Abstract: There is provided a method of forming a porous particle comprising an electrically conductive continuous shell encapsulating a core, said core comprising an elemental compound that reversibly reduces in the presence of a cation and oxidizes in the absence of said cation, said method comprising the steps of: a) encapsulating an elemental compound precursor with said electrically conductive shell; b) reacting said elemental compound precursor with an oxidation agent to oxidise said elemental compound precursor to form said elemental compound, thereby forming said electrically conductive shell encapsulating said core comprising said elemental compound.

Abstract: This invention relates to an electrochemical cell comprising an anode structure comprising an element selected from the group consisting of group 1, group 2, group 8, group 12 and group 13 of the Periodic Table of Elements; a cathode structure comprising a catalyst; and a hydrogel located between the anode structure and the cathode structure. In a preferred embodiment, the cell comprises the anode of Zinc, the catalyst of CoOx/C, the hydrogel of free-standing alkaline polyacrylamide hydrogel, wherein said hydrogel was first synthesized via UV-initiated radical polymerization of acrylamides, followed by exchange of water with an alkaline electrolyte of potassium hydroxide (KOH). The invention further relates to a method of manufacturing such an electrochemical cell and the use of a hydrogel in a metal/air battery.

Abstract: A Rechargeable Metal-Air Battery Cell, a Battery Stack and Method of Manufacturing the Same A rechargeable metal-air battery cell, a battery stack and method of manufacturing the same are provided. The rechargeable metal-air battery cell includes a bipolar plate, an air cathode, a plenum frame and a metal anode. The bipolar plate defines a plurality of air channels. The air cathode abuts the bipolar plate such that the air cathode is in fluid communication with the air channels. The plenum frame includes a first major surface and a second major surface opposite the first major surface. The air cathode is adjacent the first major surface, and the metal anode is adjacent the second major surface of the plenum frame. The battery stack may include at least one rechargeable metal-air battery cell.

Abstract: The present invention provides a coating composition comprising a) a metal complex comprising an organic acid or anion thereof coordinated to a metal ion; and b) a polymer, wherein there is no covalent bond between said metal complex and the polymer.

Abstract: There is provided a method of forming a porous particle comprising an electrically conductive continuous shell encapsulating a core, said core comprising an elemental compound that reversibly reduces in the presence of a cation and oxidizes in the absence of said cation, said method comprising the steps of: a) encapsulating an elemental compound precursor with said electrically conductive shell; b) reacting said elemental compound precursor with an oxidation agent to oxidise said elemental compound precursor to form said elemental compound, thereby forming said electrically conductive shell encapsulating said core comprising said elemental compound.

Abstract: There is provided a method of forming a porous particle comprising an electrically conductive continuous shell encapsulating a core, said core comprising an elemental compound that reversibly reduces in the presence of a cation and oxidizes in the absence of said cation, said method comprising the steps of: a) encapsulating an elemental compound precursor with said electrically conductive shell; b) reacting said elemental compound precursor with an oxidation agent to oxidize said elemental compound precursor to form said elemental compound, thereby forming said electrically conductive shell encapsulating said core comprising said elemental compound.

Abstract: A Rechargeable Metal-Air Battery Cell, a Battery Stack and Method of Manufacturing the Same A rechargeable metal-air battery cell, a battery stack and method of manufacturing the same are provided. The rechargeable metal-air battery cell includes a bipolar plate, an air cathode, a plenum frame and a metal anode. The bipolar plate defines a plurality of air channels. The air cathode abuts the bipolar plate such that the air cathode is in fluid communication with the air channels. The plenum frame includes a first major surface and a second major surface opposite the first major surface. The air cathode is adjacent the first major surface, and the metal anode is adjacent the second major surface of the plenum frame. The battery stack may include at least one rechargeable metal-air battery cell.

Abstract: The present invention provides a coating composition comprising a) a metal complex comprising an organic acid or anion thereof coordinated to a metal ion; and b) a polymer, wherein there is no covalent bond between said metal complex and the polymer.

Abstract: There is provided a method of forming a porous particle comprising an electrically conductive continuous shell encapsulating a core, said core comprising an elemental compound that reversibly reduces in the presence of a cation and oxidizes in the absence of said cation, said method comprising the steps of: a) encapsulating an elemental compound precursor with said electrically conductive shell; b) reacting said elemental compound precursor with an oxidation agent to oxidise said elemental compound precursor to form said elemental compound, thereby forming said electrically conductive shell encapsulating said core comprising said elemental compound.

Abstract: The present disclosure relates to a catalyst for a metal air battery or fuel cell comprising a mixed metal oxide consisting of at least one lanthanide element and at least two different transition metal elements. The catalyst may further comprise a conducting additive. The present disclosure further provides an air electrode, metal air battery or fuel cell comprising the disclosed catalyst, and methods for forming the disclosed catalyst.

Abstract: A fault detection method of semiconductor manufacturing processes is disclosed. The method includes the steps of providing a storage device, collecting a fault detection and classification(FDC) parameter by the storage device, setting up a measurement site for measuring an online measurement parameter, collecting a wafer acceptance test(WAT) in correspondence to the FDC parameter, establishing a first relationship equation between the FDC parameter and the online measurement parameter, establishing a second relationship equation of the online measurement parameter and the WAT by using the first relationship equation, establishing a third relationship equation between the FDC parameter and the WAT, establishing a waning region of the manufacturing processes by using the first, second, and third relationship equations, and determining the situation of generating wafer defects according to the warning region. The present invention discloses a system architecture for the method.

Abstract: A method of detecting variance by regression model has the following steps. Step 1 is preparing the FDC data and WAT data for analysis. Step 2 is figuring out what latent variable effect of WAT data by Factor Analysis Step 3 is utilizing Principal Component Analysis to reduce the number of FDC variables to a few independent principal components. Step 4 is demonstrating how the tools and FDC data affect WAT data by Analysis of covariance model, and constructing interrelationship among FDC, WAT and tools. The interrelationship can point out which parameter effect WAT significantly. By the method, when WAT abnormal situation happened, it is easier for engineers to trace where the problem is.

Abstract: The instant disclosure relates to a raw data compression method for the fabrication process. The method includes the steps of: inputting into a signal converter a collection of raw data points representing operational parameter of a semiconductor equipment within a predetermined time period; obtaining an approximation of the raw data points with a Fourier series; computing the Fourier coefficients and the residuals between the raw data points and the corresponding predicted values predicted by the Fourier series; determining if the residuals exceed an error threshold; recording and storing the Fourier coefficients as the compressed data if none of the residuals exceeds the error threshold; and recording the raw data point as abnormal data point if the corresponding residual exceeds the error threshold before recording and storing the Fourier coefficients and the abnormal data point as the compressed data.

Abstract: The instant disclosure relates to a raw data compression method for the fabrication process. The method includes the steps of: inputting into a signal converter a collection of raw data points representing operational parameter of a semiconductor equipment within a predetermined time period; obtaining an approximation of the raw data points with a Fourier series; computing the Fourier coefficients and the residuals between the raw data points and the corresponding predicted values predicted by the Fourier series; determining if the residuals exceed an error threshold; recording and storing the Fourier coefficients as the compressed data if none of the residuals exceeds the error threshold; and recording the raw data point as abnormal data point if the corresponding residual exceeds the error threshold before recording and storing the Fourier coefficients and the abnormal data point as the compressed data.

Abstract: A fault detection method of semiconductor manufacturing processes is disclosed. The method includes the steps of providing a storage device, collecting a fault detection and classification(FDC) parameter by the storage device, setting up a measurement site for measuring an online measurement parameter, collecting a wafer acceptance test(WAT) in correspondence to the FDC parameter, establishing a first relationship equation between the FDC parameter and the online measurement parameter, establishing a second relationship equation of the online measurement parameter and the WAT by using the first relationship equation, establishing a third relationship equation between the FDC parameter and the WAT, establishing a waning region of the manufacturing processes by using the first, second, and third relationship equations, and determining the situation of generating wafer defects according to the warning region. The present invention discloses a system architecture for the method.

Abstract: A specification establishing method for controlling semiconductor process, the steps includes: sampling a plurality of sample groups from a population, each sample group being a non-normal distribution; filtering the sample groups; summarizing the filtered sample groups to form a non-normal distribution diagram; getting a value-at-risk and a median by calculating from the non-normal distribution diagram; getting a critical value by calculating the value-at-risk and the median with a critical formula; getting a plurality of state values by calculating the filtered sample groups with a proportion formula; and getting an index value by calculating the non-normal distribution diagram with the proportion formula. Thus, the state values indicate the states of the sample groups are abnormal or not by comparing the state values to the index value.

Abstract: There is disclosed a method and system for detecting a surface plasmon resonance associated with a fluid sample. The method includes the step of providing a piezoelectric substrate having at least two electrodes thereon, wherein at least one of said electrodes is coupled to a fluid sample. A light beam is transmitted toward the fluid sample to induce a oscillation frequency in the piezoelectric substrate. The oscillation frequency from said electrodes is then measured during transmittance of the light to detect the surface plasmon resonance associated with the fluid sample.

Abstract: A method for assessing data worth for analyzing yield rate includes: getting measured data with data points that corresponds to control variables of semiconductor manufacturing; transforming the data points into a distance matrix with matrix distances corresponding to differences of the data points under the control variables; expressing sample differences recorded in the distance matrix by two-dimension vectors and calculating similarity degrees of the two-dimension vectors and the distance matrix so as to take loss information as a conversion error value; calculating discriminant ability of the transformed two-dimension data and expressing the discriminant ability by an error rate of discriminant; and taking the conversion error value and the error rate of discriminant as penalty terms and calculating a quality score corresponding to the measured data.

Abstract: A method of adjusting wafer process sequence includes steps of collecting production parameters for a plurality of lots; selecting a plurality of key parameters from the production parameters, wherein the key parameters at least includes a processing sequence; defining a formula to obtain an epsilon value; categorizing the lots into groups according to the epsilon value and the minimum point number by using density-based spatial clustering of application with noise (DBSCAN); and adjusting the processing sequences of the lots in the groups. Thereby, the lots with the same process recipe can be continuously or simultaneously sent into a machine, thereby reducing replacement of process recipes or shortening machine idle time.

Abstract: A method for evaluating efficacy of prevention maintenance for a tool includes the steps of: choosing a tool which has been maintained preventively and choosing a productive parameter of the tool; collecting values of the productive parameter generated from the tool during a time range for building a varying curve of the productive parameter versus time, modifying the varying curve with a moving average method; transforming the varying curve into a Cumulative Sum chart; and judging whether the values of the productive parameter generated from the tool after the prevention maintenance are more stable, compared with the values of the productive parameter generated from the tool before the prevention maintenance, according to the Cumulative Sum chart. Thereby, if the varying of the values of the productive parameter after the prevention maintenance isn't stable, then the efficacy of this prevention maintenance for the tool is judged not good.