Patents by Inventor Yulia Lovsky

Yulia Lovsky has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Thin film thickness adjustments for three-dimensional interferometric measurements
    Patent number: 12584733
    Abstract: A 3D surface map of a workpiece is determined using an interferometric quantitative phase imaging technique. The workpiece includes a transparent thin film or layers stack. The 3D surface map is corrected based on a thickness and a refractive index of the transparent thin film or layers stack. This technique can be used with an inspection system configured to perform an interferometric quantitative phase imaging.
    Type: Grant
    Filed: August 4, 2023
    Date of Patent: March 24, 2026
    Inventors: Nachum Yoav, Yulia Lovsky, Ronen Levy
  • THIN FILM THICKNESS ADJUSTMENTS FOR THREE-DIMENSIONAL INTERFEROMETRIC MEASUREMENTS
    Publication number: 20250044073
    Abstract: A 3D surface map of a workpiece is determined using an interferometric quantitative phase imaging technique. The workpiece includes a transparent thin film or layers stack. The 3D surface map is corrected based on a thickness and a refractive index of the transparent thin film or layers stack. This technique can be used with an inspection system configured to perform an interferometric quantitative phase imaging.
    Type: Application
    Filed: August 4, 2023
    Publication date: February 6, 2025
    Inventors: Yulia Lovsky, Nachum Yoav, Ronen Levy