Patents by Inventor Yumiko Hashidume

Yumiko Hashidume has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Semiconductor apparatus and test method therefor
    Patent number: 7793174
    Abstract: A SiP includes a logic chip and a memory chip. The memory chip includes a memory circuit to be tested, and the logic chip includes an internal logic circuit and a test processor electrically connected therewith. The test processor is connected with an access terminal of the memory circuit and supplies a test signal input from an external terminal to the access terminal to thereby test the memory circuit. The test processor includes a high-speed test control circuit to adjust signal delay and supplies a test signal from the external terminal to the access terminal through the high-speed test control circuit when performing high-speed test at an actual operation speed.
    Type: Grant
    Filed: March 16, 2007
    Date of Patent: September 7, 2010
    Assignee: NEC Electronics Corporation
    Inventors: Takashi Hattori, Yumiko Hashidume, Tatsuhiro Nishino, Kouji Ikeda
  • Semiconductor apparatus and test method therefor
    Publication number: 20070245200
    Abstract: A SiP includes a logic chip and a memory chip. The memory chip includes a memory circuit to be tested, and the logic chip includes an internal logic circuit and a test processor electrically connected therewith. The test processor is connected with an access terminal of the memory circuit and supplies a test signal input from an external terminal to the access terminal to thereby test the memory circuit. The test processor includes a high-speed test control circuit to adjust signal delay and supplies a test signal from the external terminal to the access terminal through the high-speed test control circuit when performing high-speed test at an actual operation speed.
    Type: Application
    Filed: March 16, 2007
    Publication date: October 18, 2007
    Applicant: NEC ELECTRONICS CORPORATION
    Inventors: Takashi Hattori, Yumiko Hashidume, Tatsuhiro Nishino, Kouji Ikeda