Patents by Inventor Yusuf Akgul

Yusuf Akgul has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240112466
    Abstract: A periodic task analysis system which analyzes a task conducted by an actor periodically includes a data collecting subsystem including at least one of an imaging device configured to image a state where a plurality of fundamental work operations is performed periodically, and at least one sensing means collecting data from the state; a data receiving subsystem operatively coupled to the data collecting subsystem, where the data receiving subsystem is configured to receive at least one of a video file recorded by the imaging device and a sensor data recorded by the sensing means; a task learning subsystem operatively coupled to the data receiving subsystem, where the task learning subsystem is configured to identify one or more sub-tasks from at least one of the recorded video file and the recorded sensor data; and a task analyzing subsystem. A method for analyzing a periodic task is also provided.
    Type: Application
    Filed: September 30, 2022
    Publication date: April 4, 2024
    Applicant: Khenda, Inc.
    Inventors: Cagkan EKICI, Yusuf AKGUL, Ozan Kerem DEVAMLI
  • Patent number: 7162073
    Abstract: A method is provided for detecting spot defects on an object when an allowable variation (called the “background”) in the appearance of the object can be modeled. Methods are also provided for measuring and classifying detected spot defects. An alignment model is used to align the image of the object, a background model is then used to estimate the (possibly different) background in each region, and each background is substantially removed from the image so as to form a foreground image on which blob analysis can be applied to detect spot defects, the blob analysis using a threshold image that accommodates different noise statistics for each region. The method facilitates robust spot defect inspection of fiber optic end faces, or of any object with different object regions. The method also allows use of blob analysis over a larger range of conditions, including conditions that make simple blob analysis infeasible.
    Type: Grant
    Filed: November 30, 2001
    Date of Patent: January 9, 2007
    Assignee: Cognex Technology and Investment Corporation
    Inventors: Yusuf Akgul, Ivan Bachelder, Adam Wagman, Jason Davis, Juha Koljonen, Prabhav Morje
  • Patent number: 6983065
    Abstract: A method of analyzing machine vision images to identify low contrast features such as scratches or cracks on the polished ends of optical fibers. A bank of oriented filters having incremental angles of orientation are tuned to respond to the frequency characteristics of oriented scratches or cracks having an approximate width. The filters are applied to an image to generate a filter response image for each filter orientation. The set of filter response images are combined to form a single data set indicating a magnitude and angle for each pixel in the original image. Elements of the combined data set having corresponding angles and magnitudes are grouped to form contour components that can be optionally input to higher order processes.
    Type: Grant
    Filed: December 28, 2001
    Date of Patent: January 3, 2006
    Assignee: Cognex Technology and Investment Corporation
    Inventors: Yusuf Akgul, Ivan Bachelder, Prabhav Morje, Juha Koljonen, Jason Davis
  • Patent number: 6636298
    Abstract: A method is provided for obtaining a focused image of an object in an application of machine vision in an optical inspection system. A coarse focus setting is first obtained by maximizing a coarse feature sharpness measurement performed on an image of the object of inspection. Then, a fine focus setting is obtained by maximizing a fine feature sharpness measurement performed on a portion of an image of the object of inspection. Finally, the fine focused image can be further analyzed, inspected, or otherwise processed.
    Type: Grant
    Filed: December 18, 2001
    Date of Patent: October 21, 2003
    Assignee: Cognex Technology and Investment Corporation
    Inventors: Ivan Bachelder, Yusuf Akgul, Prabhav Morje, Juha Koljonen