Patents by Inventor Yun Jie Zhou

Yun Jie Zhou has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • White box testing
    Patent number: 10210076
    Abstract: The source code of a software artifact may be scanned, and a call tree model with leaf nodes may be generated based on the scan. A set of test cases can be executed against the software artifact and log data from the execution can be collected. A set of untested leaf nodes can be detected and a new set of test cases can be generated to test the untested nodes. The new set of test cases are executed and a subset of the test cases which cover the previously untested nodes are added to the existing set of test cases.
    Type: Grant
    Filed: September 26, 2016
    Date of Patent: February 19, 2019
    Assignee: International Business Machines Corporation
    Inventors: Da L. Huang, Zhang Wu, Lu Yu, Xin Zhang, Yun Jie Zhou
  • WHITE BOX TESTING
    Publication number: 20180137038
    Abstract: The source code of a software artifact may be scanned, and a call tree model with leaf nodes may be generated based on the scan. A set of test cases can be executed against the software artifact and log data from the execution can be collected. A set of untested leaf nodes can be detected and a new set of test cases can be generated to test the untested nodes. The new set of test cases are executed and a subset of the test cases which cover the previously untested nodes are added to the existing set of test cases.
    Type: Application
    Filed: February 1, 2018
    Publication date: May 17, 2018
    Inventors: Da L. Huang, Zhang Wu, Lu Yu, Xin Zhang, Yun Jie Zhou
  • WHITE BOX TESTING
    Publication number: 20180137037
    Abstract: The source code of a software artifact may be scanned, and a call tree model with leaf nodes may be generated based on the scan. A set of test cases can be executed against the software artifact and log data from the execution can be collected. A set of untested leaf nodes can be detected and a new set of test cases can be generated to test the untested nodes. The new set of test cases are executed and a subset of the test cases which cover the previously untested nodes are added to the existing set of test cases.
    Type: Application
    Filed: February 1, 2018
    Publication date: May 17, 2018
    Inventors: Da L. Huang, Zhang Wu, Lu Yu, Xin Zhang, Yun Jie Zhou
  • WHITE BOX TESTING
    Publication number: 20180089070
    Abstract: The source code of a software artifact may be scanned, and a call tree model with leaf nodes may be generated based on the scan. A set of test cases can be executed against the software artifact and log data from the execution can be collected. A set of untested leaf nodes can be detected and a new set of test cases can be generated to test the untested nodes. The new set of test cases are executed and a subset of the test cases which cover the previously untested nodes are added to the existing set of test cases.
    Type: Application
    Filed: August 15, 2017
    Publication date: March 29, 2018
    Inventors: Da L. Huang, Zhang Wu, Lu Yu, Xin Zhang, Yun Jie Zhou
  • WHITE BOX TESTING
    Publication number: 20180089067
    Abstract: The source code of a software artifact may be scanned, and a call tree model with leaf nodes may be generated based on the scan. A set of test cases can be executed against the software artifact and log data from the execution can be collected. A set of untested leaf nodes can be detected and a new set of test cases can be generated to test the untested nodes. The new set of test cases are executed and a subset of the test cases which cover the previously untested nodes are added to the existing set of test cases.
    Type: Application
    Filed: September 26, 2016
    Publication date: March 29, 2018
    Inventors: Da L. Huang, Zhang Wu, Lu Yu, Xin Zhang, Yun Jie Zhou
  • White box testing
    Patent number: 9916230
    Abstract: The source code of a software artifact may be scanned, and a call tree model with leaf nodes may be generated based on the scan. A set of test cases can be executed against the software artifact and log data from the execution can be collected. A set of untested leaf nodes can be detected and a new set of test cases can be generated to test the untested nodes. The new set of test cases are executed and a subset of the test cases which cover the previously untested nodes are added to the existing set of test cases.
    Type: Grant
    Filed: August 15, 2017
    Date of Patent: March 13, 2018
    Assignee: International Business Machines Corporation
    Inventors: Da L. Huang, Zhang Wu, Lu Yu, Xin Zhang, Yun Jie Zhou