Abstract: A high-shear melt-kneader includes a high-shear unit (20) having an internal feedback-type screw (23) configured to apply high-shear stress to a melted resin, resin pressure sensors (33) for configured to detect a front portion resin pressure in the vicinity of an inlet of the internal feedback-type screw and a rear portion resin pressure in the vicinity of an outlet, and a control device configured to appropriately control a material supplying amount, a material temperature, a kneading time, and a screw rotation speed according to pressure values detected by the sensors. The control device controls the conditions such that waveforms with the lapse of time of the front and rear portion resin pressures are similar to each other and show variation to a steady state after formation of a predetermined peak value, and the front and rear portion resin pressures form a predetermined pressure difference with the lapse of time.

Abstract: Separation and the like of an excised specimen from a specimen are automatically performed. Marks for improving image recognition accuracy are provided in a region that becomes an excised specimen in a specimen and a region other than said region, or in a transfer means for transferring the excised specimen and a specimen holder capable of holding the excised specimen, and the relative movement of the excised specimen and the specimen, and the like are recognized with high accuracy by image recognition. In the sampling of a minute specimen using a focused ion beam, the detection of an end point of processing for separation of the excised specimen from the specimen, and the like are automatically performed. Thus, for example, unmanned specimen excision becomes possible, and preparation of a lot of specimens becomes possible.

Abstract: An object of the present invention is to eliminate a distortion in an image even if there is an angular difference between the deflection direction of the charged particle beam and the tilt axis of a specimen, and to accurately observe and process the specimen. When the deflection direction of the charged particle beam is not parallel to the tilt axis of the specimen, the deflection rotation angle to the observation direction of the charged particle beam is determined, and the deflection pattern is changed. Thereby the distortion in the image is corrected. The deflection pattern is changed to a parallelogram. A distortion-free image is obtained even if the specimen is tilted, and the specimen can be observed and processed with high accuracy. This allows automatically recognizing the position correction mark to perform observation and processing after correcting the positional relation.

Abstract: Separation and the like of an excised specimen from a specimen are automatically performed. Marks for improving image recognition accuracy are provided in a region that becomes an excised specimen in a specimen and a region other than said region, or in a transfer means for transferring the excised specimen and a specimen holder capable of holding the excised specimen, and the relative movement of the excised specimen and the specimen, and the like are recognized with high accuracy by image recognition. In the sampling of a minute specimen using a focused ion beam, the detection of an end point of processing for separation of the excised specimen from the specimen, and the like are automatically performed. Thus, for example, unmanned specimen excision becomes possible, and preparation of a lot of specimens becomes possible.

Abstract: An object of the present invention is to eliminate a distortion in an image even if there is an angular difference between the deflection direction of the charged particle beam and the tilt axis of a specimen, and to accurately observe and process the specimen. When the deflection direction of the charged particle beam is not parallel to the tilt axis of the specimen, the deflection rotation angle to the observation direction of the charged particle beam is determined, and the deflection pattern is changed. Thereby the distortion in the image is corrected. The deflection pattern is changed to a parallelogram. A distortion-free image is obtained even if the specimen is tilted, and the specimen can be observed and processed with high accuracy. This allows automatically recognizing the position correction mark to perform observation and processing after correcting the positional relation.

Abstract: A high-shear melt-kneader includes a high-shear unit (20) having an internal feedback-type screw (23) configured to apply high-shear stress to a melted resin, resin pressure sensors (33) for configured to detect a front portion resin pressure in the vicinity of an inlet of the internal feedback-type screw and a rear portion resin pressure in the vicinity of an outlet, and a control device configured to appropriately control a material supplying amount, a material temperature, a kneading time, and a screw rotation speed according to pressure values detected by the sensors. The control device controls the conditions such that waveforms with the lapse of time of the front and rear portion resin pressures are similar to each other and show variation to a steady state after formation of a predetermined peak value, and the front and rear portion resin pressures form a predetermined pressure difference with the lapse of time.

Abstract: To provide a charged particle system capable of facilitating comparison between an actual pattern and an ideal pattern using not only two-dimensional CAD data but also three-dimensional CAD data. According to the present invention, using information about the angle of irradiation of a sample with a charged particle beam, a two-dimensional display of an ideal pattern (design data, such as CAD data, for example) is converted into a three-dimensional display, and the three-dimensional ideal pattern is displayed with an observation image. If the three-dimensional ideal pattern is superimposed on the observation image, comparison thereof can be easily carried out.

Abstract: To provide a charged particle system capable of facilitating comparison between an actual pattern and an ideal pattern using not only two-dimensional CAD data but also three-dimensional CAD data. According to the present invention, using information about the angle of irradiation of a sample with a charged particle beam, a two-dimensional display of an ideal pattern (design data, such as CAD data, for example) is converted into a three-dimensional display, and the three-dimensional ideal pattern is displayed with an observation image. If the three-dimensional ideal pattern is superimposed on the observation image, comparison thereof can be easily carried out.

Abstract: It is an object of this invention to improve contact precision and probe operability. This invention controls sample stage movement and probe movement on an observation image using a single coordinate system, thereby allowing positioning using a sample stage stop error as a probe control movement amount. This invention also figures out the position of the tip of a probe using the observation image and stores the coordinates of the probe at a reference position on the image. This invention facilitates precise probe contact operation to a sample position of the order of microns.

Abstract: A sifter frame is composed of a pair of frame elements including an outer frame and an inner frame, and the outer frame is formed from a frame member having the same height and includes a pair of fine powder dropping ports, a rough powder dropping port and a rectangular fine powder receiving plate disposed in a region surrounded by these openings and one of the outer block frame members and the inner frame is fitted with the space above the receiving plate.

Abstract: A sifter frame is composed of a pair of frame elements including an outer frame and an inner frame, and the outer frame is formed from a frame member having the same height and includes a pair of fine powder dropping ports, a rough powder dropping port and a rectangular fine powder receiving plate disposed in a region surrounded by these openings and one of the outer block frame members and the inner frame is fitted with the space above the receiving plate.

Abstract: An improved injection molding apparatus having a fixed mold 7 having a molten resin passage 16b and a movable second mold 8 having a molten resin passage 18 is presented in which residual hardened resin left in molten resin passages of the injection apparatus is removed automatically after every injection operation. The invented device is provided with a reciprocating member 34 which is coupled in molten resin passages 16b, 18, and during the injection step, the molten resin passage 16b is extended to the molten resin passage 18 by moving the reciprocating member 34 into the second mold to communicate a mold cavity 17 with a resin injection device 14. After the completion of the injection step, the reciprocating member 34 is moved to the back position to remove any resin left in the molten resin passage towards the first mold.

Abstract: The present intention intends to operate an ejector which carries out gate cut and product ejection in an injection molding machine, at optimal speeds, respectively. According to the present invention, a control unit for controlling hydraulic or electric drive means for operating one or more than one ejector pin comprises operation speed setting means for gate cut and another operation speed setting means for product ejection. Such a structure enables to carry out gate cut by operating an ejector unit controlled by an ejector unit operation speed setting means for a gate cut and, subsequently, to carry out a product ejection from metallic molds by operating the ejector unit controlled by another ejector unit operation speed setting means for product ejection. The ejector unit is set at a comparatively high operation speed for gate cut so that no gate trace will remain, and at a comparatively low operation speed for product ejection so that no cracks will be generated in the product.