Abstract: A method of creating a debug specification includes the steps of reading in either a measurement specification or a test program, extracting setting conditions for each measuring parameter from the read measurement specification or the test program, extracting terminals of a circuit to be measured required for debugging as checking terminals, extracting the setting conditions of the extracted checking terminals as checking conditions, determining whether the checking terminals and the checking conditions for each extracted measuring parameter are changed from the corresponding previous measuring parameter of the previous stage, extracting the changed checking terminals and the checking conditions as changing conditions when the checking terminals and the checking conditions have changed and extracting a changing timing at which the change takes place, and outputting all the changing conditions and the changing timings extracted for all the measuring parameters as a debug specification.

Abstract: A semiconductor measuring apparatus having a measuring test head having a connection portion to which a circuit to be measured may be connected, a monitoring test head for connection to the connection portion of the measuring test head during a debugging operation, a measuring power source connected to the measuring test head, a monitor power source connected to the monitoring test head, an electrical signal measuring device connected to both the measuring test head and the monitoring test head, and a control unit for controlling the measuring power source, the monitor power source, and the electrical signal measuring device, causing the electrical signal measuring device to measure an output signal from the measuring test head during measurement of a circuit and causing the electrical signal measuring device to measure an output signal from the monitoring test head during a debugging operation.

Abstract: In a method of measuring characteristics of an electronic circuit on a plurality of measurement items by means of a measuring apparatus which operates in accordance with a measurement execution program, a plurality of measurement specifications the measurement items are expressed in the form of a measurement specification description table of a fixed-word-length type. A measurement specification description program is formed in which the measurement specification description table is directly reflected. A measurement execution program is formed by appointing a measuring sequence in the measurement specification description program and by removing redundancy and combining programs of a plurality of measuring items which can be measured in parallel. The measurement execution program is subjected to a debugging conducted by operating the measuring apparatus in accordance with the measurement execution program.

Abstract: A method of preparing measurement specifications is used in measuring the properties of an electronic circuit by means of a test facility which includes a measurement apparatus which operates in accordance with a measurement program including measurement specifications. The method includes the steps of preparing an overall testing peripheral circuit, an interface between the overall testing peripheral circuit and the measurement apparatus, and a measurement specification for each measurement item based on input signals, switch settings, and input/output signal paths of the overall testing peripheral circuit, activating the measurement apparatus in accordance with the measurement program to produce results for each measurement item, and correcting measurement specifications based on the result of the measurement and the measurement program.

Abstract: A method for preparing the measurement specifications of an electronic circuit comprises the steps of preparing testing peripheral circuit diagrams for individual measurement items by adding standardized testing peripheral circuit modules to the basic peripheral circuit diagram of the electronic circuit, preparing an overall testing peripheral circuit diagram for use in making measurements corresponding to all the measurement items by synthesizing these testing peripheral circuit diagrams with one another, and preparing measurement specifications for individual measurement items for use in making measurements employing the overall testing peripheral circuit diagram, from the overall testing peripheral circuit diagram and the testing peripheral circuit diagrams.

Abstract: An apparatus for automatically preparing measurement programs is used in operating measurement apparatus for measuring the properties of electronic circuits such as intergrated circuits (ICs). The apparatus includes a measurement quality verification apparatus which modifies and standardizes measurement specifications input through a measurement specifications input apparatus. It further includes a measurement condition setting table preparing apparatus which develops these measurement specifications into a measurement condition setting table, which is transformed into a measurement program by a measurement program transformation apparatus.