Patents by Inventor Yumiko Ohsaki

Yumiko Ohsaki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6620556
    Abstract: A mask for multiple exposure includes a plurality of periodic patterns in which a relation 0.5S<D<1.5S is satisfied, where S is the spacing between lines of a first periodic pattern of the plurality of periodic patterns and D is the spacing between the first periodic pattern and a second periodic pattern, of the plurality of periodic patterns, juxtaposed to the first periodic pattern with respect to the periodicity direction. The first periodic pattern and the second periodic pattern are free from overlapping or intersecting with each other.
    Type: Grant
    Filed: March 14, 2000
    Date of Patent: September 16, 2003
    Assignee: Canon Kabushiki Kaisha
    Inventor: Yumiko Ohsaki
  • Patent number: 6586168
    Abstract: A multiple exposure method using plural masks includes exposing a position where an image of a low-contrast pattern is to be formed on the basis of a mask, of the plural masks, having fine lines extending in different directions, with an image of a pattern of a mask having a phase difference of 180 degrees between adjacent patterns, whereby a contrast of an exposure amount distribution related to the pattern of the low contrast is increased, and making the exposure with the image of the pattern having the phase difference of 180 degrees while registering the boundaries of the pattern with the fine lines of the pattern, extending in different directions, where the fine lines or extensions thereof intersect with each other at a single point. The boundaries having a phase difference of 180 degrees serve to divide a pattern region into zones of an even number regardless of whether the number of the fine lines is even or odd, and the fine lines are reproduced on the basis of the boundaries.
    Type: Grant
    Filed: June 30, 2000
    Date of Patent: July 1, 2003
    Assignee: Canon Kabushiki Kaisha
    Inventor: Yumiko Ohsaki
  • Publication number: 20020176090
    Abstract: There is provided an interferometer for measuring a surface shape of an optical element using interference, including a reference wave-front deformation system for deforming a wave front of reference light.
    Type: Application
    Filed: April 5, 2002
    Publication date: November 28, 2002
    Inventors: Yumiko Ohsaki, Akiyoshi Suzuki, Kenji Saitoh
  • Patent number: 6351304
    Abstract: An exposure method for exposing a substrate through a multiple exposure process including a first exposure using a first pattern having fine line elements of different directions, and a second exposure using a second pattern including a periodic pattern, wherein a periodicity direction of the periodic pattern is registered with a direction along which fine line elements of a predetermined direction, of the different directions, are arrayed, while, at least in a portion of the periodic pattern, a pattern or a boundary between adjacent patterns as well as a portion of or the whole of the fine line elements of the particular direction are adapted to be printed at the same location, and wherein the second pattern is so structured that one or those of the fine line elements of the first pattern extending in a particular direction different from the predetermined direction are not superposed with the periodic pattern.
    Type: Grant
    Filed: June 1, 2000
    Date of Patent: February 26, 2002
    Assignee: Canon Kabushiki Kaisha
    Inventors: Miyoko Kawashima, Yumiko Ohsaki
  • Publication number: 20010040588
    Abstract: The invention is to obtain data under desired illumination with a limited memory capacity.
    Type: Application
    Filed: July 8, 1998
    Publication date: November 15, 2001
    Inventors: YOSHINOBU SHIRAIWA, TOSHIYUKI MIZUNO, YUMIKO OHSAKI