Patents by Inventor Yunwu Zhao

Yunwu Zhao has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20220203864
    Abstract: This application discloses a voltage monitoring method, a voltage monitoring apparatus, and an electric vehicle. The voltage monitoring apparatus includes a power conversion module and a microcontroller electrically connected to the power conversion module. The power conversion module is configured to output a voltage. The microcontroller includes an ADC module, a monitoring module, and an IO module. The ADC module is configured to obtain an output voltage of the power conversion module, and determine whether the output voltage encounters an exception. The monitoring module is configured to: when the output voltage encounters an exception, output a control signal through the IO module. The power conversion module correspondingly stops outputting a voltage based on the control signal. Based on this, diagnostic coverage of the power conversion module can reach 99% for a single-point fault metric, thereby meeting a requirement of a corresponding level of ASIL D.
    Type: Application
    Filed: February 25, 2022
    Publication date: June 30, 2022
    Applicant: Huawei Digital Power Technologies Co., Ltd.
    Inventors: Xuejuan KONG, Yunwu ZHAO, Xing ZHANG
  • Patent number: 9689919
    Abstract: In an integrated circuit, a first scan chain of flip-flops is loaded with data for testing data retention of the flip-flops and a memory is loaded with data for performing a retention test by a memory built-in self-test (MBIST) wrapper circuit. A portion of the system is placed in a low-power state for a predetermined period of time before data is read from the memory and retention of data by the memory while in the low-power state is determined.
    Type: Grant
    Filed: November 30, 2014
    Date of Patent: June 27, 2017
    Assignee: NXP USA, INC.
    Inventors: Yunwu Zhao, Hao Wang
  • Publication number: 20160111170
    Abstract: In an integrated circuit, a first scan chain of flip-flops is loaded with data for testing data retention of the flip-flops and a memory is loaded with data for performing a retention test by a memory built-in self-test (MBIST) wrapper circuit. A portion of the system is placed in a low-power state for a predetermined period of time before data is read from the memory and retention of data by the memory while in the low-power state is determined.
    Type: Application
    Filed: November 30, 2014
    Publication date: April 21, 2016
    Inventors: Yunwu Zhao, Hao Wang
  • Patent number: 9189053
    Abstract: Power control circuitry for a data processor supplies a memory array with a supply voltage corresponding to a memory performance level. The performance levels include a full performance level and a power-saving performance level. Voltage sensing circuitry senses a voltage level of the memory array and outputs a power status signal. The power status signal is used to determine when the memory array is awake and can be accessed.
    Type: Grant
    Filed: September 23, 2014
    Date of Patent: November 17, 2015
    Assignee: FREESCALE SEMICONDUCTOR, INC.
    Inventors: Jing Cui, Shayan Zhang, Yunwu Zhao
  • Publication number: 20150160718
    Abstract: Power control circuitry for a data processor supplies a memory array with a supply voltage corresponding to a memory performance level. The performance levels include a full performance level and a power-saving performance level. Voltage sensing circuitry senses a voltage level of the memory array and outputs a power status signal. The power status signal is used to determine when the memory array is awake and can be accessed.
    Type: Application
    Filed: September 23, 2014
    Publication date: June 11, 2015
    Applicant: Freescale Semiconductor, Inc.
    Inventors: Jing Cui, Shayan Zhang, Yunwu Zhao