Patents by Inventor Yun-Cheol Kim

Yun-Cheol Kim has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20170306300
    Abstract: Antibodies that include a sulfatase motif-containing tag in a constant region of an immunoglobulin (Ig) light chain polypeptide are disclosed. The sulfatase motif can be converted by a formylglycine-generating enzyme (FGE) to produce a formylglycine (fGly)-modified Ig light chain polypeptide. An fGly-modified Ig light chain polypeptide of the antibody can be covalently and site-specifically bound to a moiety of interest to provide an antibody conjugate. The disclosure also encompasses methods of production of such tagged Ig light chain polypeptides, fGly-modified Ig light chain polypeptides, and antibody conjugates, as well as methods of use of same.
    Type: Application
    Filed: April 24, 2017
    Publication date: October 26, 2017
    Inventors: Yun Cheol Kim, Chao Bai Huang, David Rabuka
  • Patent number: 9329225
    Abstract: A testing device includes a signal sensing unit and a signal processing unit. The signal sensing unit generates a test output signal by sensing a signal from a device under test including a plurality of passive elements that are connected in parallel. The signal processing unit detects an open-type fault of the plurality of passive elements by measuring an impedance of the device under test based on element characteristic information of the plurality of passive elements.
    Type: Grant
    Filed: December 2, 2011
    Date of Patent: May 3, 2016
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Yun-Cheol Kim, Chang-Ho Lee, Jin-Ho Choi, Min-Woo Kim
  • Publication number: 20120150459
    Abstract: A testing device includes a signal sensing unit and a signal processing unit. The signal sensing unit generates a test output signal by sensing a signal from a device under test including a plurality of passive elements that are connected in parallel. The signal processing unit detects an open-type fault of the plurality of passive elements by measuring an impedance of the device under test based on element characteristic information of the plurality of passive elements.
    Type: Application
    Filed: December 2, 2011
    Publication date: June 14, 2012
    Applicant: Samsung Electronics Co., Ltd.
    Inventors: Yun-Cheol Kim, Chang-Ho Lee, Jin-Ho Choi, Min-Woo Kim