Abstract: An integrated design-for-manufacturing (DFM) platform is provided. The integrated DFM platform an automatic warning and verification system; an automatic data feedback and feed forward system; an automatic intellectual property (IP) library management system; and a data management system integrated under a same platform.

Abstract: A method of yield management for semiconductor manufacture and an apparatus thereof are provided. The method includes the following steps. Defect data of a layer of a semiconductor wafer is obtained, wherein the defect data includes sizes and locations of defects with respect to the layer. A layout with respect to the layer is obtained. And a critical area analysis is performed in parallel for the layer by a plurality of processing devices according to the defect data and the layout to determine locations of defects falling into a critical area of the layer among the locations of the defects.

Abstract: A method of yield management for semiconductor manufacture and an apparatus thereof are provided. The method includes the following steps. Defect data of a layer of a semiconductor wafer is obtained, wherein the defect data includes sizes and locations of defects with respect to the layer. A layout with respect to the layer is obtained. And a critical area analysis is performed in parallel for the layer by a plurality of processing devices according to the defect data and the layout to determine locations of defects falling into a critical area of the layer among the locations of the defects.

Abstract: An integrated design-for-manufacturing (DFM) platform is provided. The integrated DFM platform an automatic warning and verification system; an automatic data feedback and feed forward system; an automatic intellectual property (IP) library management system; and a data management system integrated under a same platform.

Abstract: The present invention discloses a the present invention discloses an integrated program development environment (IDE) for carrying out concurrent program development tasks on a local station for programs executable on a multiple-tier networked client-server system with multiple tiers of client-server stations. The development environment includes a development-environment emulator for emulating program execution environments in each of the multiple tiers of networked client-server stations. The integrated program development environment further includes a communication emulator for emulating networked communications carried out between the multiple tiers of networked stations performed in executing the programs executable on the multiple tiers of networked client-server system.

Abstract: An extension to the JVM is described by which the efficiency with which applications are developed and transmitted between platforms is vastly improved. The present invention imposes a new object model on the Java object model provided intrinsically by the Java programming language. The object model of the present invention separates attribute data from an object which would otherwise be encapsulated therein. This data represents the external interface of a particular instance of the object class. The internal interface of the object class, i.e., the behavior common to all instances of a particular object type, is stored separately in an object type information file.

Abstract: A data structure and method are disclosed for transferring object attributes between platforms in a distributed computing environment. The method includes creating an application description file. The application description file includes a type ID and an object name. The type ID references a type information file. The application file includes an attribute data block and the attribute data block contains data for attributes that are included in the object. The attribute description file is transferred to a platform that includes the type information file and the type information file includes a memory offset map that determines a sequence of attribute data storage in the attribute data block. Thus, the object attributes are received by the platform and the type information file provides a memory offset map for individual attributes in the attribute description file.