Abstract: A novel cosmid vector and the like effectively used in generating a recombinant adenoviral vector are provided. More specifically, there are provided a cosmid vector characterized by: (1) containing an adenoviral genome having adenoviral inverted terminal repeat sequences each having a complete nucleotide sequence, (2) having a deletion in an adenovirus E1 gene region, and (3) containing a restriction enzyme recognition sequence not present in the adenoviral genome, on both sides of the adenoviral genome; a method of generating a recombinant adenoviral vector using the cosmid vector; and a reagent for generating a recombinant adenoviral vector containing the cosmid vector as a component.

Abstract: To provide DNA comprising mutant FRT sequence which causes recombination reaction between two mutant FRT sequences having an identical sequence to each other but does not cause recombination reaction with a wild-type FRT sequence, in the presence of FLP recombinase; and a method for performing high-efficiency, gene insertion or gene replacement. A DNA comprising a mutant FRT sequence. A DNA comprising a mutant FRT sequence possessing (A) causing no specific DNA recombination reaction with wild type FRT, even if FLP recombinase is present, and (B) causing specific DNA recombination reaction with another mutant FRT sequence having an identical sequence thereto in the presence of recombinase FLP; gene replacement method using the DNA in the presence of recombinase FLP; and a specific DNA recombination method, characterized in that a specific DNA recombination reaction is carried out by using two mutant FRT sequences in the presence of recombinase FLP.

Abstract: To provide DNA comprising mutant FRT sequence which causes recombination reaction between two mutant FRT sequences having an identical sequence to each other but does not cause recombination reaction with a wild-type FRT sequence, in the presence of FLP recombinase; and a method for performing high-efficiency, gene insertion or gene replacement.

Abstract: Provided is a semiconductor reliability evaluating apparatus for evaluating an electro-migration characteristic of a wiring layer which is capable of being formed simply and in a low cost using a reticle set, having a minimum number of reticles, which is capable of measuring an ordinary via plug resistance where the number of wiring layer is two. A first wiring layer and a second wiring layer are configured so that the first wiring layer is connected to the second wiring layer with a plurality of via plugs formed in an insulating layer which is placed between the first wiring layer and the second wiring layer, the first wiring layer and the second wiring layer are made of metals having almost same specific resistances, and each different parasitic resistances are put to at least one of the first wiring layer and the second wiring layer connected to each of the plurality of via plugs to make the total resistance value of the current path through each of the plurality of via plugs different.

Abstract: Recombinant adenoviruses comprising the following sequences in the genome: (1) a left inverted terminal repeat: (2) a packaging signal: (3) a recombinase recognition sequence located at a region in between said left inverted terminal repeat and said packaging signal: and (4) at least one more recombinase recognition sequence which is located downstream of said packaging signal and which is recognized by the recombinase that recognizes the above recombinase recognition sequence are useful as a material for constructing highly safe vectors for gene therapy in the field of gene therapy.

Abstract: The present invention provides a novel metal interconnection structure for evaluation on electromigration thereof, wherein a test metal interconnection to be evaluated on electromigration is connected through a plurality of bamboo-structured metal interconnections to a plug metal interconnection, and the bamboo-structured metal interconnection has a smaller sectioned area than the test metal interconnection while the plug metal interconnection has a larger sectioned area than the test metal interconnection.

Abstract: In a test system, a plurality of semiconductor devices (samples) to be tested are connected in parallel. Resistors and switches are connected to the respective semiconductor devices in series. A voltage source (power supply) supplies a constant voltage for the respective semiconductor devices. An ammeter measures current that flows through the respective semiconductor devices. A voltmeter measures the respective voltage drops of the resistors. A controller detects the specific resistor that is changed in a resistance value when the current measured by the ammeter is reduced, and turns off the switch connected to the specific resistor.

Abstract: A PID control device identifies rise characteristics of a controlled system by a step response method on changing a reference, moves to PID control when idle time and slope successively obtained at the rise reach a predetermined condition, and computes PID control parameters based on the idle time and slope obtained up to that point. If the identification is fully executed, the computed PID control parameters are immediately set. If it is not fully executed, the PID control device 1 further watches the state to compare a proportional gain of the newly computed PID control parameters with the proportional gain of previously set PID control parameters, and the currently computed PID control parameters are set when the parameters are on a safe side.

Abstract: An electronic blood pressure meter including a cuff, a pressurizing means for inflating the cuff, a pressure sensing device for sensing a fluid pressure within the cuff, a pulse wave detecting device for detecting a pulse wave component included in the cuff, a systolic pressure estimating device for estimating a systolic pressure value based on the pulse wave and the cuff pressure detected in a pressurizing process, a pressurization volume computing device for computing a pressurization volume based on the estimated the systolic pressure value, a pressure decreasing device for decreasing the cuff pressure after reaching the pressurization volume, a blood vessel information detecting device for detecting blood vessel information such as pulse wave components in the pressure decreasing process, a blood pressure value determining device for determining systolic and diastolic pressure values based on the blood vessel information and the cuff pressure, a pulse wave component dispersion degree detecting device for