Patents by Inventor Yumi Kodama

Yumi Kodama has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Probe card maintenance method which adjusts position/posture of probes
    Patent number: 8446160
    Abstract: An improved probe card maintenance method is capable of accurately, rapidly, and easily performing the maintenance of a probe card. The probe card is a jig adapted to test the electrical properties of semiconductor integrated circuits. The electrical properties of the semiconductor integrated circuits are tested at a predetermined test temperature. The probe card has a plurality of probes thereon. The probe card maintenance method includes heating the probe card and the probes on the probe card to the same temperature as the test temperature. The method also includes adjusting positions and postures of the defective probes while maintaining the temperature of the probe card and the probes at the test temperature.
    Type: Grant
    Filed: February 1, 2010
    Date of Patent: May 21, 2013
    Assignee: Oki Semiconductor Co., Ltd.
    Inventors: Katsuhiro Gunji, Toru Iwasaki, Tatsurou Nagai, Yumi Kodama
  • PROBE CARD MAINTENANCE METHOD
    Publication number: 20100196136
    Abstract: An improved probe card maintenance method is capable of accurately, rapidly, and easily performing the maintenance of a probe card. The probe card is a jig adapted to test the electrical properties of semiconductor integrated circuits. The electrical properties of the semiconductor integrated circuits are tested at a predetermined test temperature. The probe card has a plurality of probes thereon. The probe card maintenance method includes heating the probe card and the probes on the probe card to the same temperature as the test temperature. The method also includes adjusting positions and postures of the defective probes while maintaining the temperature of the probe card and the probes at the test temperature.
    Type: Application
    Filed: February 1, 2010
    Publication date: August 5, 2010
    Applicant: OKI SEMICONDUCTOR CO., LTD.
    Inventors: Katsuhiro Gunji, Toru Iwasaki, Tatsurou Nagai, Yumi Kodama