Patents by Inventor Yung-Chien Lee

Yung-Chien Lee has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Programmable Memory Cell Using an Internal Parasitic Diode for Programming the Programmable Memory Cell
    Publication number: 20200251171
    Abstract: A circuit to program a programmable memory cell, such as an OTP (One-Time-Programmable) memory cell, by using by using an additional conductive path from a bit line (or a source line) to a source line (or a bit line) of the OTP (One-Time-Programmable) memory cell via an internal parasitic diode for programming the OTP memory cell.
    Type: Application
    Filed: May 28, 2019
    Publication date: August 6, 2020
    Inventors: SHIH-HSIU CHEN, WEI-FAN WU, HSUAN-CHI SU, WEI HUAN CHEN, CHING-HSIANG LIN, YUNG-CHIEN LEE, SHUI-SHOU WANG, WEN-HUA YU
  • Programmable Memory Cell with a Feedback Signal for Programming the Programmable Memory Cell
    Publication number: 20200251166
    Abstract: A circuit to program a programmable memory cell, such as an OTP (One-Time-Programmable) memory cell, by using a current source to output a current to a bit-line of the OTP memory cell, wherein the amount of the current outputted from the current source can be adjusted according to a feedback signal from the OTP memory cell.
    Type: Application
    Filed: April 19, 2019
    Publication date: August 6, 2020
    Inventors: SHIH-HSIU CHEN, WEI-FAN WU, HSUAN-CHI SU, WEI HUAN CHEN, CHING-HSIANG LIN, YUNG-CHIEN LEE, SHUI-SHOU WANG, WEN-HUA YU
  • Automated test method
    Patent number: 7020571
    Abstract: An automated test method for performing a hi-pot test procedure for an electrical device through the use of a test program installed in a factory information system (FIS) and a test instrument connected to the FIS. The test program sends a control command to the test instrument that in turn executes the hi-pot test for the electrical device. Test results are obtained by the test program from the test instrument and sent to the FIS. The test results are stored in the FIS for future reference.
    Type: Grant
    Filed: November 25, 2003
    Date of Patent: March 28, 2006
    Assignee: Inventec Corporation
    Inventor: Yung-Chien Lee
  • Automated test method
    Publication number: 20040179413
    Abstract: An automated test method for performing a hi-pot test procedure for an electrical device through the use of a test program installed in a factory information system (FIS) and a test instrument connected to the FIS. The test program sends a control command to the test instrument that in turn executes the hi-pot test for the electrical device. Test results are obtained by the test program from the test instrument and sent to the FIS. The test results are stored in the FIS for future reference.
    Type: Application
    Filed: November 25, 2003
    Publication date: September 16, 2004
    Inventor: Yung-Chien Lee