Patents by Inventor Yusuke Ebi

Yusuke Ebi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Optical axis orientation measuring device, optical axis orientation measuring method, spherical surface wave device manufacturing device, and spherical surface wave device manufacturing method
    Patent number: 7965395
    Abstract: The optical axis orientation measuring device according to the present invention is a reflective optical axis orientation measuring device for a spherical member made from a single crystal of an optically uniaxial crystal having birefringence, comprising: illuminating means for illuminating the spherical member through a polarizer; and isogyre observing means for observing the isogyre that is structured by the light that is reflected from the bottom surface of the spherical member and emitted from the spherical member through an analyzer that has a cross-nicol relationship with the polarizer.
    Type: Grant
    Filed: March 20, 2009
    Date of Patent: June 21, 2011
    Assignee: Yamatake Corporation
    Inventors: Yusuke Ebi, Susumu Segawa
  • Method for detecting equatorial plane
    Patent number: 7952712
    Abstract: To provide a method for detecting the equatorial plane, capable of detecting directly an equatorial plane that has the optical axis as the axis thereof, in a spherical optically uniaxial crystal. The method for detecting the equatorial plane as set forth in a first form of the present invention is a method for detecting an equatorial plane of a spherical member made from a single crystal of an optically uniaxial crystal having birefringence, comprising: a step for causing light to be incident on the spherical member through a polarizer; and a step for observing the isogyre that is structured by the light that is emitted from the spherical member through an analyzer that has a cross-nicol relationship with the polarizer; wherein the isogyre is an isogyre that is observed when the oscillating direction of the polarizer or the analyzer is near to parallel with the optical axis of the spherical member.
    Type: Grant
    Filed: March 18, 2009
    Date of Patent: May 31, 2011
    Assignee: Yamatake Corp.
    Inventors: Susumu Segawa, Yusuke Ebi
  • OPTICAL AXIS ORIENTATION MEASURING DEVICE, OPTICAL AXIS ORIENTATION MEASURING METHOD, SPHERICAL SURFACE WAVE DEVICE MANUFACTURING DEVICE, AND SPHERICAL SURFACE WAVE DEVICE MANUFACTURING METHOD
    Publication number: 20090236170
    Abstract: The optical axis orientation measuring device according to the present invention is a reflective optical axis orientation measuring device for a spherical member made from a single crystal of an optically uniaxial crystal having birefringence, comprising: illuminating means for illuminating the spherical member through a polarizer; and isogyre observing means for observing the isogyre that is structured by the light that is reflected from the bottom surface of the spherical member and emitted from the spherical member through an analyzer that has a cross-nicol relationship with the polarizer.
    Type: Application
    Filed: March 20, 2009
    Publication date: September 24, 2009
    Applicant: Yamatake Corporation
    Inventors: Yusuke Ebi, Susumu Segawa
  • METHOD FOR DETECTING EQUATORIAL PLANE
    Publication number: 20090237663
    Abstract: To provide a method for detecting the equatorial plane, capable of detecting directly an equatorial plane that has the optical axis as the axis thereof, in a spherical optically uniaxial crystal. The method for detecting the equatorial plane as set forth in a first form of the present invention is a method for detecting an equatorial plane of a spherical member made from a single crystal of an optically uniaxial crystal having birefringence, comprising: a step for causing light to be incident on the spherical member through a polarizer; and a step for observing the isogyre that is structured by the light that is emitted from the spherical member through an analyzer that has a cross-nicol relationship with the polarizer; wherein the isogyre is an isogyre that is observed when the oscillating direction of the polarizer or the analyzer is near to parallel with the optical axis of the spherical member.
    Type: Application
    Filed: March 18, 2009
    Publication date: September 24, 2009
    Applicant: Yamatake Corporation
    Inventors: Susumu Segawa, Yusuke Ebi