Abstract: A scanning electron microscope capable of controlling the spot of an electron beam and a measurement method using the same. The scanning electron microscope includes electron magnets disposed in a path in which an electron beam irradiated to a sample moves from the electron beam source of the scanning electron microscope to a sample and configured to control and irradiate the spot of the electron beam in a linear electron beam having a different horizontal to vertical ratio. A control unit controls a ratio and direction of the spot of the electron beam by controlling a supply voltage of the electron magnets.

Abstract: A rotary input apparatus is disclosed. A rotary input apparatus that includes a wheel which inputs information by rotation; a holder which rotatably supports the wheel; a tooth or teeth formed on any one of the wheel and the holder; and a flat spring which is supported by the other of the wheel and the holder and which catches onto the tooth to elastically support the wheel in the direction of rotation, utilizes a simple structure to allow smooth operation while implementing a clicking sensation for each section.

Abstract: A frequency control circuit for an oscillator and a method therefor are disclosed and which frequency control circuit includes a flash cell having a cell transistor, a switching unit for outputting a first voltage to the flash cell in the program mode in accordance with an enable signal and outputting a second voltage in the read mode, a write driver for outputting a program voltage to the flash cell in the program mode in accordance with the enable signal, a bias unit for supplying a current to the flash cell in the read mode in accordance with the enable signal and generating a frequency control voltage which is proportional to a threshold voltage of the flash cell, and an oscillator for varying the frequency in accordance with the thusly generated frequency control voltage.