Abstract: A cleaning apparatus including a vacuum cleaner and a docking station is provided. The cleaning apparatus includes a vacuum cleaner including a dust collecting chamber in which foreign substances are collected, and a docking station configured to be connected to the dust collecting chamber to remove the foreign substances collected in the dust collecting chamber. The dust collecting chamber is configured to collect foreign substances through centrifugation, and configured to be docked to the docking station, and the docking station includes a suction device configured to suction the foreign substances and air in the dust collecting chamber docked to the docking station.

Abstract: A system on chip (SoC) adjusts power of a memory through a handshake. The SoC includes a memory controller and a power manager. The memory controller is configured to control a memory. The power manager is configured to manage a supply power level of the memory. The memory controller is configured to output, to the power manager, a memory access level indicating a frequency of accesses to the memory. The power manager is configured to adjust the supply power level of the memory according to the memory access level.

Abstract: A system on chip (SoC) adjusts power of a memory through a handshake. The SoC includes a memory controller and a power manager. The memory controller is configured to control a memory. The power manager is configured to manage a supply power level of the memory. The memory controller is configured to output, to the power manager, a memory access level indicating a frequency of accesses to the memory. The power manager is configured to adjust the supply power level of the memory according to the memory access level.

Abstract: A semiconductor device and a method of testing the same are provided. A semiconductor device includes a Design Under Test (DUT), a processing core configured to execute test software to determine an optimum operating voltage of the DUT, and a protection circuit configured to block the transmission of undefined signals generated by the DUT while the processing core executes the test software.

Abstract: A system on chip (SoC) adjusts power of a memory through a handshake. The SoC includes a memory controller and a power manager. The memory controller is configured to control a memory. The power manager is configured to manage a supply power level of the memory. The memory controller is configured to output, to the power manager, a memory access level indicating a frequency of accesses to the memory. The power manager is configured to adjust the supply power level of the memory according to the memory access level.

Abstract: A system on chip (SoC) adjusts power of a memory through a handshake. The SoC includes a memory controller and a power manager. The memory controller is configured to control a memory. The power manager is configured to manage a supply power level of the memory. The memory controller is configured to output, to the power manager, a memory access level indicating a frequency of accesses to the memory. The power manager is configured to adjust the supply power level of the memory according to the memory access level.

Abstract: A semiconductor device and a method of testing the same are provided. A semiconductor device includes a Design Under Test (DUT), a processing core configured to execute test software to determine an optimum operating voltage of the DUT, and a protection circuit configured to block the transmission of undefined signals generated by the DUT while the processing core executes the test software.

Abstract: A semiconductor device and a method of testing the same are provided. A semiconductor device includes a Design Under Test (DUT), a processing core configured to execute test software to determine an optimum operating voltage of the DUT, and a protection circuit configured to block the transmission of undefined signals generated by the DUT while the processing core executes the test software.

Abstract: In one embodiment, the integrated circuit includes a clock generator configured to selectively generate a first clock; a processor configured to perform operations; and a clock management circuit. The clock management circuit is configured to receive clock management information from the processor and selectively generate a second clock based on the clock management information and the first clock. The processor is configured to perform some operations based on the second clock.

Abstract: A bus system is provided. A bus system includes a slave functional block and a master functional block. The master functional block transmits a first command to the slave functional block. The slave functional block includes a first bus protector. The first bus protector receives the first command on behalf of the slave functional block and transmits a dummy signal corresponding to the first command to the master functional block in response to the slave functional block being in a state of not being able to receive the first command or not being able to transmit a response signal corresponding to the first command.

Abstract: A system on chip (SoC) adjusts power of a memory through a handshake. The SoC includes a memory controller and a power manager. The memory controller is configured to control a memory. The power manager is configured to manage a supply power level of the memory. The memory controller is configured to output, to the power manager, a memory access level indicating a frequency of accesses to the memory. The power manager is configured to adjust the supply power level of the memory according to the memory access level.

Abstract: Provided are a semiconductor device and a semiconductor system. A semiconductor device includes a hardware auto clock gating (HWACG) logic configured to provide clock gating of an intellectual property (IP) block; and a memory power controller configured to perform power gating of a memory electrically connected with the IP block, based on the HWACG logic providing the clock gating for the IP block. The HWACG logic includes a first clock source configured to provide a first clock signal; a second clock source configured to receive the first clock signal provided by the first clock source, and provide a second clock signal to the IP block; a first clock control circuit configured to control the first clock source; and a second clock control circuit configured to transmit a clock request to the first clock control circuit, and control the second clock source, based on an operation state of the IP block.

Abstract: A system on chip (SoC) adjusts power of a memory through a handshake. The SoC includes a memory controller and a power manager. The memory controller is configured to control a memory. The power manager is configured to manage a supply power level of the memory. The memory controller is configured to output, to the power manager, a memory access level indicating a frequency of accesses to the memory. The power manager is configured to adjust the supply power level of the memory according to the memory access level.

Abstract: Provided are a semiconductor device and a semiconductor system. A semiconductor device includes a hardware auto clock gating (HWACG) logic configured to provide clock gating of an intellectual property (IP) block; and a memory power controller configured to perform power gating of a memory electrically connected with the IP block, based on the HWACG logic providing the clock gating for the IP block. The HWACG logic includes a first clock source configured to provide a first clock signal; a second clock source configured to receive the first clock signal provided by the first clock source, and provide a second clock signal to the IP block; a first clock control circuit configured to control the first clock source; and a second clock control circuit configured to transmit a clock request to the first clock control circuit, and control the second clock source, based on an operation state of the IP block.

Abstract: A bus system is provided. A bus system includes a slave functional block and a master functional block. The master functional block transmits a first command to the slave functional block. The slave functional block includes a first bus protector. The first bus protector receives the first command on behalf of the slave functional block and transmits a dummy signal corresponding to the first command to the master functional block in response to the slave functional block being in a state of not being able to receive the first command or not being able to transmit a response signal corresponding to the first command.

Abstract: A semiconductor device and a method of testing the same are provided. A semiconductor device includes a Design Under Test (DUT), a processing core configured to execute test software to determine an optimum operating voltage of the DUT, and a protection circuit configured to block the transmission of undefined signals generated by the DUT while the processing core executes the test software.

Abstract: A system on chip (SoC) adjusts power of a memory through a handshake. The SoC includes a memory controller and a power manager. The memory controller is configured to control a memory. The power manager is configured to manage a supply power level of the memory. The memory controller is configured to output, to the power manager, a memory access level indicating a frequency of accesses to the memory. The power manager is configured to adjust the supply power level of the memory according to the memory access level.

Abstract: Disclosed are a novel strain with antibacterial activity, identified as Streptomyces sp. AN1542 strain (Accession No.: KCTC 12113BP), an antibacterial composition comprising a compound represented by Chemical Formula 1 or 2, or a strain producing the same as an active ingredient, and a method for producing the same. Exhibiting potent antibacterial activity against pathogenic microbes and antibiotic-resistant microbes, particularly, MRSA, QRSA, VRSA and VRE, the compound or the strain of the present invention can be applied to the treatment of infectious diseases caused by superbacteria.

Abstract: In one embodiment, the integrated circuit includes a clock generator configured to selectively generate a first clock; a processor configured to perform operations; and a clock management circuit. The clock management circuit is configured to receive clock management information from the processor and selectively generate a second clock based on the clock management information and the first clock. The processor is configured to perform some operations based on the second clock.

Abstract: A method and an apparatus for supporting a self-destruction function in a baseband modem are provided. Aspects of the present disclosure are to address at least the above-mentioned problems and/or disadvantages and to provide at least the advantages described below. Accordingly, an aspect of the present disclosure is to provide a self-destruction method and apparatus in which a self-impossible state is autonomously entered if the baseband modem of a receiving terminal which supports mobile communication is necessary. Another aspect of the present disclosure is to provide a method and apparatus for deleting information stored in memory when a command is received over a mobile communication network in which a baseband modem has been constructed and then entering a self-impossible state so that the terminal is not recovered although it is booted up again.