Patents by Inventor Yury Alexeyevich Plotnikov

Yury Alexeyevich Plotnikov has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System and method for eddy current inspection of parts with complex geometries
    Patent number: 8269489
    Abstract: An inspection system for inspecting a part is provided. The inspection system includes a multi-dimensional array of eddy current sensors that conforms to a contour of a three dimensional shape of the part. The inspection system also includes a controller coupled to the multi-dimensional array, wherein the controller is configured to electronically scan the part via an electrical connection of the eddy current sensors to an eddy current instrument. The inspection system further includes a processor coupled to the eddy current instrument, wherein the processor is configured to analyze output from the eddy current instrument and the controller to accomplish inspection of the part.
    Type: Grant
    Filed: November 25, 2008
    Date of Patent: September 18, 2012
    Assignee: General Electric Company
    Inventors: Changting Wang, Yury Alexeyevich Plotnikov, Ui Won Suh, William Stewart McKnight
  • SYSTEM AND METHOD FOR INSPECTION OF PARTS WITH COMPLEX GEOMETRIES
    Publication number: 20100127699
    Abstract: An inspection system for inspecting a part is provided. The inspection system includes a multi-dimensional array of eddy current sensors that conforms to a contour of a three dimensional shape of the part. The inspection system also includes a controller coupled to the multi-dimensional array, wherein the controller is configured to electronically scan the part via an electrical connection of the eddy current sensors to an eddy current instrument. The inspection system further includes a processor coupled to the eddy current instrument, wherein the processor is configured to analyze output from the eddy current instrument and the controller to accomplish inspection of the part.
    Type: Application
    Filed: November 25, 2008
    Publication date: May 27, 2010
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Changting Wang, Yury Alexeyevich Plotnikov, Ui Won Suh, William Stewart McKnight
  • Systems and method for locating failure events in samples under load
    Patent number: 7516663
    Abstract: A system for locating a failure event in a sample is disclosed. The system includes at least one sensor configured to detect acoustic energy corresponding to the failure event in the sample. The system also includes an infrared camera configured to detect a thermal release of energy corresponding to the failure event in the sample.
    Type: Grant
    Filed: November 3, 2006
    Date of Patent: April 14, 2009
    Assignee: General Electric Company
    Inventors: Harry Israel Ringermacher, Donald Robert Howard, Bryon Edward Knight, Yury Alexeyevich Plotnikov, Mark John Osterlitz, Jian Li, Jeffry Lynn Thompson, Gulperi Nuzhet Aksel
  • Mapping Movement of a Movable Transducer
    Publication number: 20080200801
    Abstract: A catheter probe includes a transducer configured for at least one cycle of movement within the probe and a sensor that is at least partially supported within the probe for identifying a position of the transducer during the at least one cycle of movement. A method of mapping movement and a test fixture are also presented.
    Type: Application
    Filed: February 21, 2007
    Publication date: August 21, 2008
    Inventors: Douglas Glenn Wildes, Kenneth Brakeley Welles, Yury Alexeyevich Plotnikov, Weston Blaine Griffin, Andrzej May
  • Systems and method for locating failure events in samples under load
    Publication number: 20080105055
    Abstract: A system for locating a failure event in a sample is disclosed. The system includes at least one sensor configured to detect acoustic energy corresponding to the failure event in the sample. The system also includes an infrared camera configured to detect a thermal release of energy corresponding to the failure event in the sample.
    Type: Application
    Filed: November 3, 2006
    Publication date: May 8, 2008
    Inventors: Harry Israel Ringermacher, Donald Robert Howard, Bryon Edward Knight, Yury Alexeyevich Plotnikov, Mark John Osterlitz, Jian Li, Jeffry Lynn Thompson, Gulperi Nuzhet Aksel