Abstract: Various implementations of the invention provide a method for dynamically determining a layer bias. In various implementations, the layer bias may be employed to determine placement locations for a trace within an electrical device layout design. The trace providing for the electrical connection of components or pins within the layout design. With various implementations of the invention, a layer within the layout design is partitioned into regions, selected regions having a bias. As events or alterations to the layout design occur, the corresponding bias for the selected regions is updated to reflect any changes in bias occurring due to the event or alteration. With other implementations of the invention, processes, machines, or manufactures are provided that dynamically determine a layer bias. The dynamically determined layer bias may be incorporated into a layer bias heuristic employed by for example, an automated trace routing tool.