Patents by Inventor Yun Mook Lim

Yun Mook Lim has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Device for measuring deformation of a structure and a method for measuring deformation of a structure using the same
    Patent number: 8671769
    Abstract: The present invention is directed to a device for measuring a deformation ratio of a structure which includes a photonic crystal layer containing nanoparticles aligned at a certain interval. The device is useful for detecting when various industrial structures are deformed by a working load. The presence of deformation and the deformation ratio in the structures may be simply and easily measured by measuring the change of structural color or magnetic flux in the device. The device may be useful to prevent accidents due to excessive deformation in structures.
    Type: Grant
    Filed: March 2, 2010
    Date of Patent: March 18, 2014
    Assignees: Industry Academic Cooperation Foundation, Technovalue Co., Ltd.
    Inventors: Seung Joo Haam, Yun Mook Lim, Yoon Cheol Lim, JoSeph Park
  • Device for Measuring Deformation of a Structure and a Method for Measuring Deformation of a Structure Using the Same
    Publication number: 20120152030
    Abstract: The present invention relates to a device for measuring a deformation ratio of a structure and a method of measuring a deformation ratio of a structure using the same. More specifically, the device for measuring a deformation ratio of a structure according to the present invention comprises a photonic crystal layer containing nanoparticles aligned at a certain interval. According to the present invention, when various industrial structures are deformed by a working load, and the like, presence of deformation and the correct deformation ratio in the structures may be simply and easily measured by measuring the change of structural color or magnetic flux in the corresponding part, and this measurement of deformation may also prevent accidents due to excessive deformation in structures.
    Type: Application
    Filed: March 2, 2010
    Publication date: June 21, 2012
    Applicants: TECHNOVALUE CO., LTD., INDUSTRY-ACADEMIC COOPERATION FOUNDATION, YONSEI UNIVERSITY
    Inventors: Seung Joo Haam, Yun Mook Lim, Yoon Cheol Lim, JoSeph Park