Patents by Inventor Yuri Plotnikov
Yuri Plotnikov has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11782181Abstract: A downhole multi-modality inspection system includes a first imaging device operable to generate first imaging data and a second imaging device operable to generate second imaging data. The first imaging device includes a first source operable to emit energy of a first modality, and a first detector operable to detect returning energy induced by the emitted energy of the first modality. The second imaging device includes a second source operable to emit energy of a second modality, and a second detector operable to detect returning energy induced by the emitted energy of the second modality. The system further includes a processor configured to receive the first imaging data and the second imaging data, and integrate the first imaging data with the second imaging data into an enhanced data stream. The processor correlates the first imaging data and the second imaging data to provide enhanced data for detecting potential wellbore anomalies.Type: GrantFiled: August 13, 2018Date of Patent: October 10, 2023Assignee: GE Energy Oilfield Technology, Inc.Inventors: Ansas Matthias Kasten, Yuri Plotnikov, Sudeep Mandal, Sarah Lillian Katz, Frederick Wheeler, William Robert Ross, John Scott Price
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Patent number: 10884158Abstract: A downhole inspection system includes a neutron imaging device operable to generate data for detecting potential wellbore anomalies and an electromagnetic imaging device operable to generate data for detecting potential wellbore eccentricity. The neutron imaging device includes a neutron generator operable to emit neutrons, and a neutron detector fixed relative to the neutron generation unit and operable to detect backscattered neutrons from a surrounding environment. The electromagnetic imaging device includes at least one transmitter for generating electromagnetic pulse, and at least one receiver for detecting returning electromagnetic pulse. Correlation of the neutron imaging data with the electromagnetic imaging data provides additional data regarding the potential wellbore anomalies.Type: GrantFiled: August 13, 2018Date of Patent: January 5, 2021Assignee: GE Energy Oilfield Technology, Inc.Inventors: Ansas Matthias Kasten, Yuri Plotnikov, Adrian Ivan, William Robert Ross
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Publication number: 20190049618Abstract: A downhole inspection system includes a neutron imaging device operable to generate data for detecting potential wellbore anomalies and an electromagnetic imaging device operable to generate data for detecting potential wellbore eccentricity. The neutron imaging device includes a neutron generator operable to emit neutrons, and a neutron detector fixed relative to the neutron generation unit and operable to detect backscattered neutrons from a surrounding environment. The electromagnetic imaging device includes at least one transmitter for generating electromagnetic pulse, and at least one receiver for detecting returning electromagnetic pulse. Correlation of the neutron imaging data with the electromagnetic imaging data provides additional data regarding the potential wellbore anomalies.Type: ApplicationFiled: August 13, 2018Publication date: February 14, 2019Applicant: GE Energy Oilfield Technology, Inc.Inventors: Ansas Matthias Kasten, Yuri Plotnikov, Adrian Ivan, William Robert Ross
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Publication number: 20190049622Abstract: A downhole multi-modality inspection system includes a first imaging device operable to generate first imaging data and a second imaging device operable to generate second imaging data. The first imaging device includes a first source operable to emit energy of a first modality, and a first detector operable to detect returning energy induced by the emitted energy of the first modality. The second imaging device includes a second source operable to emit energy of a second modality, and a second detector operable to detect returning energy induced by the emitted energy of the second modality. The system further includes a processor configured to receive the first imaging data and the second imaging data, and integrate the first imaging data with the second imaging data into an enhanced data stream. The processor correlates the first imaging data and the second imaging data to provide enhanced data for detecting potential wellbore anomalies.Type: ApplicationFiled: August 13, 2018Publication date: February 14, 2019Applicant: GE Energy Oilfield Technology, Inc.Inventors: Ansas Matthias Kasten, Yuri Plotnikov, Sudeep Mandal, Sarah Lillian Katz, Frederick Wheeler, William Robert Ross, John Scott Price
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Patent number: 7952348Abstract: A method of assembling an eddy current probe for use in nondestructive testing of a sample is described. The method includes positioning at least one substantially planar spiral drive coil within the eddy current probe, such that the drive coil is at least one of adjacent to and at least partially within a flexible material. The method further includes coupling at least one unpackaged solid-state magnetic field sensor to the at least one drive coil.Type: GrantFiled: November 5, 2007Date of Patent: May 31, 2011Assignee: General Electric CompanyInventors: Haiyan Sun, Yuri Plotnikov, Changting Wang, William Stewart McKnight, Ui Suh
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Patent number: 7888932Abstract: A method of assembling an eddy current array probe to facilitate nondestructive testing of a sample is provided. The method includes positioning a plurality of differential side mount coils at least partially within a flexible material. The method also includes coupling the flexible material within a tip portion of the eddy current array probe, such that the flexible material has a contour that substantially conforms to a portion of a surface of the sample to be tested.Type: GrantFiled: November 5, 2007Date of Patent: February 15, 2011Assignee: General Electric CompanyInventors: William Stewart McKnight, Ui Suh, Yuri Plotnikov, Changting Wang, Ralph Gerald Isaacs
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Publication number: 20090115411Abstract: A method of assembling an eddy current probe for use in nondestructive testing of a sample is described. The method includes positioning at least one substantially planar spiral drive coil within the eddy current probe, such that the drive coil is at least one of adjacent to and at least partially within a flexible material. The method further includes coupling at least one unpackaged solid-state magnetic field sensor to the at least one drive coil.Type: ApplicationFiled: November 5, 2007Publication date: May 7, 2009Inventors: Haiyan Sun, Yuri Plotnikov, Changting Wang, William Stewart McKnight, Ui Suh
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Publication number: 20090115410Abstract: A method of assembling an eddy current array probe to facilitate nondestructive testing of a sample is provided. The method includes positioning a plurality of differential side mount coils at least partially within a flexible material. The method also includes coupling the flexible material within a tip portion of the eddy current array probe, such that the flexible material has a contour that substantially conforms to a portion of a surface of the sample to be tested.Type: ApplicationFiled: November 5, 2007Publication date: May 7, 2009Inventors: William Stewart McKnight, Ui Suh, Yuri Plotnikov, Changting Wang, Ralph Gerald Isaacs
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Patent number: 7402999Abstract: A pulsed eddy current pipeline inspection device is provided. The pulsed eddy current pipeline inspection device comprises a plurality of stages longitudinally spaced apart from each other and adapted to move between a contracted position and an expanded position, and a plurality of sensors disposed around at least a portion of a circumference of each of the plurality of stages in the contracted position with at least one gap between sensors in each of the plurality of stages in the expanded position, the plurality of sensors being arranged such that the at least one gap in a first one of the plurality of stages is aligned with a portion of a second one of the plurality of stages that has sensors disposed thereon.Type: GrantFiled: November 30, 2005Date of Patent: July 22, 2008Assignee: General Electric CompanyInventors: Yuri Plotnikov, Andrew May, Shridhar Nath, Changting Wang
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Publication number: 20070222439Abstract: Several eddy current array probes (ECAP) with enhanced drive coil configurations are described. In one arrangement, an ECAP includes a number of EC channels and a number of drive coils. Each of the drive coils is provided for a respective one of the EC channels. The drive coils have alternating polarity with respect to neighboring drive coils. In another arrangement, an ECAP for detecting flaws in a number of scanning and orientation configurations includes at least one substrate, a number of sense coils arranged on the substrate(s), and a drive coil encompassing all of the sense coils. In another arrangement, an ECAP includes substrate, sense coils arranged in at least two rows, and at least one drive line. One drive line is provided for each pair of rows and disposed between the rows.Type: ApplicationFiled: June 7, 2007Publication date: September 27, 2007Applicant: GENERAL ELECTRIC COMPANYInventors: Changting Wang, Yuri Plotnikov, William McKnight, Shridhar Nath, Gigi Gambrell, Mottito Togo, William Hennessy, John Ertel, Shyamsunder Mandayam
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Publication number: 20070120559Abstract: A pulsed eddy current pipeline inspection device is provided. The pulsed eddy current pipeline inspection device comprises a plurality of stages longitudinally spaced apart from each other and adapted to move between a contracted position and an expanded position, and a plurality of sensors disposed around at least a portion of a circumference of each of the plurality of stages in the contracted position with at least one gap between sensors in each of the plurality of stages in the expanded position, the plurality of sensors being arranged such that the at least one gap in a first one of the plurality of stages is aligned with a portion of a second one of the plurality of stages that has sensors disposed thereon.Type: ApplicationFiled: November 30, 2005Publication date: May 31, 2007Inventors: Yuri Plotnikov, Andrew May, Shridhar Nath, Changting Wang
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Publication number: 20060132123Abstract: Several eddy current array probes (ECAP) with enhanced drive coil configurations are described. In one arrangement, an ECAP includes a number of EC channels and a number of drive coils. Each of the drive coils is provided for a respective one of the EC channels. The drive coils have alternating polarity with respect to neighboring drive coils. In another arrangement, an ECAP for detecting flaws in a number of scanning and orientation configurations includes at least one substrate, a number of sense coils arranged on the substrate(s), and a drive coil encompassing all of the sense coils. In another arrangement, an ECAP includes substrate, sense coils arranged in at least two rows, and at least one drive line. One drive line is provided for each pair of rows and disposed between the rows.Type: ApplicationFiled: December 22, 2004Publication date: June 22, 2006Inventors: Changting Wang, Yuri Plotnikov, William McKnight, Shridhar Nath, Gigi Gambrell, Mottito Togo, William Hennessy, John Ertel, Shyamsunder Mandayam
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Publication number: 20060132124Abstract: An eddy current (EC) probe for inspecting a component is provided. The EC probe includes a tangential drive coil configured to generate a probing field for inducing eddy currents in the component, where a portion of the eddy currents are aligned parallel to an edge of the component. An axis of the tangential drive coil is aligned parallel to a surface of the component. The EC probe further includes a pair of sense coils, where an axis of the sense coils is aligned perpendicular to the surface of the component. The sense coils are configured to sense the portion of the eddy currents aligned parallel to the edge of the component.Type: ApplicationFiled: December 21, 2004Publication date: June 22, 2006Inventors: Mottito Togo, Changting Wang, Yuri Plotnikov, Shyamsunder Mandayam, William McKnight, Walter Bantz, Ui Suh
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Publication number: 20050264284Abstract: An omnidirectional eddy current (EC) probe includes at least one EC channel having a first and a second sense coil that are offset in a first (x) and a second (y) direction and overlap in at least one of the directions (x,y). At least one drive coil is configured to generate a probing field for the EC channel in a vicinity of the sense coils. An omnidirectional EC inspection system includes an omnidirectional EC array probe (ECAP) that includes a number of EC channels and drive coils. Each EC channel includes first and second sense coils with opposite polarities. The drive coils have alternating polarities. Electrical connections perform differential sensing for respective EC channels. Corrective drive coils are disposed at respective ends of the EC channels and generate probing fields. An eddy current instrument is connected to the omnidirectional ECAP and receives differential sensing signals from the EC channels.Type: ApplicationFiled: May 27, 2004Publication date: December 1, 2005Inventors: Changting Wang, Yuri Plotnikov, Shridhar Nath, William McKnight, Gigi Gambrell
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Publication number: 20050068026Abstract: In some aspects, the present invention provides a method for estimating at least one measurement/object property of a metal object. The method includes generating a time-varying eddy current in a wall of the metal object utilizing a pulsed-signal transmitter. The method further includes measuring the time-varying eddy current, fitting the time-varying measured eddy current to a parameterized polynomial, and interpreting the parameterized polynomial to determine one or more measurement/object properties of the metal object.Type: ApplicationFiled: September 30, 2003Publication date: March 31, 2005Inventors: Andrew May, Changting Wang, Yuri Plotnikov