Patents by Inventor Yun Xi

Yun Xi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and system for intelligent failure diagnosis center for burn-in devices under test
    Patent number: 11599437
    Abstract: A mechanism is provided for automatically detecting, diagnosing, transporting, and repairing devices having failed during burn-in testing. Embodiments provide a system that monitors devices undergoing burn-in testing and detecting when a device or a component within a device fails the burn-in test. Embodiments can then alert burn-in-rack monitor personnel of the device failure. Embodiments can concurrently determine the nature of the failure applying a machine learning-based prediction model against log files associated with the failed device. The diagnosis along with a recommended repair strategy can be provided to the repair center as an aid in accelerating the repair process. In addition, the diagnosis can be used to order parts for the repair from a parts depot. In this manner, embodiments can reduce the time for detection, diagnosis, and repair of the failed device.
    Type: Grant
    Filed: February 22, 2021
    Date of Patent: March 7, 2023
    Assignee: Dell Products L.P.
    Inventors: Yun Xi, Yu Huang Lin, Meng Meng Jiang, Wen Sen Que, Hua Shan Liang, Mu Shou Lan, Zhi Jian Weng, Lang Lin
  • Method and System for Intelligent Failure Diagnosis Center for Burn-In Devices Under Test
    Publication number: 20210382801
    Abstract: A mechanism is provided for automatically detecting, diagnosing, transporting, and repairing devices having failed during burn-in testing. Embodiments provide a system that monitors devices undergoing burn-in testing and detecting when a device or a component within a device fails the burn-in test. Embodiments can then alert burn-in-rack monitor personnel of the device failure. Embodiments can concurrently determine the nature of the failure applying a machine learning-based prediction model against log files associated with the failed device. The diagnosis along with a recommended repair strategy can be provided to the repair center as an aid in accelerating the repair process. In addition, the diagnosis can be used to order parts for the repair from a parts depot. In this manner, embodiments can reduce the time for detection, diagnosis, and repair of the failed device.
    Type: Application
    Filed: February 22, 2021
    Publication date: December 9, 2021
    Applicant: Dell Products L.P.
    Inventors: Yun Xi, Yu huang Lin, Meng Meng Jiang, Wen Sen Que, Hua Shan Liang, Mu Shou Lan, Zhi Jian Weng, Lang Lin
  • Nucleoside thiophosphoramidites
    Patent number: 5218103
    Abstract: The present invention relates to new and useful nucleside thiophosphoramidite, polynucleotide dithioate phosphoramidite and polynucleotide phosphorothioamidate phosphoramidite compounds as well as the process whereby these compounds can be used for synthesizing new monoucleotides and polynucleotides having phosphorodithioate, phosphorothioamidate, phosphorothiotriesters and phosphorothioate internucleotide linkages.
    Type: Grant
    Filed: January 22, 1991
    Date of Patent: June 8, 1993
    Assignee: University Patents, Inc.
    Inventors: Marvin H. Caruthers, Yun-Xi Ma, Eric K. Yau, John Nielsen, Wolfgang Brill