Patents by Inventor Yunrong LI

Yunrong LI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10650910
    Abstract: A fault analysis method of a semiconductor fault analysis device is provided. The fault analysis method includes: receiving measurement data measured corresponding to a semiconductor device; generating double sampling data based on the measurement data and reference data; performing a fault analysis operation with respect to the double sampling data; classifying a fault type of the semiconductor device based on a result of the fault analysis operation; and outputting information about the fault type.
    Type: Grant
    Filed: January 16, 2019
    Date of Patent: May 12, 2020
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Changwook Jeong, Sanghoon Myung, Min-Chul Park, Jeonghoon Ko, Jisu Ryu, Hyunjae Jang, Hyungtae Kim, Yunrong Li, Min Chul Jeon
  • Publication number: 20190385695
    Abstract: A fault analysis method of a semiconductor fault analysis device is provided. The fault analysis method includes: receiving measurement data measured corresponding to a semiconductor device; generating double sampling data based on the measurement data and reference data; performing a fault analysis operation with respect to the double sampling data; classifying a fault type of the semiconductor device based on a result of the fault analysis operation; and outputting information about the fault type.
    Type: Application
    Filed: January 16, 2019
    Publication date: December 19, 2019
    Applicant: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Changwook JEONG, Sanghoon MYUNG, Min-Chul PARK, Jeonghoon KO, Jisu RYU, Hyunjae JANG, Hyungtae KIM, Yunrong LI, Min Chul JEON