Patents by Inventor Yuri Kokolov

Yuri Kokolov has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20110178963
    Abstract: An apparatus for detecting a rare situation in a process described by a plurality of parameters, the apparatus comprising: a parameter value inputter, for inputting values of at least two interrelated parameters of the plurality of parameters, the interrelated parameters constituting at least one cluster, and a rare situation detector for detecting a rare situation according to an alert policy, the alert policy being based at least on an output value of an alert model, the alert model configured to provide the output value as a function of the input parameter values of parameters constituting the at least one cluster.
    Type: Application
    Filed: October 30, 2005
    Publication date: July 21, 2011
    Applicant: Insyst Ltd.
    Inventors: Jehuda Hartman, Joseph Fisher, Yuri Kokolov, Efim Entin
  • Patent number: 7536371
    Abstract: An apparatus for the analysis of a process having parameter-based faults includes: a parameter value inputer configured for inputting values of at least one process parameter, a fault detector, configured for detecting the occurrence of a fault, a learning file creator associated with the parameter value inputer and the fault detector, configured for separating the input values into a first learning file and a second learning file, the first learning file comprising input values from a collection period preceding each of the detected faults, and the second learning file comprising input values input outside the collection periods, and a learning file analyzer associated with the learning file creator, configured for performing a separate statistical analysis of the first and second learning files, thereby to asses a process status.
    Type: Grant
    Filed: December 5, 2006
    Date of Patent: May 19, 2009
    Assignee: Insyst Ltd.
    Inventors: Jehuda Hartman, Eyal Brill, Yuri Kokolov
  • Publication number: 20070156620
    Abstract: An apparatus for the analysis of a process having parameter-based faults includes: a parameter value inputter configured for inputting values of at least one process parameter, a fault detector, configured for detecting the occurrence of a fault, a learning file creator associated with the parameter value inputter and the fault detector, configured for separating the input values into a first learning file and a second learning file, the first learning file comprising input values from a collection period preceding each of the detected faults, and the second learning file comprising input values input outside the collection periods, and a learning file analyzer associated with the learning file creator, configured for performing a separate statistical analysis of the first and second learning files, thereby to asses a process status.
    Type: Application
    Filed: December 5, 2006
    Publication date: July 5, 2007
    Applicant: Insyst Ltd.
    Inventors: Jehuda Hartman, Eyal Brill, Yuri Kokolov