Abstract: There is provide a method for manufacturing analytical semiconductor samples by using an apparatus for manufacturing analytical semiconductor samples, which minimizes a feedback time by manufacturing a viewing surface that is environment-friendly and has a large area. The method comprising mounting the analytical semiconductor samples to a holder; discharging deionized (DI) water to an upper surface of a polishing plate through a DI water nozzle; grinding the analytical semiconductor samples with the upper surface of the polishing plat; determining whether a desired viewing surface of the analytical semiconductor samples has been acquired after the grinding of the analytical semiconductor samples; and transferring the analytical semiconductor samples to analyze the viewing surface of the ground analytical semiconductor samples based on a determination that the desired viewing surface of the analytical semiconductor samples has been acquired.

Abstract: A scan assisting fixing device and a scanner using the same are provided. The fixing device is for fixing an object to be scanned, which includes a scanning portion and a holding portion. The fixing device includes an accommodation region, a scan window and a protrusion portion. When the holding portion is loaded in the accommodation region, the scanning portion correspondingly disposed in the scan window is retained and fixed by the protrusion portion, and the position of the holding portion in the fixing device is constant, so that the scanning portion is always within the range of the field depth of the scanner regardless of the specification of the positive film holder, and the clarity of the scanned image is assured.

Abstract: A scan assisting fixing device and a scanner using the same are provided. The fixing device is for fixing an object to be scanned, which includes a scanning portion and a holding portion. The fixing device includes an accommodation region, a scan window and a protrusion portion. When the holding portion is loaded in the accommodation region, the scanning portion correspondingly disposed in the scan window is retained and fixed by the protrusion portion, and the position of the holding portion in the fixing device is constant, so that the scanning portion is always within the range of the field depth of the scanner regardless of the specification of the positive film holder, and the clarity of the scanned image is assured.

Abstract: A sheet-fed scanning device including a first scanning channel and a second scanning channel disposed in parallel, a first sensing element and a second sensing element is provided. The first sensing element corresponds to the first scanning channel for acquiring the image of a first type object. The first type object has a first surface which is adjacent to the first sensing element and within the range of the field depth of the first sensing element. The second sensing element corresponds to the second scanning channel for acquiring the image of a second type object. The second type object has a second surface adjacent to the second sensing element and a third surface dented to the second surface, wherein the third surface is within the range of the field depth of the second sensing element.