Patents by Inventor Yukiya Hattori

Yukiya Hattori has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7260173
    Abstract: An image pickup unit is disposed so as to be able to obtain a scan projection image of an inspection subject from each of a vertical direction and a horizontal direction. An X-ray absorption coefficient of an object in the inspection subject is obtained from the vertical scan projection image and the horizontal scan projection image. It is determined whether there is a threat in the inspection subject on the basis of the X-ray absorption coefficient. Furthermore, a CT image is obtained by moving the image pickup unit around the inspection subject. It is determined whether there is a threat in the inspection subject, on the basis of the CT values of the CT image.
    Type: Grant
    Filed: February 25, 2003
    Date of Patent: August 21, 2007
    Assignees: Hitachi, Ltd., Hitachi Engineering & Services Co., Ltd.
    Inventors: Kyoichiro Wakayama, Hiroya Koshishiba, Hidehiro Okada, Yukiya Hattori
  • Publication number: 20040101097
    Abstract: An image pickup unit is disposed so as to be able to obtain a scan projection image of an inspection subject from each of a vertical direction and a horizontal direction. An X-ray absorption coefficient of an object in the inspection subject is obtained from the vertical scan projection image and the horizontal scan projection image. It is determined whether there is a threat in the inspection subject on the basis of the X-ray absorption coefficient. Furthermore, a CT image is obtained by moving the image pickup unit around the inspection subject. It is determined whether there is a threat in the inspection subject, on the basis of the CT values of the CT image.
    Type: Application
    Filed: February 25, 2003
    Publication date: May 27, 2004
    Inventors: Kyoichiro Wakayama, Hiroya Koshishiba, Hidehiro Okada, Yukiya Hattori
  • Patent number: 6333962
    Abstract: A non-destructive inspection apparatus has a radiation source, a radiation detector, a radiation source diver, a detector driver, a drive controller, a delay circuit, a radiation signal processing circuit, a memory, a computer, a display device, and an input device. The radiation detector consists of one-dimensional or two-dimensional array of detectors having a long collimator whose pores are in parallel with the radiation angle of the radiation emitted in an angular pattern from the radiation source, whereby a transmission image of a large size structure can be obtained at high speed and with a high resolution. Furthermore, the detect position in an inspection object can be specified by analyzing a plurality of specified transmission images using the inspection apparatus.
    Type: Grant
    Filed: June 7, 1999
    Date of Patent: December 25, 2001
    Assignee: Hitachi, Ltd.
    Inventors: Hiroshi Kitaguchi, Shigeru Izumi, Hiroshi Miyai, Katsutoshi Sato, Yasuko Aoki, Yukiya Hattori
  • Patent number: 6049586
    Abstract: A non-destructive inspection apparatus has a radiation source, a radiation detector, a radiation source diver, a detector driver, a drive controller, a delay circuit, a radiation signal processing circuit, a memory, a computer, a display device, and an input device. The radiation detector consists of one-dimensional or two-dimensional array of detectors having a long collimator whose pores are in parallel with the radiation angle of the radiation emitted in an angular pattern from the radiation source, whereby a transmission image of a large size structure can be obtained at high speed and with a high resolution. Furthermore, the detect position in an inspection object can be specified by analyzing a plurality of specified transmission images using the inspection apparatus.
    Type: Grant
    Filed: June 7, 1999
    Date of Patent: April 11, 2000
    Assignee: Hitachi, Ltd.
    Inventors: Hiroshi Kitaguchi, Shigeru Izumi, Hiroshi Miyai, Katsutoshi Sato, Yasuko Aoki, Yukiya Hattori
  • Patent number: 5933473
    Abstract: A non-destructive inspection apparatus has a radiation source, a radiation detector, a radiation source diver, a detector driver, a drive controller, a delay circuit, a radiation signal processing circuit, a memory, a computer, a display device, and an input device. The radiation detector consists of one-dimensional or two-dimensional array of detectors having a long collimator whose pores are in parallel with the radiation angle of the radiation emitted in an angular pattern from the radiation source, whereby a transmission image of a large size structure can be obtained at high speed and with a high resolution. Furthermore, the detect position in an inspection object can be specified by analyzing a plurality of specified transmission images using the inspection apparatus.
    Type: Grant
    Filed: April 2, 1997
    Date of Patent: August 3, 1999
    Assignee: Hitachi, Ltd.
    Inventors: Hiroshi Kitaguchi, Shigeru Izumi, Hiroshi Miyai, Katsutoshi Sato, Yasuko Aoki, Yukiya Hattori