Patents by Inventor Yun Soon Park

Yun Soon Park has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12000825
    Abstract: The present disclosure relates to a method of selecting stem cells having the ability to produce extracellular vesicles with high efficiency, the method including the step of measuring the activity of protease-activated receptor (PAR)-mediated signaling pathways, stem cells selected by the method, and a method of screening an inducer for the production of extracellular vesicles. According to the present disclosure, upon treatment of stem cells with thrombin, the production of extracellular vesicles in the stem cells and the levels of proteins in the extracellular vesicles are significantly increased via PAR-mediated signaling pathways, and thus stem cells having the ability to produce extracellular vesicles with high efficiency can be efficiently selected by treating stem cells with thrombin and measuring an activation level of a PAR-mediated signaling pathway, and stem cells selected by this method can be effectively used in related research and clinical fields.
    Type: Grant
    Filed: April 28, 2020
    Date of Patent: June 4, 2024
    Assignee: SAMSUNG LIFE PUBLIC WELFARE FOUNDATION
    Inventors: Yun Sil Chang, Won Soon Park, Dong Kyung Sung
  • Patent number: 6133727
    Abstract: A method for verifying correct operation and functional stability of a tester for semiconductor devices is disclosed. In addition, a method for creating a standard device for use with the tester is also disclosed. In creating a standard device according to the present invention, the tester repeatedly tests a candidate device a predefined number of times and evaluates the test results to determine whether the candidate device is suitable for use as a standard device. In verifying the operation and functional stability of a semiconductor device tester, data generated by repeatedly testing a standard device a predefined number of times are compared to recorded reference data of previous tests of the standard device.
    Type: Grant
    Filed: January 5, 1999
    Date of Patent: October 17, 2000
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Byoung Ok Chun, Byung Rae Cho, Sang Hon Lee, Yun Soon Park