Abstract: A device for measuring thin films and bulks is disclosed using slow-wave structures in electrodynamic elements to allow a decrease in frequency, an increase in sensitivity to electromagnetic parameters and accuracy of their monitoring. A method is also disclosed for monitoring of materials which includes placing an electrodynamic element near a monitored material and exciting an alternating electromagnetic field at an appropriate frequency to penetrate the monitored material concentrating in a small volume. Electromagnetic field parameters are then measured which are caused by the material parameters variation and said variations are converted to electromagnetic field parameters, the element being excited by an electromagnetic field in the form of at least one slowed electromagnetic wave.

Abstract: A method and apparatus for monitoring one or more parameters of a variable physical structure, such as liquid level, is disclosed. The method and apparatus includes an electrodynamic element placed in proximity to a monitored structure and exciting within said element an alternating electromagnetic field. The electromagnetic field should be at a frequency at which the electromagnetic field penetrates into the monitored structure and then variations of the electromagnetic field parameters are measured for the element caused by a variation in the structure. The exciting of the electrodynamic element is by an electromagnetic field in the form of at least one slowed electromagnetic wave having suitable energy distribution of the electric and magnetic fields for the measuring of the electromagnetic field parameters.

Abstract: A method and apparatus for monitoring one or more parameters of a variable physical structure, such as liquid level, is disclosed. The method and apparatus includes an electrodynamic element placed in proximity to a monitored structure and exciting within said element an alternating electromagnetic field. The electromagnetic field should be at a frequency at which the electromagnetic field penetrates into the monitored structure and then variations of the electromagnetic field parameters are measured for the element caused by a variation in the structure. The exciting of the electrodynamic element is by an electromagnetic field in the form of at least one slowed electromagnetic wave having suitable energy distribution of the electric and magnetic fields for the measuring of the electromagnetic field parameters.

Abstract: A method and apparatus is disclosed for monitoring an angular displacement, such as angle position and the direction of displacement. The method and apparatus includes at least one resonator placed in proximity to a electrodynamic profile and exciting within said resonator an alternating electromagnetic field. The electromagnetic field should be at a frequency at which the electromagnetic field contacts the electrodynamic profile and then variations of the electromagnetic field parameters are measured for the resonator caused by rotating the electrodynamic profile. Excitation of the resonator is by an electromagnetic field in the form of at least one slowed electromagnetic wave having a suitable energy distribution of the electric and magnetic fields for measuring the electromagnetic field parameters.

Abstract: A method and apparatus is disclosed for monitoring an angular displacement, such as angle position and the direction of displacement. The method and apparatus includes at least one resonator placed in proximity to a electrodynamic profile and exciting within said resonator an alternating electromagnetic field. The electromagnetic field should be at a frequency at which the electromagnetic field contacts the electrodynamic profile and then variations of the electromagnetic field parameters are measured for the resonator caused by rotating the electrodynamic profile. Excitation of the resonator is by an electromagnetic field in the form of at least one slowed electromagnetic wave having a suitable energy distribution of the electric and magnetic fields for measuring the electromagnetic field parameters.

Abstract: A method and apparatus is disclosed for monitoring an angular displacement, such as angle position and the direction of displacement. The method and apparatus includes at least one resonator placed in proximity to a electrodynamic profile and exciting within said resonator an alternating electromagnetic field. The electromagnetic field should be at a frequency at which the electromagnetic field contacts the electrodynamic profile and then variations of the electromagnetic field parameters are measured for the resonator caused by rotating the electrodynamic profile. Excitation of the resonator is by an electromagnetic field in the form of at least one slowed electromagnetic wave having a suitable energy distribution of the electric and magnetic fields for measuring the electromagnetic field parameters.

Abstract: A method and apparatus for monitoring one or more parameters of a variable physical structure, such as liquid level, is disclosed. The method and apparatus includes an electrodynamic element placed in proximity to a monitored structure and exciting within said element an alternating electromagnetic field. The electromagnetic field should be at a frequency at which the electromagnetic field penetrates into the monitored structure and then variations of the electromagnetic field parameters are measured for the element caused by a variation in the structure. The exciting of the electrodynamic element is by an electromagnetic field in the form of at least one slowed electromagnetic wave having suitable energy distribution of the electric and magnetic fields for the measuring of the electromagnetic field parameters.