Abstract: The detection system according to the present invention has a detection chip, a light source, and a detection unit. The detection chip has a housing that has an opening at an upper portion, and a reaction field for trapping a substance to be detected, the reaction field being arranged on an inner surface of the side walls included in the housing. The light source irradiates the detection chip with light from the outside such that evanescent light or surface plasmon resonance is generated under the reaction field. The detection unit detects light which is emitted from the detection chip when the light source irradiates the detection chip with light, and the amount of which changes depending on the amount of the substance to be detected trapped in the reaction field.

Abstract: The detection system according to the present invention has a detection chip, a light source, and a detection unit. The detection chip has a housing that has an opening at an upper portion, and a reaction field for trapping a substance to be detected, the reaction field being arranged on an inner surface of the side walls included in the housing. The light source irradiates the detection chip with light from the outside such that evanescent light or surface plasmon resonance is generated under the reaction field. The detection unit detects light which is emitted from the detection chip when the light source irradiates the detection chip with light, and the amount of which changes depending on the amount of the substance to be detected trapped in the reaction field.

Abstract: The present invention is to provide a diffracted light removal slit and an optical sample detection system including the same, in which diffracted light of excitation light can be reliably removed without affecting reflected light of the excitation light in a sample detection device utilizing the reflected light of the excitation light. A diffracted light removal slit is provided between a light source unit and an excitation light reflector in an optical sample detection system that emits excitation light from the light source unit and also performs predetermined measurement using reflected light of the excitation light reflected at the excitation light reflector. The diffracted light removal slit includes: a main portion provided in a direction substantially perpendicular to an optical path of the excitation light; and a sidewall portion extending from an end portion of the main portion and inclined toward an upstream side in an optical path direction of the excitation light.

Abstract: Provided is a position detection method and a position detection device for detecting a position of a sensor chip and obtaining relative positional information between a well member and a prism as for a well chip type sensor chip in which the well member is provided on a prism. By applying measurement light to the sensor chip while changing a distance between the sensor chip and a measurement light irradiation unit and detecting reflected light traveling in a predetermined direction out of the reflected light generated when the measurement light is reflected by the sensor chip, at least any one of the position of the sensor chip and the relative position between a dielectric member and a sample solution holding member is detected on the basis of a change in intensity of the detected reflected light.

Abstract: The present invention is to provide a diffracted light removal slit and an optical sample detection system including the same, in which diffracted light of excitation light can be reliably removed without affecting reflected light of the excitation light in a sample detection device utilizing the reflected light of the excitation light. A diffracted light removal slit is provided between a light source unit and an excitation light reflector in an optical sample detection system that emits excitation light from the light source unit and also performs predetermined measurement using reflected light of the excitation light reflected at the excitation light reflector. The diffracted light removal slit includes: a main portion provided in a direction substantially perpendicular to an optical path of the excitation light; and a sidewall portion extending from an end portion of the main portion and inclined toward an upstream side in an optical path direction of the excitation light.

Abstract: A first frame having a first through-hole is arranged on a support so that one opening of the first through-hole is closed. A liquid containing a capturer for capturing a substance to be detected is fed into the first through-hole, and the capturer is immobilized on the support exposed in the first through-hole. After removing the liquid from the support, a second frame having the second through-hole is arranged on the support in the first through-hole so that one opening of the second through-hole is closed.

Abstract: The surface plasmon-enhanced fluorescence measurement device has: a light source that irradiates the diffraction grating with a linearly polarized excitation light; a rotating part that changes the direction of the optical axis of the excitation light with respect to the diffraction grating when seen in plan view, or changes the polarization direction of the excitation light with respect to the diffraction grating; a polarizer that extracts linearly polarized light from the fluorescence emitted from the fluorescent substance; and a light detection unit that detects the linearly polarized light extracted by the polarizer.

Abstract: A first frame having a first through-hole is arranged on a support so that one opening of the first through-hole is closed. A liquid containing a capturer is fed into the first through-hole, and a capturer is immobilized on the support exposed in the first through-hole. After removing the liquid from the support, a second frame having the second through-hole is arranged on the support in the first through-hole so that one opening of the second through-hole is closed.

Abstract: A measurement device is for measuring a sample arranged on a thick film transparent medium. In the measurement device, a light projecting surface, a light receiving surface, the thick film transparent medium, and a sample are set so as to satisfy the following formula (?) for eliminating noise light reflected from a back surface of the thick film transparent medium: h<(L/n3)·?((2H/D2)·(2H/D2)?n3·n3+1) . . . Formula (?). In formula (?), h denotes a distance from the light receiving surface to the sample, L denotes a half of an interval between the light projecting surface and the light receiving surface, n3 denotes a refractive index of the thick film transparent medium, H denotes a thickness of the thick film transparent medium, and D2 denotes an aperture of the light receiving surface.

Abstract: A surface plasmon fluorescence analysis device that has a chip holder, a light source, an angle adjustment unit, a light sensor, a filter holder, an excitation light cut filter, a scattered light transmission unit, a transmission adjustment unit, and a control unit. As seen in plan view, the area occupied by the scattered light transmission unit is arranged on the excitation light cut filter or on the filter holder and is smaller than the area of a fluorescence transmission region as seen in plan view.

Abstract: The present invention pertains to a surface plasmon enhanced fluorescence analysis device and a surface plasmon enhanced fluorescence measurement method which use GC-SPFS and make it possible to detect a substance to be detected with high sensitivity. This surface plasmon enhanced fluorescence measurement device has: a light source for irradiating the diffraction grating of a chip with excited light; a polarizer for removing linearly polarized light from fluorescent light emitted from a fluorescent substance on the diffraction grating; and a photodetector for detecting the linearly polarized light removed by the polarizer.

Abstract: Provided is a position detection method and a position detection device for detecting a position of a sensor chip and obtaining relative positional information between a well member and a prism as for a well chip type sensor chip in which the well member is provided on a prism. By applying measurement light to the sensor chip while changing a distance between the sensor chip and a measurement light irradiation unit and detecting reflected light traveling in a predetermined direction out of the reflected light generated when the measurement light is reflected by the sensor chip, at least any one of the position of the sensor chip and the relative position between a dielectric member and a sample solution holding member is detected on the basis of a change in intensity of the detected reflected light.

Abstract: A surface plasmon fluorescence analysis device that has a chip holder, a light source, an angle adjustment unit, a light sensor, a filter holder, an excitation light cut filter, a scattered light transmission unit, a transmission adjustment unit, and a control unit. As seen in plan view, the area occupied by the scattered light transmission unit is arranged on the excitation light cut filter or on the filter holder and is smaller than the area of a fluorescence transmission region as seen in plan view.

Abstract: The detection chip according to the present invention has an accommodating part, a metal film, a first reaction field, and a second reaction field. The accommodating part accommodates a liquid. The metal film is arranged in a bottom part of the accommodating part so that one face thereof faces into the accommodating part. The first reaction field and the second reaction field are arranged in mutually different regions on one face of the metal film. A capture body is immobilized in the first reaction field and the second reaction field. When the liquid is accommodated in the accommodating part, the depth of the liquid on the first reaction field differs from the depth of the liquid on the second reaction field.

Abstract: The detection chip according to the present invention has an accommodating part, a metal film, a first reaction field, and a second reaction field. The accommodating part accommodates a liquid. The metal film is arranged in a bottom part of the accommodating part so that one face thereof faces into the accommodating part. The first reaction field and the second reaction field are arranged in mutually different regions on one face of the metal film. A capture body is immobilized in the first reaction field and the second reaction field. When the liquid is accommodated in the accommodating part, the depth of the liquid on the first reaction field differs from the depth of the liquid on the second reaction field.

Abstract: A first frame having a first through-hole is arranged on a support so that one opening of the first through-hole is closed. A liquid containing a capturer is fed into the first through-hole, and a capturer is immobilized on the support exposed in the first through-hole. After removing the liquid from the support, a second frame having the second through-hole is arranged on the support in the first through-hole so that one opening of the second through-hole is closed.

Abstract: The surface plasmon-enhanced fluorescence measurement device has: a light source that irradiates the diffraction grating with a linearly polarized excitation light; a rotating part that changes the direction of the optical axis of the excitation light with respect to the diffraction grating when seen in plan view, or changes the polarization direction of the excitation light with respect to the diffraction grating; a polarizer that extracts linearly polarized light from the fluorescence emitted from the fluorescent substance; and a light detection unit that detects the linearly polarized light extracted by the polarizer.

Abstract: The present invention pertains to a surface plasmon enhanced fluorescence analysis device and a surface plasmon enhanced fluorescence measurement method which use GC-SPFS and make it possible to detect a substance to be detected with high sensitivity. This surface plasmon enhanced fluorescence measurement device has: a light source for irradiating the diffraction grating of a chip with excited light; a polarizer for removing linearly polarized light from fluorescent light emitted from a fluorescent substance on the diffraction grating; and a photodetector for detecting the linearly polarized light removed by the polarizer.

Abstract: A surface plasmon fluorescence analysis device that has a chip holder, a light source, an angle adjustment unit, a light sensor, a filter holder, an excitation light cut filter, a scattered light transmission unit, a transmission adjustment unit, and a control unit. As seen in plan view, the area occupied by the scattered light transmission unit is arranged on the excitation light cut filter or on the filter holder and is smaller than the area of a fluorescence transmission region as seen in plan view.

Abstract: Provided is an apparatus having a beam geometry changing device that changes the beam geometry of excitation light, and a control device that controls the beam geometry changing device, with favorable precision, which the apparatus performs a resonance angle scan and to detect a target material.