Patents by Inventor Yunuo CHEN

Yunuo CHEN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20260030820
    Abstract: In a method, pose information of a cloth model is determined. A background grid is obtained based on uniformly dividing a two-dimensional plane that includes the cloth model. First motion information of each grid vertex indicating a motion state of each grid vertex at a first moment is acquired. An elastic energy function of the background grid indicating elasticity of the cloth model based on an elastic energy parameter is acquired. A target function indicating one or more constraints of the elastic energy function and the first motion information of each grid vertex is acquired. Second motion information of each grid vertex indicating a motion state of each grid vertex at a second moment later than the first moment is obtained based on the target function. First pose information of the cloth model is determined based on the second motion information of each grid vertex.
    Type: Application
    Filed: September 26, 2025
    Publication date: January 29, 2026
    Applicant: Tencent Technology (Shenzhen) Company Limited
    Inventors: Chun YUAN, Yunuo CHEN, Bo YANG
  • Patent number: 12483785
    Abstract: The invention relates to precision measurement technology, specifically a high-sensitivity three-dimensional topography recovery method using dual-channel differentiation. Enhancing a traditional microscopic imaging system, a beam splitter is added between the objective lens and tube lens. This creates an additional light path equipped with a tube lens and camera identical to the original but with a slightly different distance to the camera. During axial scanning of the object, focusing evaluation function curves for each pixel are calculated from images captured by both cameras. The curves from the two cameras show more significant changes near the optimal focusing depth, improving system sensitivity. This method enhances sensitivity by hardware-fixed differentiation of the focusing evaluation function, while maintaining high scanning efficiency and flexible configuration.
    Type: Grant
    Filed: May 23, 2024
    Date of Patent: November 25, 2025
    Assignee: FUDAN UNIVERSITY
    Inventors: Xiangchao Zhang, Yunuo Chen, Wei Lang, Sihan Chen, Chengzhuo Wang
  • Publication number: 20240430565
    Abstract: The invention relates to precision measurement technology, specifically a high-sensitivity three-dimensional topography recovery method using dual-channel differentiation. Enhancing a traditional microscopic imaging system, a beam splitter is added between the objective lens and tube lens. This creates an additional light path equipped with a tube lens and camera identical to the original but with a slightly different distance to the camera. During axial scanning of the object, focusing evaluation function curves for each pixel are calculated from images captured by both cameras. The curves from the two cameras show more significant changes near the optimal focusing depth, improving system sensitivity. This method enhances sensitivity by hardware-fixed differentiation of the focusing evaluation function, while maintaining high scanning efficiency and flexible configuration.
    Type: Application
    Filed: May 23, 2024
    Publication date: December 26, 2024
    Applicant: FUDAN UNIVERSITY
    Inventors: Xiangchao ZHANG, Yunuo CHEN, Wei LANG, Sihan CHEN, Chengzhuo WANG