Patents by Inventor Yukio Nakanouchi
Yukio Nakanouchi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 6551497Abstract: A gas sensor for measuring concentration of a gas component in a measured gas, including a solid electrolytic substrate and at least two electrodes fixed to the substrate. At least a first electrode of the electrodes is disposed in the environment of the measurement gas, at least one of electrodes is polarized by applying a bias current or bias voltage, and a change in the potential of the polarized electrode is measured to thereby measure the concentration of the target gas.Type: GrantFiled: December 22, 1999Date of Patent: April 22, 2003Assignee: Kabushiki Kaisha RikenInventors: Yunzhi Gao, Akira Kunimoto, Yongtie Yan, Hideyuki Kurosawa, Yukio Nakanouchi, Norio Miura, Noboru Yamazoe, Masaharu Hasei
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Patent number: 6303011Abstract: A nitrogen oxide sensor includes a solid electrolytic substrate exhibiting oxygen ion conductivity, a noble-metal reference electrode, which is active only to oxygen, formed on one side of the solid electrolytic substrate, and a sensing electrode, which is active to NOx and oxygen, formed on the opposite side of the solid electrolytic substrate. A potential difference across the sensing electrode and the reference electrode is output as a signal indicative of NOx concentration. Nitrogen oxides in a gas to be examined or measured gas are converted to NO2 and to peroxides of nitrogen such as N2O5 and NO3, after which the nitrogen oxides in the gas to be examined or measured gas are sensed by the sensing electrode as the peroxides of nitrogen such as N2O5 and NO3 or as a mixed gas of NO2 and the peroxides of nitrogen.Type: GrantFiled: June 18, 1998Date of Patent: October 16, 2001Assignee: Kabushiki Kaisha RikenInventors: Yunzhi Gao, Yukio Nakanouchi, Akira Kunimoto, Masaharu Hasei, Yongtie Yan, Takashi Ono
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Patent number: 6126902Abstract: A stable sensor designed to detect accurately the total NOx concentration under 100 ppm in terms of the NO gas concentration is made up of a first cell and a second cell with a gas diffusion aperture provided between the two cells. The first cell has a partition wall of a substrate of oxygen ion conductor containing zirconia as the main component and permitting a gas to be detected to enter the zirconia substrate; oxygen pumping electrodes are also formed on the first cell substrate which functions to expel oxygen in an atmosphere of the first cell to the outside and to reduce NO.sub.2 of the NOx gas to be detected to NO gas.Type: GrantFiled: June 3, 1997Date of Patent: October 3, 2000Assignee: Kabushiki Kaisha RikenInventors: Akira Kunimoto, Yongtie Yan, Masaharu Hasei, Hideyuki Kurosawa, Yukio Nakanouchi
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Patent number: 6019881Abstract: The present invention discloses a NO.sub.x sensor consisting at least of a pair of the first and the second electrodes formed in touch with an oxygen conductive solid electrolyte; wherein at least the first elelctrode is composed of oxides of an element selected from 7a Group or 8 Group, especially from Mn, Fe, Co, and Ni or a substance containing said oxides or of hybrid oxides (including the one of oxygen deficiency expressed by ABO.sub.3, AB.sub.2 O.sub.4, A.sub.2 BO.sub.4 and ACBO.sub.4 including 7a Group and 8 Group. A NO.sub.x sensor acording to the present invention has a good sensitivity without being affected by the concentration of CO.sub.2 and detects NO.sub.x concentration in an exhaust gas at a temperature above 600.degree. C.Type: GrantFiled: September 25, 1998Date of Patent: February 1, 2000Assignee: Kabushiki Kaisha RikenInventors: Hideyuki Kurosawa, Masaharu Hasei, Yukio Nakanouchi
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Patent number: 5861092Abstract: A method and a detector for detecting nitrogen oxide in test gas are provided wherein test gas which contains NOx and interference gases is supplied through an oxygen feeder 4 into a measuring chamber 1a, and the interference gases are oxidized by oxygen or oxygen ion supplied to the measuring chamber 1a through oxygen feeder 4. A total amount of NOx in the test gas is detected based on a level of EMF produced between a first electrode 2 for detecting oxygen and NO2 gas and a second electrode 3 for detecting oxygen.Type: GrantFiled: September 18, 1997Date of Patent: January 19, 1999Assignee: Riken CorporationInventors: Fumio Kiyota, Masaharu Hasei, Yukio Nakanouchi
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Patent number: 4950380Abstract: A limiting current-type oxygen sensor including (a) a pair of oxygen ion-permeable substrates made of a zirconia solid electrolyte; (b) at least one diffusion pore provided in at least one of the substrates, which extends substantially along the thickness of the substrate for causing oxygen diffusion through the diffusion pore to be a rate-determining step; (c) a sealing member for fixing the pair of substrates such that a closed chamber is defined between the substrates; and (d) a pair of porous electrodes provided on both outer and inner surfaces of each electrode.Type: GrantFiled: August 1, 1989Date of Patent: August 21, 1990Assignee: Kabushiki Kaisha RikenInventors: Hideyuki Kurosawa, Kazuhiro Takahashi, Yukio Nakanouchi
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Patent number: 4938861Abstract: A limiting current-type oxygen sensor including (a) an oxygen ion-permeable substrate made of a zirconia solid electrolyte having a gas diffusion pore extending between first and second surfaces of the substrate for rate determination by oxygen diffusion through the pore; (b) a first porous electrode formed on the first surface of the substrate in an area including an opening of the gas diffusion pore; (c) a second porous electrode formed on the second surface of the substrate such that it is opposite to the first porous electrode via the substrate; (d) a sealing member fixed to the second surface of the substrate for sealing the second porous electrode such that the internal chamber is defined on the second porous electrode; and (e) a heating means mounted to the sealing member.Type: GrantFiled: August 1, 1989Date of Patent: July 3, 1990Assignee: Kabushiki Kaisha RikenInventors: Hideyuki Kurosawa, Kazuhiro Takahashi, Tetsuo Uchiyama, Yukio Nakanouchi
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Patent number: 4688130Abstract: A perpendicular magnetic recording medium is formed of a substrate having 5.times.10.sup.5 -5.times.10.sup.9 fine projections per mm.sup.2 on the surface thereof, said projections having heights in the range of 0.01-10 .mu.m and diameters in the range of 0.01-1 .mu.m, and a ferromagnetic material deposited uniformly in a columnar form on the projections. The recording medium is produced by providing in advance fine projections, the heights and diameters of which are 0.01-10 .mu.m and 0.01-1 .mu.m respectively, on the surface of a substrate to a density of 5.times.10.sup.5 -5.times.10.sup.9 projections per mm.sup.2, and then causing a ferromagnetic material to deposit on the substrate from a vapor phase in such a way that the deposited material is preferentially allowed to adhere onto the projections and then to grow the ferromagnetic material in a direction perpendicular to the plane of the substrate.Type: GrantFiled: August 19, 1985Date of Patent: August 18, 1987Assignee: Research Development Corporation of JapanInventors: Yukio Nakanouchi, Shigehiro Ohnuma, Tsuyoshi Masumoto
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Patent number: 4584078Abstract: A method of producing fine particles with a particle size of submicron or finer which comprises the steps of:forming closely fine projections on a substrate surface, preferably by sputter-etching using an ionized gas; and thensputtering metallic or non-metallic materials onto the thus treated substrate in an inert gas or a mixed gas of an inert gas and a reactive gas, such as oxygen, the gas pressure of the inert gas or the mixed gas being in the range of from 1.times.10.sup.-4 torr to 1.times.10.sup.-1 torr, and thereby depositing the purposed fine particles in crystalline or amorphous form. The invention method can successfully provide fine particles with desired properties, for example, in size, shape and structure, by adjusting producing conditions or selection of substrate materials and the thus obtained fine particles are very useful in various applications with or without the substrate.Type: GrantFiled: August 1, 1984Date of Patent: April 22, 1986Assignees: Yukio Nakanouchi, Shigehiro Ohnuma, Tsuyoshi Masumoto, Research Development Corporation of JapanInventors: Yukio Nakanouchi, Shigehiro Ohnuma, Tsuyoshi Masumoto