Patents by Inventor Yung-Mao Hsu

Yung-Mao Hsu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7354555
    Abstract: A system for controlling the flow of gases into a reaction chamber used in processing semiconductor devices includes a safety interlock feature that prevents inadvertent mixing of incompatible, reactive gases. The interlock feature is implemented in an interlock control circuit which operates a valve system for individually controlling the flow of separate gases into the chamber. The interlock circuit includes a series of relay switches and timers arranged to create a time delay between the initiation of flow of gases from separate sources into the chamber.
    Type: Grant
    Filed: May 8, 2002
    Date of Patent: April 8, 2008
    Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
    Inventors: Chih-Pen Yen, Jeng-Yann Tsay, Jeng-Chiang Chuang, Cheng-Fang Lin, Yung-Mao Hsu
  • Patent number: 6815653
    Abstract: A method and apparatus for detecting material accretion and peeling in a system such as a plasma process chamber, including multiple optical sensors which are provided in the chamber above a gas distribution plate or other surface inside the chamber. The optical sensors are connected to a central process controller that is capable of terminating operation of the chamber and may be equipped with an alarm. In the event that the optical sensors detect asymmetries in brightness or light reflection among various portions or regions of the gas distribution plate or other surface, which asymmetries may indicate the formation of a material coating on the plate or dislodging of contaminant particles from the plate, a signal is sent to the process controller, which may be adapted to terminate the plasma process, alert operating personnel, or both.
    Type: Grant
    Filed: April 15, 2002
    Date of Patent: November 9, 2004
    Assignee: Taiwan Semiconductor Manufacturing Co., Ltd
    Inventors: Jenq-Yann Tsay, Jeng-Chiang Chuang, Chih-Pen Yen, Yung-Mao Hsu
  • Publication number: 20030211015
    Abstract: A system for controlling the flow of gases into a reaction chamber used in processing semiconductor devices includes a safety interlock feature that prevents inadvertent mixing of incompatible, reactive gases. The interlock feature is implemented in an interlock control circuit which operates a valve system for individually controlling the flow of separate gases into the chamber. The interlock circuit includes a series of relay switches and timers arranged to create a time delay between the initiation of flow of gases from separate sources into the chamber.
    Type: Application
    Filed: May 8, 2002
    Publication date: November 13, 2003
    Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
    Inventors: Chih-Pen Yen, Jeng-Yann Tsay, Jeng-Chiang Chuang, Cheng-Fang Lin, Yung-Mao Hsu
  • Publication number: 20030200808
    Abstract: Detecting blade vibration via ultrasonic waves is disclosed. The blade may be part of a robot that is used in conjunction with semiconductor device fabrication. A process chamber is provided that has a sidewall and a base defining a cavity contained therein. A rotatable blade is mounted at a center of the cavity that has a base portion and a tip portion extensible from the center to the sidewall of the process chamber. One or more ultrasonic sensors are mounted on the base adjacent to the sidewall. Ultrasonic waves are sent and received toward and reflected by the tip portion of the wafer blade to determine the tip portion's position. In this way, vibrational movement of the blade can be detected.
    Type: Application
    Filed: April 26, 2002
    Publication date: October 30, 2003
    Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
    Inventors: Chein-Fang Lin, Jeng-Yann Tsay, Chih-Pen Yen, Yung-Mao Hsu
  • Publication number: 20030198542
    Abstract: A cassette pod stage that is equipped with locked guide pins is described. The cassette pod stage of the present invention is provided with at least one aperture therethrough for engaging at least one guide pin. The guide pin is provided with a top portion, a bottom portion and a skirt portion in-between the top portion and the bottom portion for use as a stop during installation of the guide pin through an aperture in the cassette pod stage. The bottom portion of the guide pin is provided with a threaded portion for engaging a locking nut after the guide pin is installed with the threaded portion extending beyond the bottom surface of the cassette pod stage for such engagement.
    Type: Application
    Filed: April 22, 2002
    Publication date: October 23, 2003
    Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
    Inventors: Chih-Pen Yen, Jenq-Yann Tsay, Ta-Chin Lee, Jeng-Chiang Chuang, Yung-Mao Hsu
  • Publication number: 20030193010
    Abstract: A method and apparatus for detecting material accretion and peeling in a system such as a plasma process chamber, including multiple optical sensors which are provided in the chamber above a gas distribution plate or other surface inside the chamber. The optical sensors are connected to a central process controller that is capable of terminating operation of the chamber and may be equipped with an alarm. In the event that the optical sensors detect asymmetries in brightness or light reflection among various portions or regions of the gas distribution plate or other surface, which asymmetries may indicate the formation of a material coating on the plate or dislodging of contaminant particles from the plate, a signal is sent to the process controller, which may be adapted to terminate the plasma process, alert operating personnel, or both.
    Type: Application
    Filed: April 15, 2002
    Publication date: October 16, 2003
    Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
    Inventors: Jenq-Yann Tsay, Jeng-Chiang Chuang, Chih-Pen Yen, Yung-Mao Hsu
  • Patent number: 5851343
    Abstract: The present invention provides a protective shield for a plasma etcher. The protective shield 40 protects the chamber wall 30 around the etch detect window from plasma etching and electrical arcing. The invention comprises a plasma etcher 10 has a wall 30 surrounding a chamber 14. The wall has an opening 16. The wall 30 having an inside face 30A and an outside face 30B. An opening edge 30C defines the opening 16. A window 24 covers over the opening 16 and over a portion of the outside face 30B of the wall. The protective shield 40 covers the opening edge 30C around the opening 16 and a portion of the inside face 30A of the wall 30 around the opening 16. The shield 40 is composed of an electrically insulating and plasma resistant material whereby the protective shield 40 prevents the chamber from arching and generating particles and extends the lifetime of the wall 30.
    Type: Grant
    Filed: May 16, 1997
    Date of Patent: December 22, 1998
    Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Yung-Mao Hsu, Ching-Chung Wu
  • Patent number: 5697839
    Abstract: An apparatus for venting hazardous effluents from process equipment used in the manufacture of semiconductors, which is part of a larger ventilating system, is a "see-thru" transparent chamber which performs the function of a hood, and can be mounted on any one of the conventional semiconductor processing equipment. Because it is transparent, the operator can easily determine when to clean the hood. This is important from the point of view of not exposing the work piece in the processing equipment to effluent contaminants. Usually, the effluents are hazardous to health. Hence, the apparatus is equipped with a pair of gloves which are an integral part of an access door to the hood, and is used to manipulate remotely cleaning tools that are kept inside said hood: remote in the sense that the operator is never exposed to the hazardous effluents inside the chamber hood, and yet is easily capable of using the cleaning tools inside the hood by means of the pair gloves that are an integral part of the hood.
    Type: Grant
    Filed: July 15, 1996
    Date of Patent: December 16, 1997
    Assignee: Taiwan Semiconductor Manufacturing Company Ltd.
    Inventors: Ying-Hsiang Chen, Wei-Yao Chien, Deh-Hsiung Peng, Yung-Mao Hsu