Patents by Inventor Yuri Shvydko

Yuri Shvydko has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Precision mechanical structure of an ultra-high-resolution spectrometer for inelastic X-ray scattering instrument
    Patent number: 9008272
    Abstract: A method and an ultrahigh-resolution spectrometer including a precision mechanical structure for positioning inelastic X-ray scattering optics are provided. The spectrometer includes an X-ray monochromator and an X-ray analyzer, each including X-ray optics of a collimating (C) crystal, a pair of dispersing (D) element crystals, anomalous transmission filter (F) and a wavelength (W) selector crystal. A respective precision mechanical structure is provided with the X-ray monochromator and the X-ray analyzer. The precision mechanical structure includes a base plate, such as an aluminum base plate; positioning stages for D-crystal alignment; positioning stages with an incline sensor for C/F/W-crystal alignment, and the positioning stages including flexure-based high-stiffness structure.
    Type: Grant
    Filed: July 18, 2012
    Date of Patent: April 14, 2015
    Assignee: UChicago Argonne, LLC
    Inventors: Deming Shu, Yuri Shvydko, Stanislav A. Stoupin, Ruben Khachatryan, Kurt A. Goetze, Timothy Roberts
  • PRECISION MECHANICAL STRUCTURE OF AN ULTRA-HIGH-RESOLUTION SPECTROMETER FOR INELASTIC X-RAY SCATTERING INSTRUMENT
    Publication number: 20140023180
    Abstract: A method and an ultrahigh-resolution spectrometer including a precision mechanical structure for positioning inelastic X-ray scattering optics are provided. The spectrometer includes an X-ray monochromator and an X-ray analyzer, each including X-ray optics of a collimating (C) crystal, a pair of dispersing (D) element crystals, anomalous transmission filter (F) and a wavelength (W) selector crystal. A respective precision mechanical structure is provided with the X-ray monochromator and the X-ray analyzer. The precision mechanical structure includes a base plate, such as an aluminum base plate; positioning stages for D-crystal alignment; positioning stages with an incline sensor for C/F/W-crystal alignment, and the positioning stages including flexure-based high-stiffness structure.
    Type: Application
    Filed: July 18, 2012
    Publication date: January 23, 2014
    Applicant: UCHICAGO ARGONNE, LLC
    Inventors: Deming Shu, Yuri Shvydko, Stanislav A. Stoupin, Ruben Khachatryan, Kurt A. Goetze, Timothy Roberts