Patents by Inventor Yuri Michael Shkel

Yuri Michael Shkel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Dielectrostrictive sensor for measuring deformation
    Patent number: 7726199
    Abstract: An apparatus and method directed to a solid-state capacitance sensor for measuring a strain force on a dielectric including at least one pair of electrostriction sensors each sensor having at least two electrodes and each having a central axis. The central axes are disposed in a common plane and are oriented substantially mutually perpendicularly to one another. Preferably, at least two pairs of sensors, forming a rosette, are provided to facilitate multi-component analysis of a sample having dielectric properties under stress/strain.
    Type: Grant
    Filed: April 23, 2008
    Date of Patent: June 1, 2010
    Assignee: Wisconsin Alumni Research Foundation
    Inventors: Yuri Michael Shkel, Ho Young Lee, Yiyan Peng
  • DIELECTROSTRICTIVE SENSOR FOR MEASURING DEFORMATION
    Publication number: 20090249885
    Abstract: An apparatus and method directed to a solid-state capacitance sensor for measuring a strain force on a dielectric including at least one pair of electrostriction sensors each sensor having at least two electrodes and each having a central axis. The central axes are disposed in a common plane and are oriented substantially mutually perpendicularly to one another. Preferably, at least two pairs of sensors, forming a rosette, are provided to facilitate multi-component analysis of a sample having dielectric properties under stress/strain.
    Type: Application
    Filed: April 23, 2008
    Publication date: October 8, 2009
    Inventors: Yuri Michael Shkel, Ho Young Lee, Yiyan Peng