Patents by Inventor Yuri Alexeyevich Plotnikov

Yuri Alexeyevich Plotnikov has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20120269385
    Abstract: A method for imaging an object is provided. The method includes acquiring tomographic image data of the object at a plurality of frequencies, generating a composite image of the object at each of the plurality of frequencies using the acquired tomographic image data, determining a scaling factor for a first material at each of the plurality of frequencies, determining a scaling factor for a second material at each of the plurality of frequencies, and decomposing the composite images into a first discrete image and a second discrete image using the determined scaling factors, wherein the first discrete image contains any region of the object composed of the first material and the second discrete image contains any region of the object composed of the second material.
    Type: Application
    Filed: April 21, 2011
    Publication date: October 25, 2012
    Applicant: MORPHO DETECTION, INC.
    Inventors: Young Kyo Lee, Erik Edmund Magnuson, Yuri Alexeyevich Plotnikov
  • Publication number: 20110068784
    Abstract: A multi-frequency eddy current (MFEC) inspection system is provided for inspection of case hardening depth on a part. The MFEC inspection system comprises a generator configured to generate one or more multi-frequency excitation signals and an eddy current probe configured to be disposed at one side of the part. The eddy current probe comprises one or more drivers and one or more pickup sensors. The one or more drivers are configured to receive the one or more multi-frequency excitation signals to induce eddy currents in the part. The one or more pickup sensors are configured to detect the induced eddy currents within a local area of the part to generate one or more multi-frequency response signals. The MFEC system further comprises a processor configured to receive the one or more multi-frequency response signals for processing to determine a case hardening depth of the local area of the part. A pulse eddy current inspection system and an eddy current inspection method are also presented.
    Type: Application
    Filed: September 21, 2009
    Publication date: March 24, 2011
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Haiyan Sun, Yuri Alexeyevich Plotnikov, Changting Wang, Shridhar Champaknath Nath, Aparna Chakrapani Sheila-Vadde
  • Patent number: 7911205
    Abstract: A method of inspecting a test part is provided. The method includes positioning a coil on a surface of the test part and exciting the coil at a resonance frequency. The method also includes determining at least one of a resonance frequency shift and a quality factor of the coil and estimating an electrical conductivity of the test part based on at least one of the resonance frequency shift and the quality factor of the coil. The method further includes obtaining depth profile of residual stress using conductivity measurements at various resonance frequencies.
    Type: Grant
    Filed: September 25, 2007
    Date of Patent: March 22, 2011
    Assignee: General Electric Company
    Inventors: Nilesh Tralshawala, Yuri Alexeyevich Plotnikov
  • Patent number: 7830140
    Abstract: A method of inspecting a test part is provided. The method includes positioning an eddy current probe on a surface of the test part and scanning the test part using the eddy current probe to generate a first signal corresponding to a no lift-off condition of the test part. The method further includes positioning the eddy current probe at a pre-determined distance from the surface of the test part and scanning the test part using the eddy current probe positioned at the pre-determined distance from the test part to generate a second signal corresponding to a lift-off condition of the test part. The method also includes processing the first and second signals to estimate an electrical conductivity of the test part.
    Type: Grant
    Filed: August 7, 2007
    Date of Patent: November 9, 2010
    Assignee: General Electric Company
    Inventors: Nilesh Tralshawala, Yuri Alexeyevich Plotnikov
  • Publication number: 20090079424
    Abstract: A method of inspecting a test part is provided. The method includes positioning a coil on a surface of the test part and exciting the coil at a resonance frequency. The method also includes determining at least one of a resonance frequency shift and a quality factor of the coil and estimating an electrical conductivity of the test part based on at least one of the resonance frequency shift and the quality factor of the coil. The method further includes obtaining depth profile of residual stress using conductivity measurements at various resonance frequencies.
    Type: Application
    Filed: September 25, 2007
    Publication date: March 26, 2009
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Nilesh Tralshawala, Yuri Alexeyevich Plotnikov
  • Publication number: 20090039877
    Abstract: A method of inspecting a test part is provided. The method includes positioning an eddy current probe on a surface of the test part and scanning the test part using the eddy current probe to generate a first signal corresponding to a no lift-off condition of the test part. The method further includes positioning the eddy current probe at a pre-determined distance from the surface of the test part and scanning the test part using the eddy current probe positioned at the pre-determined distance from the test part to generate a second signal corresponding to a lift-off condition of the test part. The method also includes processing the first and second signals to estimate an electrical conductivity of the test part.
    Type: Application
    Filed: August 7, 2007
    Publication date: February 12, 2009
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Nilesh Tralshawala, Yuri Alexeyevich Plotnikov
  • Patent number: 7389206
    Abstract: A method for inspecting an object is provided. The method includes applying a pulsed excitation signal to the object and detecting a transient response signal to the pulsed excitation signal. The method also includes convolving the transient response signal with a plurality of orthogonal functions to generate a plurality of orthogonal components.
    Type: Grant
    Filed: August 10, 2006
    Date of Patent: June 17, 2008
    Assignee: General Electric Company
    Inventor: Yuri Alexeyevich Plotnikov
  • Publication number: 20080040053
    Abstract: A method for inspecting an object is provided. The method includes applying a pulsed excitation signal to the object and detecting a transient response signal to the pulsed excitation signal. The method also includes convolving the transient response signal with a plurality of orthogonal functions to generate a plurality of orthogonal components.
    Type: Application
    Filed: August 10, 2006
    Publication date: February 14, 2008
    Inventor: Yuri Alexeyevich Plotnikov
  • Patent number: 7154265
    Abstract: An eddy current (EC) probe for inspecting a component is provided. The EC probe includes a tangential drive coil configured to generate a probing field for inducing eddy currents in the component, where a portion of the eddy currents are aligned parallel to an edge of the component. An axis of the tangential drive coil is aligned parallel to a surface of the component. The EC probe further includes a pair of sense coils, where an axis of the sense coils is aligned perpendicular to the surface of the component. The sense coils are configured to sense the portion of the eddy currents aligned parallel to the edge of the component.
    Type: Grant
    Filed: December 21, 2004
    Date of Patent: December 26, 2006
    Assignee: General Electric Company
    Inventors: Mottito Togo, Changting Wang, Yuri Alexeyevich Plotnikov, Shyamsunder Tondanur Mandayam, William Stewart McKnight, Walter Joseph Bantz, Ui Won Suh
  • Patent number: 7015690
    Abstract: An omnidirectional eddy current (EC) probe includes at least one EC channel having a first and a second sense coil that are offset in a first (x) and a second (y) direction and overlap in at least one of the directions (x,y). At least one drive coil is configured to generate a probing field for the EC channel in a vicinity of the sense coils. An omnidirectional EC inspection system includes an omnidirectional EC array probe (ECAP) that includes a number of EC channels and drive coils. Each EC channel includes first and second sense coils with opposite polarities. The drive coils have alternating polarities. Electrical connections perform differential sensing for respective EC channels. Corrective drive coils are disposed at respective ends of the EC channels and generate probing fields. An eddy current instrument is connected to the omnidirectional ECAP and receives differential sensing signals from the EC channels.
    Type: Grant
    Filed: May 27, 2004
    Date of Patent: March 21, 2006
    Assignee: General Electric Company
    Inventors: Changting Wang, Yuri Alexeyevich Plotnikov, Shridhar Champaknath Nath, William Stewart McKnight, Gigi Olive Gambrell
  • Patent number: 7005851
    Abstract: In some aspects, the present invention provides a method for estimating at least one measurement/object property of a metal object. The method includes generating a time-varying eddy current in a wall of the metal object utilizing a pulsed-signal transmitter. The method further includes measuring the time-varying eddy current, fitting the time-varying measured eddy current to a parameterized polynomial, and interpreting the parameterized polynomial to determine one or more measurement/object properties of the metal object.
    Type: Grant
    Filed: September 30, 2003
    Date of Patent: February 28, 2006
    Assignee: General Electric Company
    Inventors: Andrew May, Changting Wang, Yuri Alexeyevich Plotnikov
  • Patent number: 6911826
    Abstract: A pulsed eddy current sensor probe includes a sensor array board. A number of sensors are arranged on the sensor array board and are operable to sense and generate output signals from the transient electromagnetic flux in a part being inspected. Each of the sensors has a differential output with a positive and a negative output. At least one drive coil is disposed adjacent to the sensors and is operable to transmit transient electromagnetic flux into the part. A first and a second multiplexer are arranged on the sensor array board and are operable to switch between the sensors. The first and second multiplexers are connected to the positive and negative outputs of the sensors, respectively.
    Type: Grant
    Filed: December 3, 2003
    Date of Patent: June 28, 2005
    Assignee: General Electric Company
    Inventors: Yuri Alexeyevich Plotnikov, Thomas James Batzinger, Shridhar Champaknath Nath, Sandeep Kumar Dewangan, Carl Stephen Lester, Kenneth Gordon Herd, Curtis Wayne Rose
  • Publication number: 20040245997
    Abstract: A pulsed eddy current sensor probe includes a sensor array board. A number of sensors are arranged on the sensor array board and are operable to sense and generate output signals from the transient electromagnetic flux in a part being inspected. Each of the sensors has a differential output with a positive and a negative output. At least one drive coil is disposed adjacent to the sensors and is operable to transmit transient electromagnetic flux into the part. A first and a second multiplexer are arranged on the sensor array board and are operable to switch between the sensors. The first and second multiplexers are connected to the positive and negative outputs of the sensors, respectively.
    Type: Application
    Filed: December 3, 2003
    Publication date: December 9, 2004
    Inventors: Yuri Alexeyevich Plotnikov, Thomas James Batzinger, Shridhar Champaknath Nath, Sandeep Kumar Dewangan, Carl Stephen Lester, Kenneth Gordon Herd, Curtis Wayne Rose
  • Patent number: 6720775
    Abstract: A pulsed eddy current two-dimensional sensor array probe for electrically conducting component inspection includes a drive coil disposed adjacent to a structure under inspection, a pulse generator connected to the drive coil and operable to energize in a pulsed manner the drive coil to transmit transient electromagnetic flux into the structure under inspection, and an array of sensors arranged in a two-dimensional array and substantially surrounded by the drive coil and operable to sense and generate output signals from the transient electromagnetic flux in the structure under inspection.
    Type: Grant
    Filed: June 12, 2001
    Date of Patent: April 13, 2004
    Assignee: General Electric Company
    Inventors: Yuri Alexeyevich Plotnikov, Shridhar Champaknath Nath, Curtis Wayne Rose, Thomas James Batzinger, Kenneth Gordon Herd
  • Patent number: 6707297
    Abstract: A method for in-situ eddy current inspection of at least one coated component includes applying a drive pulse at a measurement position on an outer surface of the coated component, while the coated component is installed in an operational environment of the coated component. The coated component includes a base metal and a coating disposed on the base metal. The method further includes receiving a response signal from the coated component, comparing the response signal with a reference signal to obtain a compared signal, analyzing the compared signal for crack detection, and determining whether a crack near the measurement position has penetrated into the base metal, if the presence of the crack in the coating is indicated.
    Type: Grant
    Filed: April 15, 2002
    Date of Patent: March 16, 2004
    Assignee: General Electric Company
    Inventors: Shridhar Champaknath Nath, Thomas James Batzinger, Curtis Wayne Rose, Yuri Alexeyevich Plotnikov, Kenneth Gordon Herd
  • Publication number: 20030193331
    Abstract: A method for in-situ eddy current inspection of at least one coated component includes applying a drive pulse at a measurement position on an outer surface of the coated component, while the coated component is installed in an operational environment of the coated component. The coated component includes a base metal and a coating disposed on the base metal. The method further includes receiving a response signal from the coated component, comparing the response signal with a reference signal to obtain a compared signal, analyzing the compared signal for crack detection, and determining whether a crack near the measurement position has penetrated into the base metal, if the presence of the crack in the coating is indicated.
    Type: Application
    Filed: April 15, 2002
    Publication date: October 16, 2003
    Applicant: General Electric Company
    Inventors: Shridhar Champaknath Nath, Thomas James Batzinger, Curtis Wayne Rose, Yuri Alexeyevich Plotnikov, Kenneth Gordon Herd
  • Publication number: 20020190724
    Abstract: A pulsed eddy current two-dimensional sensor array probe for electrically conducting component inspection includes a drive coil disposed adjacent to a structure under inspection, a pulse generator connected to the drive coil and operable to energize in a pulsed manner the drive coil to transmit transient electromagnetic flux into the structure under inspection, and an array of sensors arranged in a two-dimensional array and substantially surrounded by the drive coil and operable to sense and generate output signals from the transient electromagnetic flux in the structure under inspection.
    Type: Application
    Filed: June 12, 2001
    Publication date: December 19, 2002
    Inventors: Yuri Alexeyevich Plotnikov, Shridhar Champaknath Nath, Curtis Wayne Rose, Thomas James Batzinger, Kenneth Gordon Herd