the handle forming an angle with the longitudinal axis of the handle. A flat plate extends away from the transition piece in a forward longitudinal direction. A blade attachment is provided having a beveled front edge. A structure is for securing the blade attachment to a distal edge of the plate in a removable manner. The beveled front edge of the blade attachment can be used to pick up and turn over a hamburger patty without disrupting the shape of the hamburger patty. Alternatively the blade can be installed in an upside down position which is extremely useful for cleaning dirty grills and pans.

Abstract: Described herein is a brake valve which is arranged to prevent low pressure relief actions by relief valves (59A) and (59B) at the time of starting an actuator, for improving the response characteristics and the safety of operation. This brake valve has relief valves (59A) and (59B) and check valves (70A) and (70B) located in coaxial positions, the check valves (70A) and (70B) being arranged to seat on fore end portions of valve seat members (62A) and (62B) when opened, thereby to substantially block the communication of the valve seat members (62A) and (62B) with inlet link passages (56A) and (56B). Therefore, when the check valve (70A) or (70B) is opened at the time of starting the actuator, the valve seat member (62A) or (62B) is supplied with only a throttled flow of hydraulic pressure through the notched portions (73A) or (73B).